Patents by Inventor Andreas Schertel
Andreas Schertel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240038484Abstract: Fastening an object to a movable manipulator and/or an object holder in a particle beam apparatus and moving the object in the particle beam apparatus includes fastening a material unit, configured to hold an object, to the manipulator using a particle beam, fastening the object to the material unit using the particle beam, and, using the manipulator and/or an object stage, moving the object fastened to the material unit. A computer program product has program code which can be loaded into a processor and which, when executed, controls a particle beam apparatus to fasten a material unit, configured to hold an object, to the manipulator using a particle beam, fasten the object to the material unit using the particle beam, and, using the manipulator and/or an object stage, move the object fastened to the material unit.Type: ApplicationFiled: July 27, 2023Publication date: February 1, 2024Applicant: Carl Zeiss Microscopy GmbHInventor: Andreas Schertel
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Publication number: 20230326707Abstract: An object receiving container may receive an object which is examinable, analyzable and/or processable at cryo-temperatures. An object holding system may comprise an object receiving container. A beam apparatus or an apparatus for processing an object may comprise an object receiving container or an object holding system. An object may be examined, analyzed and/or processed using an object receiving container or an object holding system. The object receiving container may comprise a first container unit, a cavity for receiving the object, a second container unit, which is able to be brought into a first position and/or into a second position relative to the first container unit, and at least one fastening device which is arranged at the first container unit or at the second container unit for arranging the object receiving container at a holding device.Type: ApplicationFiled: June 13, 2023Publication date: October 12, 2023Applicant: Carl Zeiss Microscopy GmbHInventors: Andreas Schertel, Andreas Schmaunz, Endre Majorovits, Bernd Stenke, Stephan Hiller, Matthias Karl
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Patent number: 11721518Abstract: An object receiving container may receive an object which is examinable, analyzable and/or processable at cryo-temperatures. An object holding system may comprise an object receiving container. A beam apparatus or an apparatus for processing an object may comprise an object receiving container or an object holding system. An object may be examined, analyzed and/or processed using an object receiving container or an object holding system. The object receiving container may comprise a first container unit, a cavity for receiving the object, a second container unit, which is able to be brought into a first position and/or into a second position relative to the first container unit, and at least one fastening device which is arranged at the first container unit or at the second container unit for arranging the object receiving container at a holding device.Type: GrantFiled: January 28, 2021Date of Patent: August 8, 2023Assignee: Carl Zeiss Microscopy GmbHInventors: Andreas Schertel, Andreas Schmaunz, Endre Majorovits, Bernd Stenke, Stephan Hiller, Matthias Karl
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Publication number: 20210241992Abstract: An object receiving container may receive an object which is examinable, analyzable and/or processable at cryo-temperatures. An object holding system may comprise an object receiving container. A beam apparatus or an apparatus for processing an object may comprise an object receiving container or an object holding system. An object may be examined, analyzed and/or processed using an object receiving container or an object holding system. The object receiving container may comprise a first container unit, a cavity for receiving the object, a second container unit, which is able to be brought into a first position and/or into a second position relative to the first container unit, and at least one fastening device which is arranged at the first container unit or at the second container unit for arranging the object receiving container at a holding device.Type: ApplicationFiled: January 28, 2021Publication date: August 5, 2021Applicant: Carl Zeiss Microscopy GmbHInventors: Andreas Schertel, Andreas Schmaunz, Endre Majorovits, Bernd Stenke, Stephan Hiller, Matthias Karl
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Patent number: 9464995Abstract: Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.Type: GrantFiled: July 24, 2014Date of Patent: October 11, 2016Assignees: Carl Zeiss Microscopy GmbH, Ruprecht-Karls-Universitaet-HeidelbergInventors: Martin Edelmann, Alexandra F. Elli, Andreas Schertel, Rasmus Schroeder
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Patent number: 9455120Abstract: A particle beam device and method for processing and/or for analyzing a sample are provided. A sample carrier is arranged at a first position, in which a sample surface is oriented parallel to a first beam axis of a first particle beam column. The sample carrier is rotatable from the first position into a second position, in which the sample surface is oriented perpendicular to a second beam axis of a second particle beam column. The first and second beam axes intersect at a coincidence point. In the first position a distance between the coincidence point and the first particle beam column is greater than a distance between the sample surface and the first particle beam column. In the second position a distance between the coincidence point and the second particle beam column is greater than a distance between the sample surface and the second particle beam column.Type: GrantFiled: January 6, 2012Date of Patent: September 27, 2016Assignee: Carl Zeiss Microscopy GmbHInventor: Andreas Schertel
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Patent number: 9275832Abstract: A particle beam device and method for processing and/or for analyzing a sample are provided. A sample carrier is arranged at a first position, in which a sample surface is oriented parallel to a first beam axis of a first particle beam column. The sample carrier is rotatable from the first position into a second position, in which the sample surface is oriented perpendicular to a second beam axis of a second particle beam column. The first and second beam axes intersect at a coincidence point. In the first position a distance between the coincidence point and the first particle beam column is greater than a distance between the sample surface and the first particle beam column. In the second position a distance between the coincidence point and the second particle beam column is greater than a distance between the sample surface and the second particle beam column.Type: GrantFiled: January 6, 2012Date of Patent: March 1, 2016Assignee: Carl Zeiss Microscopy GmbHInventor: Andreas Schertel
