Abstract: The present disclosure provides a measurement application device comprising a first measurement signal path configured to receive an analog measurement signal, and to convert the analog measurement signal into a first digital measurement signal, a first signal processor configured to convert the first digital measurement signal into a first IQ data stream, a first demodulator configured to perform an IQ demodulation on the first IQ data stream and provide a first complex signal data stream, a first selector configured to group samples of the first complex signal data stream according to predetermined criteria, and to output at least one respective first group of samples of the first complex signal data stream, and a respective second signal processing path, wherein a cross-correlator calculates a cross-correlation for the samples of each group pair comprising one of the first groups, and the respective second group. Further, a respective method is provided.

Abstract: A measurement system for determining a noise figure of a device under test is described. The measurement system determines a first total error power based on the output signal by a first noise canceling technique, wherein the first total error power includes systematic errors originating in the device under test and in the measurement system. The measurement system determines a second total error power based on the output signal by a different, second noise canceling technique. The second total error power includes systematic errors originating in the measurement system. The second total error power further includes noise originating in the device under test and in the measurement system outside of the measurement instrument. The measurement system is configured to subtract the first total error power from the second total error power, thereby obtaining an external noise power.

Abstract: A measurement device is provided. The measurement device comprises a display configured to display a measurement trace, an analyzing unit configured to analyze a subset of measurement data represented by the measurement trace on the basis of at least one target measurement parameter, and a post-processing unit configured to search for the at least one target measurement parameter.

Abstract: An apparatus and a method for accurate determination of a transfer function of a device under test (DUT) comprising a measurement unit adapted to measure a transfer function of the device under test (DUT) across a frequency range in response to a wideband signal applied by the measurement unit to the device under test (DUT), a preprocessing unit adapted to cut out data of the measured transfer function at frequencies where the applied wideband signal comprises a low spectral power density and a data processing unit adapted to process the remaining data of the measured transfer function to determine an accurate transfer function of said device under test (DUT).

Abstract: A signal processing method is provided for processing a digital input signal. The method may be carried out by a measurement instrument. The measurement instrument includes a signal input, a measurement circuit, and an analysis circuit. The signal processing method includes the steps of: receiving a digital input signal from a device under test; capturing a first number N1 of IQ measurement sets based on the received digital input signal, wherein each IQ measurement set comprises a plurality of IQ measurement points; determining an IQ average based on the captured IQ measurement sets, thereby obtaining an averaged signal; determining a second number N2 of noise vectors based on the averaged signal and based on the captured IQ measurement sets; and averaging over the determined noise vectors, thereby obtaining an averaged noise vector.

Abstract: A phase noise measurement method of measuring phase noise of a device under test is described. The phase noise measurement method includes the steps of: determining, by a measurement circuit, measurement IQ data based on an output signal of a device under test; setting, by a control circuit, a magnitude threshold; determining, by an analysis circuit, critical samples of reference IQ data for which a magnitude of a reference signal is smaller than the magnitude threshold; discarding the critical samples of the reference IQ data and corresponding critical samples of the measurement IQ data, thereby obtaining modified reference IQ data and modified measurement IQ data; and determining, by the analysis circuit, a phase noise spectrum of the output signal of the device under test based on the modified reference IQ data and based on the modified measurement IQ data. Further, a measurement system is described.

Abstract: The present disclosure relates to a predistortion method and a predistortion system for a non-linear device-under-test, DUT. The predistortion method comprises the steps of: providing a reference input waveform to the DUT; deriving a predistorted waveform for the DUT based on the reference input waveform using an iterative direct digital predistortion technique; analyzing a relationship between the reference input waveform and the calculated predistorted waveform using a mathematical model; deriving a predistortion algorithm for the DUT based on said analysis; and applying said predistortion algorithm to an input signal and feeding the, thus, predistorted input signal to the DUT.

Abstract: A method for at least one of identifying and compensating for system errors in a measurement system is disclosed, wherein the measurement system comprises a signal generator and a signal analyzer. The method comprises: generating a test signal via the signal generator, the test signal having predetermined properties; forwarding the test signal to a device under test; processing the test signal via the device under test, thereby generating a transmission signal; receiving the transmission signal via the signal analyzer; determining a response function of the device under test based on the test signal and based on the transmission signal; and determining at least one periodic component of the response function. Further, a measurement system as well as a calibration system are disclosed.

Abstract: A method for at least one of identifying and compensating for system errors in a measurement system is disclosed, wherein the measurement system comprises a signal generator and a signal analyzer. The method comprises: generating a test signal via the signal generator, the test signal having predetermined properties; forwarding the test signal to a device under test; processing the test signal via the device under test, thereby generating a transmission signal; receiving the transmission signal via the signal analyzer; determining a response function of the device under test based on the test signal and based on the transmission signal; and determining at least one periodic component of the response function. Further, a measurement system as well as a calibration system are disclosed.

Abstract: A method for determining phase noise in a periodically modulated signal is described. The modulated signal is processed to generate a processed signal from the modulated signal. At least an approximate period of a modulation of the modulated signal is determined from the processed signal. The type of modulation of the modulated signal is determined from the processed signal. The modulated signal is demodulated based on the determined period and the determined type of modulation to generate a demodulated signal, and the phase noise is determined from the demodulated signal. Moreover, a measurement device is described.

