Patents by Inventor Andreas Schutt

Andreas Schutt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • MEASURING METHOD AND DEVICE FOR CHARACTERIZING A SEMICONDUCTOR COMPONENT
    Publication number: 20110012636
    Abstract: A measuring method for characterizing a semiconductor component (1) having at least one pn junction and a measuring surface, which is the front and/or rear of the semiconductor component and which has at least one contacting subarea, which is covered by a metallization or is intended for coverage by a metallization, The method includes the following steps: A. Planar application of electromagnetic excitation radiation onto the measuring area of the semiconductor component (1) for separating charge carrier pairs in the semiconductor component (1), and B. spatially resolved measurement of electromagnetic radiation originating from the semiconductor component (1) using at least one detection unit.
    Type: Application
    Filed: February 23, 2009
    Publication date: January 20, 2011
    Applicants: FRAUNHOFER-GESELLSCHAFT ZUR FORDERUNG DER ANGEWANDTEN FORSCHUNG E.V., CHRISTIAN-ALBRECHTS-UNIVERSITAT ZU KIEL, ALBERT-LUDWIGS-UNIVERSITAT FREIBURG
    Inventors: Jurgen Carstensen, Andreas Schutt, Helmut Foll, Wilhelm Warta, Martin Kasemann