Patents by Inventor Andreas Kalt

Andreas Kalt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10411883
    Abstract: Devices for sampling a plurality of input signals are provided, wherein a sampling device is controlled to sample the input signals in a random order with additional delays. Other embodiments relate to voltage monitoring systems and corresponding methods.
    Type: Grant
    Filed: October 18, 2016
    Date of Patent: September 10, 2019
    Assignee: Infineon Technologies AG
    Inventors: Martin Pernull, Andreas Kalt, Gerhard Pichler, Franz Wachter, Bernhard Wotruba
  • Patent number: 10348304
    Abstract: High-voltage level-shifter architectures that provide galvanic coupling between low/high-voltage domains while simultaneously enabling high speed operation, low static current consumption and high reliability under a myriad of environmental circumstances including electromagnetic interference as well as process, voltage and temperature variations.
    Type: Grant
    Filed: September 25, 2017
    Date of Patent: July 9, 2019
    Assignee: Infineon Technologies AG
    Inventors: Igor Ullmann, Andreas Kalt, Franz Wachter
  • Publication number: 20190097633
    Abstract: High-voltage level-shifter architectures that provide galvanic coupling between low/high-voltage domains while simultaneously enabling high speed operation, low static current consumption and high reliability under a myriad of environmental circumstances including electromagnetic interference as well as process, voltage and temperature variations.
    Type: Application
    Filed: September 25, 2017
    Publication date: March 28, 2019
    Inventors: Igor Ullmann, Andreas Kalt, Franz Wachter
  • Patent number: 10079610
    Abstract: Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip.
    Type: Grant
    Filed: July 5, 2016
    Date of Patent: September 18, 2018
    Assignee: Infineon Technologies AG
    Inventors: Peter Bogner, Andreas Kalt, Jaafar Mejri, Martin Pernull
  • Publication number: 20180210027
    Abstract: Methods and devices are provided. A device may comprise a main current path (11) between a terminal (10) and a supply voltage rail (15). Furthermore, an auxiliary current path (12) coupled to associated measurement circuitry to output a test measurement result (res) is provided.
    Type: Application
    Filed: January 10, 2018
    Publication date: July 26, 2018
    Inventor: Andreas Kalt
  • Publication number: 20180198460
    Abstract: Representative implementations of devices and techniques provide a built-in self-test (BIST) for an analog-to-digital converter (ADC). Stimuli needed to test an ADC are generated within the chip containing the ADC. Evaluation circuitry is also available on-chip. Generation and evaluation circuits and systems are based on existing circuits and/or components of the chip.
    Type: Application
    Filed: July 5, 2016
    Publication date: July 12, 2018
    Inventors: Peter Bogner, Andreas Kalt, Jaafar Mejri, Martin Pernull
  • Publication number: 20170118012
    Abstract: Devices for sampling a plurality of input signals are provided, wherein a sampling device is controlled to sample the input signals in a random order with additional delays. Other embodiments relate to voltage monitoring systems and corresponding methods.
    Type: Application
    Filed: October 18, 2016
    Publication date: April 27, 2017
    Inventors: Martin Pernull, Andreas Kalt, Gerhard Pichler, Franz Wachter, Bernhard Wotruba