Abstract: A method for identifying the noise figure of a device under test is described. A signal generator that outputs the modulated signal, a device under test and an analyzer are provided. The signal generator is connected with the analyzer directly wherein at least two error vector magnitude measurements are performed. The signal generator is connected with the device under test and the device under test is connected with the analyzer wherein at least two error vector magnitude measurements are performed. The noise contribution of the device under test is determined from the error vector magnitude measurements performed. A gain measurement is performed on the device under test. The noise figure of the device under test is calculated based on the noise contribution of the device under test obtained and the gain of the device under test obtained. Further, a measurement system is described.

Abstract: A measurement device and a method for data visualization and three-dimensional display are provided. The measurement device comprises a measuring unit, a memory, storing measurement results measured by the measuring unit and which are a function of at least two different measurement parameters, a processor and a display. The processor is configured to create a three-dimensional, 3D, graph of the measurement results stored in the memory, and to automatically compute, on the basis of at least one point of interest in the form of a data marker, two cross-sections of the 3D graph along different planes, whereby one of the sides of each cross-section terminates at the surface of the 3D graph and includes the position of the at least one data marker. The display displays the 3D graph of the measurement results, the at least one data marker and at least one of the cross-sections of the 3D graph associated with the at least one data marker.

Abstract: A method for analyzing the resolution and/or the accuracy of a transmission unit of a radar sensor is described wherein a transmitter signal is received via a receiving unit. At least one echo signal based on said received signal is simulated. The frequency difference of said transmitter signal and said echo signal is determined. Said frequency difference is filtered and transformed in order to obtain a transform. At least one maximum of said frequency difference in said transform is detected. Spectral properties of said frequency difference in said transform are determined. At least one quality parameter of said spectral properties is outputted. Further, a radar sensor is described.

Abstract: The invention relates to a method for investigating signal parameters in an electrical measuring device with a display element with the method steps: display of a detected signal on the display element, manual masking of at least one signal component of the signal by a user by means of a masking element of the measuring device and investigation of signal parameters from the masked signal component or from the unmasked signal component of the signal by the measuring device. At least one further signal parameter is also investigated alongside the time duration and the bandwidth of the masked signal component. According to the invention, a corresponding measuring device is also provided.

Abstract: A method for identifying the noise figure of a device under test is described. A signal generator that outputs the modulated signal, a device under test and an analyzer are provided. The signal generator is connected with the analyzer directly wherein at least two error vector magnitude measurements are performed. The signal generator is connected with the device under test and the device under test is connected with the analyzer wherein at least two error vector magnitude measurements are performed. The noise contribution of the device under test is determined from the error vector magnitude measurements performed. A gain measurement is performed on the device under test. The noise figure of the device under test is calculated based on the noise contribution of the device under test obtained and the gain of the device under test obtained. Further, a measurement system is described.

Abstract: A method for determining phase noise in a periodically modulated signal is described. The modulated signal is processed to generate a processed signal from the modulated signal. At least an approximate period of a modulation of the modulated signal is determined from the processed signal. The type of modulation of the modulated signal is determined from the processed signal. The modulated signal is demodulated based on the determined period and the determined type of modulation to generate a demodulated signal, and the phase noise is determined from the demodulated signal. Moreover, a measurement device is described.

Abstract: A digital triggering system for processing data relating to a signal received is described, with an analog-to-digital converter, an IQ data source providing IQ data, a first digital signal processor, and at least a second digital signal processor. The first digital signal processor is connected with the IQ data source via a first signal path. The second digital signal processor is connected with the IQ data source via a second signal path. The first digital signal processor has at least a first signal processing parameter. The second digital signal processor has at least a second signal processing parameter. The first signal processing parameter and the second signal processing parameter are independent from each other. The first digital signal processor generates a trigger signal based upon a characteristic of the IQ data obtained from the IQ data source. The first digital signal processor triggers the second digital signal processor via the trigger signal to acquire IQ data obtained from the IQ data source.

Abstract: A digital triggering system for processing data relating to a signal received is described, with an analog-to-digital converter, an IQ data source providing IQ data, a first digital signal processor, and at least a second digital signal processor. The first digital signal processor is connected with the IQ data source via a first signal path. The second digital signal processor is connected with the IQ data source via a second signal path. The first digital signal processor has at least a first signal processing parameter. The second digital signal processor has at least a second signal processing parameter. The first signal processing parameter and the second signal processing parameter are independent from each other. The first digital signal processor generates a trigger signal based upon a characteristic of the IQ data obtained from the IQ data source. The first digital signal processor triggers the second digital signal processor via the trigger signal to acquire IQ data obtained from the IQ data source.

Abstract: A measurement device is provided. The measurement device comprises a display configured to display a measurement trace, an analyzing unit configured to analyze a subset of measurement data represented by the measurement trace on the basis of at least one target measurement parameter, and a post-processing unit configured to search for the at least one target measurement parameter.

Abstract: The invention relates to a method for determining a deviation of a broadband measurement signal from a reference signal. The method provides the steps: subdivision of the signal into at least two measurement-signal frequency bands; displacement of the measurement-signal frequency bands; and reconstruction of the at least two measurement-signal frequency bands. A corresponding measurement device is also contained within the idea of the invention.