Patents by Inventor Andreas Gneupel

Andreas Gneupel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • POWER SEMICONDUCTOR DEVICE, MEASUREMENT SYSTEM AND METHOD FOR DETERMINING A CURRENT OF A POWER SEMICONDUCTOR DEVICE
    Publication number: 20240105837
    Abstract: A power semiconductor device is proposed. The power semiconductor device includes a semiconductor body and a wiring area over a first surface of the semiconductor body. The power semiconductor device further includes a bipolar power semiconductor element including a first load electrode in the wiring area, an active area in the semiconductor body, and a second load electrode at a second surface of the semiconductor body. The power semiconductor device further includes a current sensing element including a pn or pin junction. The power semiconductor device further includes an optical window configured to allow electromagnetic radiation caused by an on-current of the bipolar power semiconductor element to pass to the current sensing element.
    Type: Application
    Filed: September 12, 2023
    Publication date: March 28, 2024
    Inventors: Ingo Dirnstorfer, Andreas Gneupel, Dmitry Balashov, Markus Böhm, Christian Kemle, Richard Springer
  • Prober with cooling mechanism for directly cooling a device under test
    Patent number: 11480611
    Abstract: Prober for a test system for testing a device under test is disclosed. In one example, the prober comprises a chuck configured for carrying the device under test, a transport circuitry for transporting electric signals to and/or away from the device under test. A cooling unit is directly thermally coupled with the device under test and configured for cooling the device under test at a main surface of the device under test facing the chuck.
    Type: Grant
    Filed: October 28, 2020
    Date of Patent: October 25, 2022
    Assignee: Infineon Technologies AG
    Inventor: Andreas Gneupel
  • Prober with busbar mechanism for testing a device under test
    Patent number: 11307247
    Abstract: Prober for a test system for testing a device under test is disclosed. In one example, the prober comprises a busbar mechanism for transporting electric signals to and away from the device under test.
    Type: Grant
    Filed: January 31, 2020
    Date of Patent: April 19, 2022
    Assignee: Infineon Technologies AG
    Inventor: Andreas Gneupel
  • PROBER WITH COOLING MECHANISM FOR DIRECTLY COOLING A DEVICE UNDER TEST
    Publication number: 20210123971
    Abstract: Prober for a test system for testing a device under test is disclosed. In one example, the prober comprises a chuck configured for carrying the device under test, a transport circuitry for transporting electric signals to and/or away from the device under test. A cooling unit is directly thermally coupled with the device under test and configured for cooling the device under test at a main surface of the device under test facing the chuck.
    Type: Application
    Filed: October 28, 2020
    Publication date: April 29, 2021
    Applicant: Infineon Technologies AG
    Inventor: Andreas GNEUPEL
  • PROBER WITH BUSBAR MECHANISM FOR TESTING A DEVICE UNDER TEST
    Publication number: 20200249273
    Abstract: Prober for a test system for testing a device under test is disclosed. In one example, the prober comprises a busbar mechanism for transporting electric signals to and away from the device under test.
    Type: Application
    Filed: January 31, 2020
    Publication date: August 6, 2020
    Applicant: Infineon Technologies AG
    Inventor: Andreas Gneupel