Patents by Inventor Andreas Gorus

Andreas Gorus has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for examining a gas by mass spectrometry and mass spectrometer
    Patent number: 10141174
    Abstract: A method for examining a gas by mass spectrometry includes: ionizing the gas for producing ions; and storing, exciting and detecting at least some of the produced ions in an FT ion trap. Producing and storing the ions in the FT ion trap and/or exciting the ions prior to the detection of the ions in the FT ion trap includes at least one selective IFT excitation, such as a SWIFT excitation, which is dependent on the mass-to-charge ratio of the ions. The disclosure further relates to a mass spectrometer. A mass spectrometer includes: an FT ion trap; and an excitation device for storing, exciting, and detecting ions in the FT ion trap.
    Type: Grant
    Filed: October 27, 2017
    Date of Patent: November 27, 2018
    Assignee: Carl Zeiss SMT GmbH
    Inventors: Michel Aliman, Alexander Laue, Hin Yiu Anthony Chung, Gennady Fedosenko, Ruediger Reuter, Leonid Gorkhover, Martin Antoni, Andreas Gorus, Valerie Derpmann
  • METHOD FOR EXAMINING A GAS BY MASS SPECTROMETRY AND MASS SPECTROMETER
    Publication number: 20180068842
    Abstract: A method for examining a gas by mass spectrometry includes: ionizing the gas for producing ions; and storing, exciting and detecting at least some of the produced ions in an FT ion trap. Producing and storing the ions in the FT ion trap and/or exciting the ions prior to the detection of the ions in the FT ion trap includes at least one selective IFT excitation, such as a SWIFT excitation, which is dependent on the mass-to-charge ratio of the ions. The disclosure further relates to a mass spectrometer. A mass spectrometer includes: an FT ion trap; and an excitation device for storing, exciting, and detecting ions in the FT ion trap.
    Type: Application
    Filed: October 27, 2017
    Publication date: March 8, 2018
    Inventors: Michel Aliman, Alexander Laue, Hin Yiu Anthony Chung, Gennady Fedosenko, Ruediger Reuter, Leonid Gorkhover, Martin Antoni, Andreas Gorus, Valerie Derpmann