Patents by Inventor Andreas Schicht

Andreas Schicht has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Network analyzer with an n-port network having at least two ports for measuring the wave parameters of a measurement object
    Patent number: 8648746
    Abstract: A network analyzer includes an n-port network with two ports for measuring wave parameters of a measurement object. Each port has a feed for a radio-frequency signal from a signal source. Signal components of the radio-frequency signal fed into the respective port are reflected at the measurement object and the signal components of one or more radio-frequency signals fed into at least one other port are transmitted through the measurement object to the respective port are measured as wave parameters. The two ports are supplied with different radio-frequency signals, wherein frequencies or frequency bands are offset with respect to one another by a frequency offset. Reflected and transmitted signal components of the radio-frequency signals are measured at the same time at the two ports.
    Type: Grant
    Filed: February 25, 2010
    Date of Patent: February 11, 2014
    Assignee: Siemens Aktiengesellschaft
    Inventors: Florian Poprawa, Andreas Schicht, Claus Seisenberger, Andreas Ziroff
  • Method for determining the layer thickness of a TBC coating of at least one blade of a non-positive-displacement machine, a corresponding TBC layer thickness measuring device for carrying out the method and use of the method and the TBC layer thickness measuring device
    Patent number: 8217663
    Abstract: A method determines the layer thickness of a TBC coating of at least one blade of a non-positive-displacement machine. To this end, at least one electromagnetic wave is emitted to the surface of the at least one blade, the at least one electromagnetic wave is then at least partially reflected by the at least one blade, and the reflected portion of the at least one electromagnetic wave is received and subsequently processed. In addition, the at least one electromagnetic wave is emitted with a frequency matched to the layer thickness of the TBC coating, and the phase of the at least one electromagnetic wave is compared with the phase of the at least one received electromagnetic wave. The at least one emitted electromagnetic wave undergoes a phase change during reflection and the layer thickness of the TBC coating is determined by the phase comparison.
    Type: Grant
    Filed: July 27, 2006
    Date of Patent: July 10, 2012
    Assignee: Siemens Aktiengesellschsft
    Inventors: Thomas Bosselmann, Klaus Huber, Andreas Schicht, Michael Willsch
  • Network analyzer with an n-port network having at least two ports for measuring the wave parameters of a measurement object
    Publication number: 20120032837
    Abstract: A network analyzer includes an n-port network with two ports for measuring wave parameters of a measurement object. Each port has a feed for a radio-frequency signal from a signal source. Signal components of the radio-frequency signal fed into the respective port are reflected at the measurement object and the signal components of one or more radio-frequency signals fed into at least one other port are transmitted through the measurement object to the respective port are measured as wave parameters. The two ports are supplied with different radio-frequency signals, wherein frequencies or frequency bands are offset with respect to one another by a frequency offset. Reflected and transmitted signal components of the radio-frequency signals are measured at the same time at the two ports.
    Type: Application
    Filed: February 25, 2010
    Publication date: February 9, 2012
    Inventors: Florian Poprawa, Andreas Schicht, Claus Seisenberger, Andreas Ziroff
  • Method for determining the layer thickness of a tbc coating of at least one blade of a non-positive-displacement machine, a corresponding tbc layer thickness measuring device for carrying out the method and use of the method and the tbc layer thickness measuring device
    Publication number: 20090134884
    Abstract: A method determines the layer thickness of a TBC coating of at least one blade of a non-positive-displacement machine. To this end, at least one electromagnetic wave is emitted to the surface of the at least one blade, the at least one electromagnetic wave is then at least partially reflected by the at least one blade, and the reflected portion of the at least one electromagnetic wave is received and subsequently processed. In addition, the at least one electromagnetic wave is emitted with a frequency matched to the layer thickness of the TBC coating, and the phase of the at least one electromagnetic wave is compared with the phase of the at least one received electromagnetic wave. The at least one emitted electromagnetic wave undergoes a phase change during reflection and the layer thickness of the TBC coating is determined by the phase comparison.
    Type: Application
    Filed: July 27, 2006
    Publication date: May 28, 2009
    Inventors: Thomas Bosselmann, Klaus Huber, Andreas Schicht, Michael Willsch