Patents by Inventor Andreas Hecker
Andreas Hecker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8771589Abstract: A spheriodal cast alloy for producing cast iron products with great mechanical strength, high-wear resistance and a high degree of ductility. The alloy comprises the following as non-iron components: between 2.5 and 2.8 wt. % C, between 2.4 and 3.4 wt. % Si, between 0.02 and 0.08 wt. % P, between 0.02 and 0.06 wt. % Mg, between 0.01 and 0.05 wt. % Cr, between 0.002 and 0.02 wt. % Al, between 0.0005 and 0.015 wt. % S, between 0.0002 and 0.002 wt. % B and conventional impurities. The alloy contains between 3.0 and 3.7 wt. % C, between 2.6 and 3.4 wt. % Si, between 0.02 and 0.05 wt. % P, between 0.025 and 0.045 wt. % Mg, between 0.01 and 0.03 wt. % Cr, between 0.003 and 0.017 wt. % Al, between 0.0005 and 0.012 wt. % S and between 0.0004 and 0.002 wt. % B. The alloy is used for example to produce chassis parts or brake discs in the automobile industry.Type: GrantFiled: November 14, 2005Date of Patent: July 8, 2014Assignee: Georg Fischer GmbHInventors: Werner Menk, Rolf Rietzscher, Andreas Hecker, Torsten Rieck
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Patent number: 8559103Abstract: A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy is described. A first light source emits conventional fluorescent illumination light along a first illumination path and a second light source emitting evanescent illumination light along a second illumination path that differs from the first illumination path. An objective emits light onto an object to be viewed. A beam combiner directs the two lights into the objective while keeping their beam paths geometrically separated. The beam combiner comprises at least two spatially separated first zones for coupling in the conventional fluorescent illumination light and at least two spatially separated second zones for coupling in the evanescent illumination light. The first and second zones are adapted in their size and position to objective pupils of different objectives.Type: GrantFiled: February 8, 2008Date of Patent: October 15, 2013Assignee: Leica Microsystems CMS GmbHInventor: Andreas Hecker
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Patent number: 7948629Abstract: A microscope for total internal reflection microscopy. The microscope includes at least one light source configured to provide an illumination light to an illumination beam path for an evanescent illumination of a specimen so as to reflect the illumination light at an interface to the specimen or a specimen cover so as to return reflection light into the illumination beam path, an objective through which the illumination light and detection light are directable, a detection device, and a coupling device. The coupling device includes a mirror disposed in the illumination beam path. The mirror has a reflecting surface and a hole, the hole being configured to pass the illumination light there through so as to couple the illumination light into the illumination beam path.Type: GrantFiled: August 11, 2006Date of Patent: May 24, 2011Assignee: Leica Microsystems CMS GmbHInventor: Andreas Hecker
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Publication number: 20100171946Abstract: A microscope for total internal reflection microscopy. The microscope includes at least one light source configured to provide an illumination light to an illumination beam path for an evanescent illumination of a specimen so as to reflect the illumination light at an interface to the specimen or a specimen cover so as to return reflection light into the illumination beam path, an objective through which the illumination light and detection light are directable, a detection device, and a coupling device. The coupling device includes a mirror disposed in the illumination beam path. The mirror has a reflecting surface and a hole, the hole being configured to pass the illumination light there through so as to couple the illumination light into the illumination beam path.Type: ApplicationFiled: August 11, 2006Publication date: July 8, 2010Applicant: LEICA MICROSYSTEMS CMS GMBHInventor: Andreas Hecker
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Patent number: 7746552Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.Type: GrantFiled: May 4, 2009Date of Patent: June 29, 2010Assignee: Leica Microsystems CMS GmbHInventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich
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Patent number: 7733483Abstract: A method of ascertaining the orientation of molecules in a biological specimen by total internal reflection includes focusing illuminating light through an objective in different positions in a plane of a pupil of the objective so as to generate a plurality of respective differently oriented evanescent fields in the specimen. Respective different fluorescence intensities resulting from the differently oriented evanescent fields are correlated with respective different orientations of molecules in the specimen.Type: GrantFiled: April 20, 2006Date of Patent: June 8, 2010Assignee: Leica Microsystems CMS GmbHInventor: Andreas Hecker
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Publication number: 20100118394Abstract: A microscope for conventional fluorescence microscopy (epi-fluorescence) and for total internal reflection microscopy, comprising at least one light source (1) for the conventional fluorescent illumination and at least one light source (2) for the evanescent illumination, and comprising an objective (4), wherein the illumination light coming from the light sources (1, 2) on different illumination paths (5, 6) is passed via a beam combiner (7) into the objective (4) and from there to the specimen (8), the beam combiner (7) being structured such that it directs the illumination light used for the conventional fluorescent illumination and the illumination light used for the evanescent illumination into the objective (4) in geometrically separated beam paths (5, 6), is characterized in that the beam combiner (7) has at least two spatially separated zones (9, 10) for coupling in the illumination light used for the conventional fluorescent illumination and at least two spatially separated zones (11, 12) for couplinType: ApplicationFiled: February 8, 2008Publication date: May 13, 2010Applicant: LEICA MICROSYSTEMS CMS GMBHInventor: Andreas Hecker
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Patent number: 7633622Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.Type: GrantFiled: May 1, 2006Date of Patent: December 15, 2009Assignee: Leica Microsystems CMS GmbHInventors: Andreas Hecker, Heinrich Ulrich, Werner Knebel, Kyra Moellmann
