Abstract: Layouts for data pads on a semiconductor die are disclosed. An apparatus may include circuits, a first edge, a second edge perpendicular to the first edge, a third edge opposite the first edge, and a fourth edge opposite the second edge. The apparatus may also include data pads variously electrically coupled to the circuits. The data pads may include a data pad positioned a first distance from the first edge and a second distance from the second edge. The apparatus may also include dummy data pads electrically isolated from the circuits. The dummy data pads may include a dummy data pad positioned substantially the first distance from the first edge and substantially the second distance from the fourth edge. Associated systems and methods are also disclosed.

Abstract: Layouts for data pads on a semiconductor die are disclosed. An apparatus may include circuits, a first edge, a second edge perpendicular to the first edge, a third edge opposite the first edge, and a fourth edge opposite the second edge. The apparatus may also include data pads variously electrically coupled to the circuits. The data pads may include a data pad positioned a first distance from the first edge and a second distance from the second edge. The apparatus may also include dummy data pads electrically isolated from the circuits. The dummy data pads may include a dummy data pad positioned substantially the first distance from the first edge and substantially the second distance from the fourth edge. Associated systems and methods are also disclosed.

Abstract: Methods for designing semiconductor components, for fabricating semiconductor components, and corresponding semiconductor components are provided. In this case, capacitance structures are either coupled to a supply network or used for rectifying design violations.

Abstract: Methods for designing semiconductor components, for fabricating semiconductor components, and corresponding semiconductor components are provided. In this case, capacitance structures are either coupled to a supply network or used for rectifying design violations.

Abstract: Various methods for determining a layout of an integrated circuit are described. For example, a method is described comprising determining a layout of an integrated circuit comprising a plurality of functional cells, wherein a maximum extent of each of the cells in a first direction is identical and wherein an outer boundary of a first cell of the plurality of cells forms a first polygon with at least five corner points; and storing data representing the layout on a computer-readable medium. Integrated circuits in accordance with the layout are also described.

Abstract: Various methods for determining a layout of an integrated circuit are described. For example, a method is described comprising determining a layout of an integrated circuit comprising a plurality of functional cells, wherein a maximum extent of each of the cells in a first direction is identical and wherein an outer boundary of a first cell of the plurality of cells forms a first polygon with at least five corner points; and storing data representing the layout on a computer-readable medium. Integrated circuits in accordance with the layout are also described.

Abstract: Circuit elements are operated as a function of a state of at least one change-over signal, in each case with a particular respective clock mode. Timing analysis is carried out by means of a description of the circuit. The description contains information as to whether the change-over signal is a quasi-static signal which does not change during operation of the circuit, and the descriptions for the circuit elements each contain information as to the state of the change-over signal with which the respective circuit element is operated in which clock mode. In the course of the timing analysis of a timing path which contains the circuit elements, the analysis unit checks whether the change-over signal is a quasi-static signal, and, if so, combinations of respective particular clock modes of the circuit elements that presuppose different states of the change-over signal are not taken into account.