Abstract: An ion optic that can be inserted into and removed from a mass spectrometer in a non-destructive manner is described. Also described is a set comprising an ion optic according to the invention and a receiving element for the ion optic. Furthermore described is a mass spectrometer, in particular a MALDI-TOF mass spectrometer, comprising an ion optic according to the invention and/or a set according to the invention.

Abstract: The invention relates to methods and devices for analysing sample material on a sample carrier, comprising an operating mode as follows: providing a time-of-flight mass analyser with an ion generating unit having a mount for the sample carrier, an ion receiver, a flight route between them determining the longest time-of-flight, an ion selector along the route, and a clock generator for repeatedly triggering an ion generating pulse at the sample carrier and a subsequent pulse for accelerating ion species onto the flight route; defining one or more ranges of mass-to-charge ratios (m/z), each with an upper limit corresponding to a time-of-flight shorter than the longest time-of-flight; selecting a cycling of ion generating pulses such that the duration between successive pulses is shorter than the longest time-of-flight but longer than the acceleration time; and analysing the sample material using the mass analyser, the selected pulse cycling, and the ion selector.

Abstract: An apparatus to generate ions from sample material deposited on a substrate which is at least partially transparent to electromagnetic waves, comprises: —a support device having a holder for the substrate, —a desorption/ionization unit including a desorption device and an ionization device, said desorption device being configured to desorb deposited sample material from a desorption site on the substrate using at least one energy burst, and said ionization device being configured to irradiate the desorbed sample material above the substrate with electromagnetic waves after the at least one energy burst, wherein the electromagnetic waves pass through the substrate before encountering the desorbed sample material at a location which corresponds to the desorption site, and —an extraction device which is arranged and designed to extract ions from the desorbed sample material and transfer them into an analyzer. The invention also relates to a correspondingly arranged method.

Abstract: An apparatus to generate ions from sample material deposited on a substrate which is at least partially transparent to electromagnetic waves, comprises: —a support device having a holder for the substrate, —a desorption/ionization unit including a desorption device and an ionization device, said desorption device being configured to desorb deposited sample material from a desorption site on the substrate using at least one energy burst, and said ionization device being configured to irradiate the desorbed sample material above the substrate with electromagnetic waves after the at least one energy burst, wherein the electromagnetic waves pass through the substrate before encountering the desorbed sample material at a location which corresponds to the desorption site, and—an extraction device which is arranged and designed to extract ions from the desorbed sample material and transfer them into an analyzer. The invention also relates to a correspondingly arranged method.

Abstract: A clip for measuring a distance between a first object and a second object with a measuring tape. The clip includes first and second opposing parallel sidewall surfaces and a third wall surface that connects the first and second sidewall surfaces so as to form an inverted U-shape. The clip further includes an affordance (for example a slot) on one or both of the first and second sidewall surfaces for receiving a hook-end of the measuring tape. A distance between the first and second sidewall surfaces is dimensioned to allow the clip to be removably mounted on an object. And this distance is variable due to the expandable material of the third wall surface.

Abstract: An apparatus for generating ions from sample material deposited on a sample carrier includes a chamber that keeps the sample material in a conditioned environment, an ablation device that locally ablates the deposited sample material and converts it to the gas phase, an energy input device that exposes the ablated sample material to an input energy burst, and an extraction device that extracts ions from the ablated sample material exposed to the input energy burst and transfers them to an ion processing apparatus, the ablation energy burst and/or input energy burst comprising a beam of coherent electromagnetic waves and the ablation device and/or the energy input device comprising a beam distributor that provides a plurality of optically parallel beam paths which each have a frequency multiplier unit and are combined again, wherein all frequency multiplier units emit a uniform output frequency. Likewise disclosed is a corresponding method.

Abstract: The invention relates to devices and methods for desorption scanning of analyte material deposited on a sample support, which can comprise the following mode of operation: (a) setting a position of the support to approach an impingement region onto which a beam is directed for local desorption of analyte material; (b) determining an actual position of the support after setting the position; (c) comparing the determined actual position with a target position of the support to determine any deviation; (d) adjusting a beam orientation, if a deviation is detected, so that the beam is directed onto the impingement region on the support that results when there is no deviation; (e) applying the beam to the impingement region to locally desorb analyte material and deliver it to an analyzer; and (f) checking whether a predetermined end condition is satisfied and, if not, repeating steps (a)-(e) for a subsequent non-congruent impingement region.

Abstract: The present invention includes a ladder step extender that when in place on a ladder extends the area where a ladder user can place his feet, providing increased stability and comfort for the user. The ladder extender comprises two hanging arms, a horizontal stepping platform, and two ladder rung holders. The extender is secured to the ladder rungs by the hanging rods placed on an upper ladder rung while the rung holders engage a lower rung. When the extender is secured to a ladder, the horizontal stepping platform extends towards the interior or toe side of the ladder and extends the area where the ladder user's foot or feet may be placed.

Abstract: The disclosure relates to devices and methods for the spectrometric analysis of sample material located on a sample support, and in particular on a flat sample support plate, using axial time-of-flight analysis. One operating mode of the devices and methods comprises an adjustment of the pulse focal position for the abrupt ablation and/or abrupt desorption of sample material in a z-direction that is perpendicular to a tangential plane at the location of ablation and/or desorption at the sample support, and the selection of a suitable setting for an acceleration with time lag of the ablated and/or desorbed and ionized sample material onto a flight path. It can be particularly advantageous to use these devices and methods in mass spectrometry imaging (MSI). The devices and methods can, in particular, be used with laser desorption/ionization (LDI) and specifically matrix-assisted laser desorption/ionization (MALDI).

Abstract: Disclosed is a method for analytically measuring sample material deposited on a sample support surface, comprising: (a) defining a plurality of regions on the surface, several of which are in contact with sample material, (b1) sampling sections of sample on a region using a desorbing beam to generate desorbed molecules, which are ionized and transferred to an analyzer, (b2) in so doing, sweeping the region by changing an orientation setting of the beam relative to the surface along a non-rectilinear trajectory on the region selected from a plurality of predefined, non-rectilinear trajectories while keeping the support in one position, (c) transitioning from a swept region to a region to be swept next using spatial adjustment of the support, and (d) repeating steps (b1), (b2), and (c) until a predetermined termination condition is fulfilled. A system for analyzing ions, having an ion generation device and a control unit is also disclosed.

Abstract: Devices and methods for the spectrometric analysis of sample material located in an ablation area on a sample support are disclosed, including a mode of operation which comprises: (i) locating the ablation area on the sample support and determining an ablation area dimension between opposing boundaries of the ablation area; (ii) beam-assisted sampling from the ablation area, e.g., using MALDI, and mass analyzing, e.g., using an IMS-QoTOF analyzer, the ablated and/or desorbed and ionized sample material, wherein a beam impingement region, which is selected no larger than the dimension of the ablation area, is moved within the boundaries of the ablation area while performing ablation and/or desorption operations and an extension of the beam impingement region is changed at least once; and (iii) combining the molecular information obtained by the ablation and/or desorption operations from the ablation area into a single spectral dataset.

Abstract: Disclosed are methods and devices for desorbing and ionizing of sample material which is deposited on a sample support, which methods and devices use a post-desorption ionization modality with dynamic spatial alignment. Principles of the disclosure may be used in imaging ion spectrometry, for example, particularly in imaging ion spectrometry with ion generation using matrix-assisted laser desorption and ionization (MALDI).

Abstract: The invention relates to devices and methods for desorption scanning of analyte material deposited on a sample support, which can comprise the following mode of operation: (a) setting a position of the support to approach an impingement region onto which a beam is directed for local desorption of analyte material; (b) determining an actual position of the support after setting the position; (c) comparing the determined actual position with a target position of the support to determine any deviation; (d) adjusting a beam orientation, if a deviation is detected, so that the beam is directed onto the impingement region on the support that results when there is no deviation; (e) applying the beam to the impingement region to locally desorb analyte material and deliver it to an analyzer; and (f) checking whether a predetermined end condition is satisfied and, if not, repeating steps (a)-(e) for a subsequent non-congruent impingement region.

Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.

Abstract: Disclosed is a method for analytically measuring sample material deposited on a sample support surface, comprising: (a) defining a plurality of regions on the surface, several of which are in contact with sample material, (b1) sampling sections of sample on a region using a desorbing beam to generate desorbed molecules, which are ionized and transferred to an analyzer, (b2) in so doing, sweeping the region by changing an orientation setting of the beam relative to the surface along a non-rectilinear trajectory on the region selected from a plurality of predefined, non-rectilinear trajectories while keeping the support in one position, (c) transitioning from a swept region to a region to be swept next using spatial adjustment of the support, and (d) repeating steps (b1), (b2), and (c) until a predetermined termination condition is fulfilled. A system for analyzing ions, having an ion generation device and a control unit is also disclosed.

Abstract: A device for coupling to a spindle of a machine tool includes a holder for coupling to the spindle of the machine tool, a conveyor element configured to convey a filament and rotatable about an axis of rotation, and a material processing unit. The material processing unit includes a gear which includes a force-receiving element configured to receive a mechanical force from the spindle and rotatable about an axis of rotation which extends substantially orthogonal to the axis of rotation of the conveyor element, and a force-delivery element configured to deliver to the conveyor element the mechanical force transmitted purely mechanically from the force-receiving element, with the force-receiving element being configured separately from the force-delivery element.

Abstract: An apparatus to generate ions from sample material deposited on a substrate which is at least partially transparent to electromagnetic waves, comprises: —a support device having a holder for the substrate, —a desorption/ionization unit including a desorption device and an ionization device, said desorption device being configured to desorb deposited sample material from a desorption site on the substrate using at least one energy burst, and said ionization device being configured to irradiate the desorbed sample material above the substrate with electromagnetic waves after the at least one energy burst, wherein the electromagnetic waves pass through the substrate before encountering the desorbed sample material at a location which corresponds to the desorption site, and —an extraction device which is arranged and designed to extract ions from the desorbed sample material and transfer them into an analyzer. The invention also relates to a correspondingly arranged method.

Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.

Abstract: The invention relates to imaging mass spectrometry on thin sample sections, in particular using MALDI, where a high lateral image resolution means that a plethora of mass spectra has to be acquired and the image acquisition runs over many hours. The quality of the mass spectra deteriorates considerably over time in such cases. The invention is based on the finding that the decrease in spectral quality of continuous measurement series over many hours is only partially caused by a decrease in detector gain, and that another significant cause is a decrease in the number of usable ions per ion generating pulse, which is attributable to several phenomena that are difficult to regulate. The invention now proposes to instead regulate only the detector gain, and such that not only the decrease in the detector gain is compensated, but also the decrease in the number of usable ions per ion generating pulse.

Abstract: The disclosure relates to a method of operating a secondary-electron multiplier in the ion detector of a mass spectrometer so as to prolong the service life, wherein the secondary-electron multiplier is supplied with an operating voltage in such a way that an amplification of less than 106 secondary electrons per impinging ion results, while the output current of the secondary-electron multiplier is amplified using an electronic preamplifier mounted close to the secondary-electron multiplier with such a low noise level that the current pulses of individual ions impinging on the ion detector are detected above the noise at the input of a digitizing unit. Further disclosed are the use of the methods for imaging mass spectrometric analysis of a thin tissue section or mass spectrometric high-throughput analysis/massive-parallel analysis, and a time-of-flight mass spectrometer whose control unit is programmed to execute such methods.