Abstract: An adapter for a printed circuit board testing device, by means of which the test contacts located on the grid can be connected to test points of a printed circuit board to be tested that are located on and/or off grid means of test pins that are received in guide holes in the adapter and each have a pointed contacting section that is directed towards the respective contact point of the printed circuit board and projects from the adapter and an adjacent guidance section that is guided in the associated guide hole of the adapter, is to be designed so that even test pieces in which the test points are relatively close together and/or with large displacements from the grid can be tested. This is done by reducing the cross-section of the guidance section conically or in steps towards the contacting section, and that the cross-section of the guide bores is correspondingly reduced.

Abstract: A test pin for an adapter for connecting test contacts of a printed circuit board testing device that are located on a grid with test points of a test-piece such as a printed circuit board located on and/or off the grid, wherein in order to connect associated test contacts and test points the test pin can be inserted into guide holes at different inclinations in the adapter and has a pointed contact section that is directed towards the respective contact point of the circuit board and projects from the adapter and an adjacent guidance section that is guided in the associated guide hole of the adapter, is designed so that test-pieces with their test points only a relatively short distance apart can be tested. This is achieved by reducing the cross-section of the guidance section conically or stepwise towards the contact section.