Abstract: The invention relates to a contacting unit for a test apparatus for testing printed circuit boards. The contacting unit comprises a full grid cassette and an adapter. The full grid cassette is provided with a plurality of spring contact pins arranged in the grid of contact points of a basic grid of a test apparatus. The adapter is provided with test needles for electrically connecting each of the spring contact pins of the full grid cassette to a circuit board test point of a printed circuit board to be tested, the spring contact pins being secured in the full grid cassette against falling out on the side remote from the adapter and the test needles being secured in the adapter on the side remote from the full grid cassette. The adapter and the full grid cassette are releasably joined to each other. In this way, both the spring contact pins and the test needles are secured against falling out of the contacting unit in the assembled state of the adapter and the full grid cassette.

Abstract: The invention relates to a full grid cassette for a parallel tester for testing a non-componented printed circuit board, to a spring contact pin for such a full grid cassette and to an adapter for a parallel tester for testing a non-componented printed circuit board.

Abstract: The invention relates to a contacting unit for a test apparatus for testing printed circuit boards. The contacting unit comprises a full grid cassette and an adapter. The full grid cassette is provided with a plurality of spring contact pins arranged in the grid of contact points of a basic grid of a test apparatus. The adapter is provided with test needles for electrically connecting each of the spring contact pins of the full grid cassette to a circuit board test point of a printed circuit board to be tested, the spring contact pins being secured in the full grid cassette against falling out on the side remote from the adapter and the test needles being secured in the adapter on the side remote from the full grid cassette. The adapter and the full grid cassette are releasably joined to each other. In this way, both the spring contact pins and the test needles are secured against falling out of the contacting unit in the assembled state of the adapter and the full grid cassette.

Abstract: The invention relates to a module for a parallel tester for the testing of circuit boards, and to a parallel tester comprising such modules. The modules have circuit boards standing at right-angles to the plane of the basic grid of the parallel tester, and on which contact pins are arranged along one side edge. The contact pins lie with their peripheral surfaces on flat sides of the circuit boards and protrude a short distance beyond the side edge of the circuit board. They are connected electrically and physically to contact fields formed on the circuit board. This arrangement of the contact pins is cost-effective to produce, mechanically stable, and permits the production of modules with a high density of contact pins.

Abstract: A module for a tester for the testing of circuit boards is described. Such testers have a basic grid on which an adapter and/or a translator may be arranged in order to connect contact points of the basic grid with circuit board test points of a circuit board to be tested. The module comprises a support plate and a contact board. The contact board is formed by a rigid circuit board section which is described as the basic grid element, and at least one flexible circuit board section. Provided on the basic grid element are contact points which each form part of the contact points of the basic grid. The basic grid element is mounted at an end face of the support plate, and the flexible circuit board section is bent in such a way that at least part of the other section of the contact board is parallel to the support plate.

Abstract: The invention relates to a module for a parallel tester for the testing of circuit boards, and to a parallel tester comprising such modules. The modules have circuit boards standing at right-angles to the plane of the basic grid of the parallel tester, and on which contact pins are arranged along one side edge. The contact pins lie with their peripheral surfaces on flat sides of the circuit boards and protrude a short distance beyond the side edge of the circuit board. They are connected electrically and physically to contact fields formed on the circuit board. This arrangement of the contact pins is cost-effective to produce, mechanically stable, and permits the production of modules with a high density of contact pins.

Abstract: The invention relates to a full grid cassette for a parallel tester for testing a non-componented printed circuit board, to a spring contact pin for such a full grid cassette and to an adapter for a parallel tester for testing a non-componented printed circuit board. According to a first aspect of the present invention, spring contact pins are secured in the full grid cassette by means of a film. According to a further aspect of the present invention, the full grid cassette comprises two plates which are movable relative to one another in the axial direction of the spring contact pins and have a play at right angles to the axial direction. According to a third aspect of the present invention, the spring contact pins are designed with a central spring contact point. According to a further aspect of the present invention, an adapter is provided with contact pins fitted with a scanning head, wherein the contact pins have a locking projection securing them against falling out on a guide plate of the adapter.

Abstract: A module for a tester for the testing of circuit boards is described. Such testers have a basic grid on which an adapter and/or a translator may be arranged in order to connect contact points of the basic grid with circuit board test points of a circuit board to be tested. The module comprises a support plate and a contact board. The contact board is formed by a rigid circuit board section which is described as the basic grid element, and at least one flexible circuit board section. Provided on the basic grid element are contact points which each form part of the contact points of the basic grid. The basic grid element is mounted at an end face of the support plate, and the flexible circuit board section is bent in such a way that at least part of the other section of the contact board is parallel to the support plate.