Abstract: The invention relates to a useful improvement of an ellipsometer-type device. For this purpose, an existing ellipsometer is supplemented by a so-called resonance platform on which surface modes are excitable. Contrary to state of the art of known surface plasmons, the inventive modes are laterally localized. In addition, the resonance platform is not necessarily embodied in the form of a metal sheet. The inventive device also can be embodied in the form of an image-forming device. The inventive method consists in placing measurable samples on the platform surface and, afterwards, are exposed to light, thereby being excited in modes. The resonance position of modes is determined by the absorption behavior of a measurable substance.

Abstract: A method for analyzing organic adsorbent layers (7) on a substrate (4) comprises the steps of providing a substrate (4) whose surface has an index of refraction equal or close to the index of refraction of the organic adsorbent to be analyzed. On the surface of the substrate (4) there is applied a layer system (5,6) with at least one layer (5) with index of refraction of the biological material and an organic adsorbent layer (7) on top of the layer system. When acting polarized light upon the substrate a change of polarization characteristics in reflection and/or transmission is detected.