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Publication number: 20090213456Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample includes an adjustment mechanism with which the polarization of the illumination light beam may be changed.Type: ApplicationFiled: May 4, 2009Publication date: August 27, 2009Applicant: LEICA MICROSYSTEMS CMS GMBHInventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich
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Publication number: 20090047164Abstract: A spheriodal cast alloy for producing cast iron products with great mechanical strength, high-wear resistance and a high degree of ductility. The alloy comprises the following as non-iron components: between 2.5 and 2.8 wt. % C, between 2.4 and 3.4 wt. % Si, between 0.02 and 0.08 wt. % P, between 0.02 and 0.06 wt. % Mg, between 0.01 and 0.05 wt. % Cr, between 0.002 and 0.02 wt. % Al, between 0.0005 and 0.015 wt. % S, between 0.0002 and 0.002 wt. % B and conventional impurities. The alloy contains between 3.0 and 3.7 wt. % C, between 2.6 and 3.4 wt. % Si, between 0.02 and 0.05 wt. % P, between 0.025 and 0.045 wt. % Mg, between 0.01 and 0.03 wt. % Cr, between 0.003 and 0.017 wt. % Al, between 0.0005 and 0.012 wt. % S and between 0.0004 and 0.002 wt. % B. The alloy is used for example to produce chassis parts or brake discs in the automobile industry.Type: ApplicationFiled: November 14, 2005Publication date: February 19, 2009Applicant: GEORG FISCHER AUTOMOTIVE AGInventors: Werner Menk, Rolf Rietzscher, Andreas Hecker, Torsten Rieck
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Patent number: 7405874Abstract: The invention relates to a microscope for conventional fluorescence microscopy (Epi fluorescence) and for total internal reflection microscopy, including at least one light source (1) for the conventional fluorescence illumination and at least one light source (2) for the evanescent illumination, and including an objective (4), wherein the illuminating light coming from the light sources (1, 2) on different illumination paths (5, 6) enters the objective (4) via a beam combiner (7) and from there is passed to the sample (8), characterized in that the exit pupil of the objective (4) is imaged on the beam combiner (7) and the beam combiner is structured such that it guides the illuminating light used for the conventional fluorescence illumination and the illuminating light used for the evanescent illumination into the objective (4) along beam paths (5, 6) which are geometrically separate from one another, and preferably run parallel or coaxially to one another.Type: GrantFiled: August 7, 2006Date of Patent: July 29, 2008Assignee: Leica Microsystems CMS GmbHInventor: Andreas Hecker
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Publication number: 20080151226Abstract: A microscope with evanescent sample illumination and a method for testing samples are disclosed. A first evanescent field, which exhibits a first penetration depth in the sample, and a second evanescent field, which exhibits a second penetration depth in the sample that is greater than the first penetration depth, are produced. A detector is provided that detects the first detection light, which exits from the part of the sample illuminated with the first evanescent field, and which produces first detection light data therefrom, and the second detection light, which exits from the part of the sample illuminated with the second evanescent field, and which produces second detection light data therefrom. Furthermore, a processing module is provided for processing the first and second detection light data.Type: ApplicationFiled: May 1, 2006Publication date: June 26, 2008Applicant: Leica Microsystems CMS GmbHInventors: Andreas Hecker, Heinrich Ulrich, Werner Knebel, Kyra Moellmann
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Publication number: 20080073165Abstract: A brake disc assembly for vehicle wheels, comprising at least one friction ring and a wheel fixing zone that runs parallel to the friction ring. The friction ring and wheel fixing zone are configured in one-piece from a die-cast material and connecting struts are formed between the friction ring and the wheel fixing zone. The assembly is characterized in that the connecting struts are elastically sprung in a radial and axial direction.Type: ApplicationFiled: August 30, 2005Publication date: March 27, 2008Inventors: Guido Rau, Andreas Hecker, Torsten Rieck
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Publication number: 20070035821Abstract: The invention relates to a microscope for conventional fluorescence microscopy (Epi fluorescence) and for total internal reflection microscopy, comprising at least one light source (1) for the conventional fluorescence illumination and at least one light source (2) for the evanescent illumination, and comprising an objective (4), wherein the illuminating light coming from the light sources (1, 2) on different illumination paths (5, 6) enters the objective (4) via a beam combiner (7) and from there is passed to the sample (8), characterized in that the exit pupil of the objective (4) is imaged on the beam combiner (7) and the beam combiner is structured such that it guides the illuminating light used for the conventional fluorescence illumination and the illuminating light used for the evanescent illumination into the objective (4) along beam paths (5, 6) which are geometrically separate from one another, and preferably run parallel or coaxially to one another.Type: ApplicationFiled: August 7, 2006Publication date: February 15, 2007Inventor: Andreas Hecker
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Publication number: 20060292632Abstract: A method of ascertaining the orientation of molecules in a biological specimen by total internal reflection includes focusing illuminating light through an objective in different positions in a plane of a pupil of the objective so as to generate a plurality of respective differently oriented evanescent fields in the specimen. Respective different fluorescence intensities resulting from the differently oriented evanescent fields are correlated with respective different orientations of molecules in the specimen.Type: ApplicationFiled: April 20, 2006Publication date: December 28, 2006Inventor: Andreas Hecker
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Publication number: 20060245047Abstract: A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample comprises an adjustment mechanism with which the polarization of the illumination light beam may be changed.Type: ApplicationFiled: May 1, 2006Publication date: November 2, 2006Applicant: Leica Microsystems CMS GmbHInventors: Andreas Hecker, Werner Knebel, Kyra Moellmann, Heinrich Ulrich