Patents by Inventor Andreas Hecker

Andreas Hecker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8771589
    Abstract: A spheriodal cast alloy for producing cast iron products with great mechanical strength, high-wear resistance and a high degree of ductility. The alloy comprises the following as non-iron components: between 2.5 and 2.8 wt. % C, between 2.4 and 3.4 wt. % Si, between 0.02 and 0.08 wt. % P, between 0.02 and 0.06 wt. % Mg, between 0.01 and 0.05 wt. % Cr, between 0.002 and 0.02 wt. % Al, between 0.0005 and 0.015 wt. % S, between 0.0002 and 0.002 wt. % B and conventional impurities. The alloy contains between 3.0 and 3.7 wt. % C, between 2.6 and 3.4 wt. % Si, between 0.02 and 0.05 wt. % P, between 0.025 and 0.045 wt. % Mg, between 0.01 and 0.03 wt. % Cr, between 0.003 and 0.017 wt. % Al, between 0.0005 and 0.012 wt. % S and between 0.0004 and 0.002 wt. % B. The alloy is used for example to produce chassis parts or brake discs in the automobile industry.
    Type: Grant
    Filed: November 14, 2005
    Date of Patent: July 8, 2014
    Assignee: Georg Fischer GmbH
    Inventors: Werner Menk, Rolf Rietzscher, Andreas Hecker, Torsten Rieck
  • Patent number: 8559103
    Abstract: A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy is described. A first light source emits conventional fluorescent illumination light along a first illumination path and a second light source emitting evanescent illumination light along a second illumination path that differs from the first illumination path. An objective emits light onto an object to be viewed. A beam combiner directs the two lights into the objective while keeping their beam paths geometrically separated. The beam combiner comprises at least two spatially separated first zones for coupling in the conventional fluorescent illumination light and at least two spatially separated second zones for coupling in the evanescent illumination light. The first and second zones are adapted in their size and position to objective pupils of different objectives.
    Type: Grant
    Filed: February 8, 2008
    Date of Patent: October 15, 2013
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Andreas Hecker
  • Patent number: 7948629
    Abstract: A microscope for total internal reflection microscopy. The microscope includes at least one light source configured to provide an illumination light to an illumination beam path for an evanescent illumination of a specimen so as to reflect the illumination light at an interface to the specimen or a specimen cover so as to return reflection light into the illumination beam path, an objective through which the illumination light and detection light are directable, a detection device, and a coupling device. The coupling device includes a mirror disposed in the illumination beam path. The mirror has a reflecting surface and a hole, the hole being configured to pass the illumination light there through so as to couple the illumination light into the illumination beam path.
    Type: Grant
    Filed: August 11, 2006
    Date of Patent: May 24, 2011
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Andreas Hecker
  • Publication number: 20100171946
    Abstract: A microscope for total internal reflection microscopy. The microscope includes at least one light source configured to provide an illumination light to an illumination beam path for an evanescent illumination of a specimen so as to reflect the illumination light at an interface to the specimen or a specimen cover so as to return reflection light into the illumination beam path, an objective through which the illumination light and detection light are directable, a detection device, and a coupling device. The coupling device includes a mirror disposed in the illumination beam path. The mirror has a reflecting surface and a hole, the hole being configured to pass the illumination light there through so as to couple the illumination light into the illumination beam path.
    Type: Application
    Filed: August 11, 2006
    Publication date: July 8, 2010
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventor: Andreas Hecker
  • Patent number: 7746552
    Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.
    Type: Grant
    Filed: May 4, 2009
    Date of Patent: June 29, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich
  • Patent number: 7733483
    Abstract: A method of ascertaining the orientation of molecules in a biological specimen by total internal reflection includes focusing illuminating light through an objective in different positions in a plane of a pupil of the objective so as to generate a plurality of respective differently oriented evanescent fields in the specimen. Respective different fluorescence intensities resulting from the differently oriented evanescent fields are correlated with respective different orientations of molecules in the specimen.
    Type: Grant
    Filed: April 20, 2006
    Date of Patent: June 8, 2010
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Andreas Hecker
  • Publication number: 20100118394
    Abstract: A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy, comprising at least one light source (1) for the conventional fluorescent illumination and at least one light source (2) for the evanescent illumination, and comprising an objective (4), wherein the illumination light coming from the light sources (1, 2) on different illumination paths (5, 6) is passed via a beam combiner (7) into the objective (4) and from there to the specimen (8), the beam combiner (7) being structured such that it directs the illumination light used for the conventional fluorescent illumination and the illumination light used for the evanescent illumination into the objective (4) in geometrically separated beam paths (5, 6), is characterized in that the beam combiner (7) has at least two spatially separated zones (9, 10) for coupling in the illumination light used for the conventional fluorescent illumination and at least two spatially separated zones (11, 12) for couplin
    Type: Application
    Filed: February 8, 2008
    Publication date: May 13, 2010
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventor: Andreas Hecker
  • Patent number: 7633622
    Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
    Type: Grant
    Filed: May 1, 2006
    Date of Patent: December 15, 2009
    Assignee: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Publication number: 20090213456
    Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.
