Patents by Inventor Andreas Ettemeyer

Andreas Ettemeyer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10935366
    Abstract: A method and device for geometrically determining features of a workpiece, having an image processing sensor having a first beam path, the first beam path comprising at least one front optical unit facing the workpiece to be measured, and an optical splitter being mounted on the side of the front optical unit facing away from the workpiece. The optical splitter connects a second beam path to the image processing beam path, a common beam path being formed, and the second beam path being associated with a second optical sensor, the image processing sensor and the second sensor being designed to directly measure the surface of the workpiece. The front optical unit is formed as a sphere and/or has a longitudinal chromatic aberration.
    Type: Grant
    Filed: December 11, 2015
    Date of Patent: March 2, 2021
    Assignee: WERTH MESSTECHNIK GMBH
    Inventors: Ralf Christoph, Ingomar Schmidt, Volker Wegner, Matthias Andräs, Ulrich Neuschaefer-Rube, Andreas Ettemeyer, Mehmet Demirel, Sabine Linz-Dittrich, Benjamin Hopp
  • Patent number: 10612907
    Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.
    Type: Grant
    Filed: June 13, 2019
    Date of Patent: April 7, 2020
    Assignee: WERTH MESSETECHNIK GMBH
    Inventors: Ralf Christoph, Ingomar Schmidt, Benjamin Hopp, Sebastian Zoeller, Markus Hechler, Stefan Gruenwald, Andreas Ettemeyer, Sabine Linz-Dittrich, Matthias Andraes
  • Publication number: 20190360795
    Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.
    Type: Application
    Filed: June 13, 2019
    Publication date: November 28, 2019
    Applicant: WERTH MESSTECHNIK GMBH
    Inventors: Ralf CHRISTOPH, Ingomar SCHMIDT, Benjamin HOPP, Sebastian ZOELLER, Markus HECHLER, Stefan GRUENWALD, Andreas ETTEMEYER, Sabine LINZ-DITTRICH, Matthias ANDRAES
  • Patent number: 10393505
    Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.
    Type: Grant
    Filed: December 5, 2014
    Date of Patent: August 27, 2019
    Assignee: WERTH MESSTECHNIK GMBH
    Inventors: Ralf Christoph, Ingomar Schmidt, Benjamin Hopp, Sebastian Zoeller, Markus Hechler, Stefan Gruenwald, Andreas Ettemeyer, Sabine Linz-Dittrich, Matthias Andraes
  • Publication number: 20180106595
    Abstract: A method and device for geometrically determining features of a workpiece, having an image processing sensor having a first beam path, the first beam path comprising at least one front optical unit facing the workpiece to be measured, and an optical splitter being mounted on the side of the front optical unit facing away from the workpiece. The optical splitter connects a second beam path to the image processing beam path, a common beam path being formed, and the second beam path being associated with a second optical sensor, the image processing sensor and the second sensor being designed to directly measure the surface of the workpiece. The front optical unit is formed as a sphere and/or has a longitudinal chromatic aberration.
    Type: Application
    Filed: December 11, 2015
    Publication date: April 19, 2018
    Applicant: WERTH MESSTECHNIK GMBH
    Inventors: Ralf CHRISTOPH, Ingomar SCHMIDT, Volker WEGNER, Matthias ANDRÄS, Ulrich NEUSCHAEFER-RUBE, Andreas ETTEMEYER, Mehmet DEMIREL, Sabine LINZ-DITTRICH, Benjamin HOPP
  • Publication number: 20160370172
    Abstract: The invention relates to a device and a method for tactile/optical measuring of geometric features and structures on a workpiece. In order to be able to precisely align the probe extension for performing precise measurements without problems, a probe is proposed comprising a probe extension (13) having a flexurally elastic design at least in segments and having a mounting segment for mounting in a receptacle (14) comprising a mounting segment (60) implemented as a rotational lock.
    Type: Application
    Filed: December 5, 2014
    Publication date: December 22, 2016
    Applicant: WERTH MESSTECHNIK GMBH
    Inventors: Ralf Christoph, Ingomar Schmidt, Benjamin Hopp, Sebastian Zoeller, Markus Hechler, Stefan Gruenwald, Andreas Ettemeyer, Sabine Linz-Dittrich, Matthias Andraes
  • Patent number: 6439524
    Abstract: A measuring head holder for securing a measuring head to an object to be measured, comprising a receiving portion for definedly securing a measuring head thereto, and at least one securing element for fixing said receiving portion to said object to be measured.
    Type: Grant
    Filed: January 24, 2000
    Date of Patent: August 27, 2002
    Inventor: Andreas Ettemeyer
  • Patent number: 6188483
    Abstract: The present invention provides a method and associated apparatus with which it is possible to implement both shape detection and also displacement measurement in particular using partially identical working steps. A method according to the invention for determining the displacement of at least a part of the surface of a measurement object between an initial condition and a measurement condition and the shape of that surface of the measurement object is characterized in that the operation of determining the shape and the operation of determining the displacement are effected with the same measurement method using the speckle effect.
    Type: Grant
    Filed: June 4, 1999
    Date of Patent: February 13, 2001
    Assignee: Dr. Ettemeyer GmbH & Co.
    Inventor: Andrea Ettemeyer
  • Patent number: 5763789
    Abstract: A method or an apparatus for enlarging the range of measurement of speckle measuring systems for elongation measurement on a sample in a testing machine employs a speckle sensor, the sample in the testing machine being loaded in a loading device and the speckle sensor being moved jointly therewith on loading of said sample.
    Type: Grant
    Filed: August 21, 1997
    Date of Patent: June 9, 1998
    Assignee: Ettemeyer GmbH & Co.
    Inventor: Andreas Ettemeyer