Patents by Inventor Andreas Spang

Andreas Spang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5525903
    Abstract: A sensor arrangement and a method of acquiring properties of the surface layer (3) of a metallic target (2), which allow a nondestructive and substantially distance-independent measurement to be performed, with the requirements to be met by the sensor positioning being minimal. The sensor arrangement (1) comprises a combination of at least one eddy-current sensor (5) with at least one displacement measuring sensor (6), the depth of penetration of the eddy currents generated by the eddy-current sensor (5) corresponding to at least twice the thickness of the surface layer (3), and the displacement measuring sensor (6) serving to determine the distance of the sensor arrangement (1) from the target surface (4).
    Type: Grant
    Filed: August 18, 1994
    Date of Patent: June 11, 1996
    Assignee: Micro-Epsilon Messtechnik GmbH & Co. KG
    Inventors: Roland Mandl, Axel Seikowsky, Andreas Spang