    Type: Application
    Filed: May 4, 2009
    Publication date: August 27, 2009
    Applicant: LEICA MICROSYSTEMS CMS GMBH
    Inventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich
  • Publication number: 20090047164
    Abstract: A spheriodal cast alloy for producing cast iron products with great mechanical strength, high-wear resistance and a high degree of ductility. The alloy comprises the following as non-iron components: between 2.5 and 2.8 wt. % C, between 2.4 and 3.4 wt. % Si, between 0.02 and 0.08 wt. % P, between 0.02 and 0.06 wt. % Mg, between 0.01 and 0.05 wt. % Cr, between 0.002 and 0.02 wt. % Al, between 0.0005 and 0.015 wt. % S, between 0.0002 and 0.002 wt. % B and conventional impurities. The alloy contains between 3.0 and 3.7 wt. % C, between 2.6 and 3.4 wt. % Si, between 0.02 and 0.05 wt. % P, between 0.025 and 0.045 wt. % Mg, between 0.01 and 0.03 wt. % Cr, between 0.003 and 0.017 wt. % Al, between 0.0005 and 0.012 wt. % S and between 0.0004 and 0.002 wt. % B. The alloy is used for example to produce chassis parts or brake discs in the automobile industry.
    Type: Application
    Filed: November 14, 2005
    Publication date: February 19, 2009
    Applicant: GEORG FISCHER AUTOMOTIVE AG
    Inventors: Werner Menk, Rolf Rietzscher, Andreas Hecker, Torsten Rieck
  • Patent number: 7405874
    Abstract: The invention relates to a microscope for conventional fluorescence microscopy (Epi fluorescence) and for total internal reflection microscopy, including at least one light source (1) for the conventional fluorescence illumination and at least one light source (2) for the evanescent illumination, and including an objective (4), wherein the illuminating light coming from the light sources (1, 2) on different illumination paths (5, 6) enters the objective (4) via a beam combiner (7) and from there is passed to the sample (8), characterized in that the exit pupil of the objective (4) is imaged on the beam combiner (7) and the beam combiner is structured such that it guides the illuminating light used for the conventional fluorescence illumination and the illuminating light used for the evanescent illumination into the objective (4) along beam paths (5, 6) which are geometrically separate from one another, and preferably run parallel or coaxially to one another.
    Type: Grant
    Filed: August 7, 2006
    Date of Patent: July 29, 2008
    Assignee: Leica Microsystems CMS GmbH
    Inventor: Andreas Hecker
  • Publication number: 20080151226
    Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.
    Type: Application
    Filed: May 1, 2006
    Publication date: June 26, 2008
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Heinrich Ulrich, Werner Knebel, Kyra Moellmann
  • Publication number: 20080073165
    Abstract: A brake disc assembly for vehicle wheels, comprising at least one friction ring and a wheel fixing zone that runs parallel to the friction ring. The friction ring and wheel fixing zone are configured in one-piece from a die-cast material and connecting struts are formed between the friction ring and the wheel fixing zone. The assembly is characterized in that the connecting struts are elastically sprung in a radial and axial direction.
    Type: Application
    Filed: August 30, 2005
    Publication date: March 27, 2008
    Inventors: Guido Rau, Andreas Hecker, Torsten Rieck
  • Publication number: 20070035821
    Abstract: The invention relates to a microscope for conventional fluorescence microscopy (Epi fluorescence) and for total internal reflection microscopy, comprising at least one light source (1) for the conventional fluorescence illumination and at least one light source (2) for the evanescent illumination, and comprising an objective (4), wherein the illuminating light coming from the light sources (1, 2) on different illumination paths (5, 6) enters the objective (4) via a beam combiner (7) and from there is passed to the sample (8), characterized in that the exit pupil of the objective (4) is imaged on the beam combiner (7) and the beam combiner is structured such that it guides the illuminating light used for the conventional fluorescence illumination and the illuminating light used for the evanescent illumination into the objective (4) along beam paths (5, 6) which are geometrically separate from one another, and preferably run parallel or coaxially to one another.
    Type: Application
    Filed: August 7, 2006
    Publication date: February 15, 2007
    Inventor: Andreas Hecker
  • Publication number: 20060292632
    Abstract: A method of ascertaining the orientation of molecules in a biological specimen by total internal reflection includes focusing illuminating light through an objective in different positions in a plane of a pupil of the objective so as to generate a plurality of respective differently oriented evanescent fields in the specimen. Respective different fluorescence intensities resulting from the differently oriented evanescent fields are correlated with respective different orientations of molecules in the specimen.
    Type: Application
    Filed: April 20, 2006
    Publication date: December 28, 2006
    Inventor: Andreas Hecker
  • Publication number: 20060245047
    Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample comprises an adjustment mechanism with which the polarization of the illumination light beam may be changed.
    Type: Application
    Filed: May 1, 2006
    Publication date: November 2, 2006
    Applicant: Leica Microsystems CMS GmbH
    Inventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich