Patents by Inventor Andreas Peter Haub

Andreas Peter Haub has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9251296
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: February 2, 2016
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Patent number: 9020906
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which are specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: August 1, 2006
    Date of Patent: April 28, 2015
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle Krantz
  • Patent number: 8754889
    Abstract: Cursor synchronization in a plurality of graphs. A plurality of graphs may be displayed. Each graph may visually represent data and may include at least two axis. User input may be received specifying a value of a first axis of a first graph of the plurality of graphs. The method may determine if the first axis in the first graph corresponds to a first axis of a second graph in response to the user input. A visual indication may be indicated at a second value in the second graph in response to determining that the first axis in the first graph corresponds to the first axis of the second graph. The second value may correspond to the first value.
    Type: Grant
    Filed: March 18, 2009
    Date of Patent: June 17, 2014
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Sven Johannsen
  • Patent number: 8386464
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: February 26, 2013
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Patent number: 8099400
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: March 26, 2007
    Date of Patent: January 17, 2012
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Patent number: 8060483
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which are specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: August 1, 2006
    Date of Patent: November 15, 2011
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle Krantz
  • Patent number: 8055637
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which are specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Grant
    Filed: August 1, 2006
    Date of Patent: November 8, 2011
    Assignee: National Instruments Corporation
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle Krantz
  • Publication number: 20100238174
    Abstract: Cursor synchronization in a plurality of graphs. A plurality of graphs may be displayed. Each graph may visually represent data and may include at least two axis. User input may be received specifying a value of a first axis of a first graph of the plurality of graphs. The method may determine if the first axis in the first graph corresponds to a first axis of a second graph in response to the user input. A visual indication may be indicated at a second value in the second graph in response to determining that the first axis in the first graph corresponds to the first axis of the second graph. The second value may correspond to the first value.
    Type: Application
    Filed: March 18, 2009
    Publication date: September 23, 2010
    Inventors: Andreas Peter Haub, Sven Johannsen
  • Publication number: 20080046838
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Application
    Filed: March 26, 2007
    Publication date: February 21, 2008
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Publication number: 20080046414
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Application
    Filed: March 26, 2007
    Publication date: February 21, 2008
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Publication number: 20080046457
    Abstract: A method and system is presented which provides a TDM framework for managing self-describing measurement data. The TDM framework provides applications with a central platform for accessing measurement data across an entire enterprise system. By means of individual plug-ins, which may be specific to a given data file format, meta-data for each data store in the enterprise may be indexed in a unified manner. The unified indexing, in turn, provides the ability to browse and query the indexed measurement data without requiring the opening or reading from a source data file.
    Type: Application
    Filed: March 26, 2007
    Publication date: February 21, 2008
    Inventors: Andreas Peter Haub, Stefan Romainczyk, Ralf Deininger, Helmut Helpenstein, Andreas Krantz, Myrle H. Krantz, Eva Wolpers
  • Patent number: 7191184
    Abstract: A system and method for storing measurements. Each measurement may include bulk data and attribute data. The bulk data and the attribute data may be stored using different storage mechanisms. In one embodiment, relational database technology may be used to store the attribute data. Relational database technology may facilitate querying or searching on the attribute data. The bulk data may be stored in a database specialized for storing bulk data.
    Type: Grant
    Filed: May 2, 2002
    Date of Patent: March 13, 2007
    Assignee: National Instruments Corporation
    Inventors: Guy Vachon Laborde, David Mark Pierce, Andreas Peter Haub, Stefan Romainczyk, Helmut J. Helpenstein
  • Publication number: 20030154192
    Abstract: A system and method for storing measurements. Each measurement may include bulk data and attribute data. The bulk data and the attribute data may be stored using different storage mechanisms. In one embodiment, relational database technology may be used to store the attribute data. Relational database technology may facilitate querying or searching on the attribute data. The bulk data may be stored in a database specialized for storing bulk data.
    Type: Application
    Filed: May 2, 2002
    Publication date: August 14, 2003
    Inventors: Guy Vachon Laborde, David Mark Pierce, Andreas Peter Haub, Stefan Romainczyk, Helmut J. Helpenstein
  • Publication number: 20030105811
    Abstract: A system and method for making technical data available across an enterprise which may contain multiple data stores distributed across networked servers. These distributed data stores create the impression that they are actually part of one central storage, referred to as a networked DataCache. The user may thus be able to find various kinds of technical data without knowing where they were from the start. The data may also be adequately self describing via meta-data so that a user or application is able to find it and use it without implicit knowledge of the data, its meaning, or its structure. The networked DataCache allows a user of measurements to know where a measurement is and what it means.
    Type: Application
    Filed: May 2, 2002
    Publication date: June 5, 2003
    Inventors: Guy Vachon Laborde, David Mark Pierce, Andreas Peter Haub, Stefan Romainczyk, Helmut J. Helpenstein
  • Publication number: 20030061195
    Abstract: A Technical Data Management framework (TDM framework) including various components for managing the storage and retrieval of technical data, such as measurement data. One or more of these components may be usable by client application programs, simplifying the task of managing technical data that is stored and used by multiple applications. The TDM framework described herein may simplify technical data management tasks by utilizing data models and providing a common data retrieval and storage interface for applications to use to manage technical data.
    Type: Application
    Filed: May 2, 2002
    Publication date: March 27, 2003
    Inventors: Guy Vachon Laborde, Andreas Peter Haub, Stefan Romainczyk, Helmut J. Helpenstein