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Publication number: 20150036122Abstract: Methods and devices for magnified imaging of three-dimensional samples are disclosed. The methods include imaging sample sections of a sample section series using a first particle-optical device. Coordinates of the imaged sample point are acquired and stored in such a way that the coordinates of the imaged sample point can be associated with the respective image of this sample point. The method also includes selecting a volume of interest (VOI), and transmitting the coordinates of the selected VOI to a second particle-optical device. In addition, the method includes imaging the selected VOI by means of the second particle-optical device. A plurality of planes of a sample section are imaged in order to obtain a 3D image of the selected VOI.Type: ApplicationFiled: July 24, 2014Publication date: February 5, 2015Inventors: Martin Edelmann, Alexandra F. Elli, Andreas Schertel, Rasmus Schroeder
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Patent number: 8487270Abstract: A particle beam device includes a movable carrier element with at least one receiving element for receiving a specimen and in which the receiving element is situated on the carrier element. In various embodiments, the receiving element may be situated removably on the carrier element and/or multiple receiving elements may be situated on the carrier element in such a way that a movement of the carrier element causes a movement of the multiple receiving elements in the same spatial direction or around the same axis. The carrier element may be movable in three spatial directions situated perpendicular to one another and rotatable around a first axis which is parallel to an optical axis of the particle beam device and around a second axis which is situated perpendicular to the optical axis. A method for using the particle beam device in connection with specimen study and preparation is also disclosed.Type: GrantFiled: August 20, 2012Date of Patent: July 16, 2013Assignee: Carl Zeiss Microscopy GmbHInventors: Ulrike Zeile, Andreas Schertel
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Publication number: 20120305765Abstract: A particle beam device includes a movable carrier element with at least one receiving element for receiving a specimen and in which the receiving element is situated on the carrier element. In various embodiments, the receiving element may be situated removably on the carrier element and/or multiple receiving elements may be situated on the carrier element in such a way that a movement of the carrier element causes a movement of the multiple receiving elements in the same spatial direction or around the same axis. The carrier element may be movable in three spatial directions situated perpendicular to one another and rotatable around a first axis which is parallel to an optical axis of the particle beam device and around a second axis which is situated perpendicular to the optical axis. A method for using the particle beam device in connection with specimen study and preparation is also disclosed.Type: ApplicationFiled: August 20, 2012Publication date: December 6, 2012Inventors: Ulrike ZEILE, Andreas SCHERTEL
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Patent number: 8247785Abstract: A particle beam device includes a movable carrier element with at least one receiving element for receiving a specimen and in which the receiving element is situated on the carrier element. In various embodiments, the receiving element may be situated removably on the carrier element and/or multiple receiving elements may be situated on the carrier element in such a way that a movement of the carrier element causes a movement of the multiple receiving elements in the same spatial direction or around the same axis. The carrier element may be movable in three spatial directions situated perpendicular to one another and rotatable around a first axis which is parallel to an optical axis of the particle beam device and around a second axis which is situated perpendicular to the optical axis. A method for using the particle beam device in connection with specimen study and preparation is also disclosed.Type: GrantFiled: June 5, 2008Date of Patent: August 21, 2012Assignee: Carl Zeiss NTS GmbHInventors: Ulrike Zeile, Andreas Schertel
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Publication number: 20120205538Abstract: A particle beam device and method for processing and/or for analyzing a sample are provided. A sample carrier is arranged at a first position, in which a sample surface is oriented parallel to a first beam axis of a first particle beam column. The sample carrier is rotatable from the first position into a second position, in which the sample surface is oriented perpendicular to a second beam axis of a second particle beam column. The first and second beam axes intersect at a coincidence point. In the first position a distance between the coincidence point and the first particle beam column is greater than a distance between the sample surface and the first particle beam column. In the second position a distance between the coincidence point and the second particle beam column is greater than a distance between the sample surface and the second particle beam column.Type: ApplicationFiled: January 6, 2012Publication date: August 16, 2012Inventor: Andreas SCHERTEL
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Publication number: 20120112063Abstract: A method and an apparatus for generating three-dimensional image data of a sample are disclosed. A first particle beam is provided for exposing a surface and a second particle beam is provided for generating an image of the surface are used. By moving the sample, it suffices if the first particle beam and/or the second particle beam are initially focused once on a surface of the sample that has already been exposed. Because all further exposed surfaces are always located in the same position, refocusing the first particle beam and/or the second particle beam is no longer required.Type: ApplicationFiled: March 18, 2010Publication date: May 10, 2012Inventor: Andreas Schertel
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Publication number: 20090014648Abstract: A particle beam device includes a movable carrier element with at least one receiving element for receiving a specimen and in which the receiving element is situated on the carrier element. In various embodiments, the receiving element may be situated removably on the carrier element and/or multiple receiving elements may be situated on the carrier element in such a way that a movement of the carrier element causes a movement of the multiple receiving elements in the same spatial direction or around the same axis. The carrier element may be movable in three spatial directions situated perpendicular to one another and rotatable around a first axis which is parallel to an optical axis of the particle beam device and around a second axis which is situated perpendicular to the optical axis. A method for using the particle beam device in connection with specimen study and preparation is also disclosed.Type: ApplicationFiled: June 5, 2008Publication date: January 15, 2009Inventors: Ulrike Zeile, Andreas Schertel