Patents by Inventor Andreas Thaer

Andreas Thaer has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 4672012
    Abstract: A process for modifying structural profiles produced by polymerization or depolymerization in resist layers. As a function of the acoustic impedance of the substrate carrying the resist layer, the structures are irradiated with an ultrasonic beam. An ultrasonic beam for which the substrate represents a high impedance is used in order to enhance the contrast of the structures. An ultrasonic beam for which the substrate represents a low impedance is used to weaken the contrast. An acoustic microscope is especially suitable for carrying out the process.
    Type: Grant
    Filed: May 13, 1985
    Date of Patent: June 9, 1987
    Assignee: Ernst Leitz Wetzlar GmbH
    Inventors: Knut Heitmann, Martin Hoppe, Eckhard Schneider, Andreas Thaer
  • Patent number: 4612267
    Abstract: A process for the production of structures by the polymerization, or fragmentation of resist layers comprising the steps of effecting an incomplete exposure of the resist layer corresponding to the pattern of the structures, and of fully developing the structure in the resist layer by ultrasonic irradiation.An acoustic microscope is preferably used for the ultrasonic irradiation, whereby the formation of the structure in the resist layer may also be observed.
    Type: Grant
    Filed: May 13, 1985
    Date of Patent: September 16, 1986
    Assignee: Ernst Leitz Wetzlar GmbH
    Inventors: Knut Heitmann, Martin Hoppe, Eckhard Schneider, Andreas Thaer
  • Patent number: 4363536
    Abstract: Disclosed is an adjustable instrument base suitable for holding optical instruments, comprising a base plate movable along first and second horizontal coordinate directions; a housing member surrounding the base plate and being movable with respect to the base plate in the first coordinate direction; first and second mechanisms mounted on the housing member for effecting displacement of the base plate in the first and second coordinate directions, respectively; a generally U-shaped stirrup member mounted on the base plate for rotation; a support plate mounted on the stirrup member for rotation about a horizontal axis; a first and preferably second instrument carriers displaceably mounted on the support plate; and a mechanism mounted on said base plate for effecting vertical displacement of the first instrument carrier.
    Type: Grant
    Filed: July 25, 1980
    Date of Patent: December 14, 1982
    Assignee: Ernst Leitz Wetzlar GmbH
    Inventors: Andreas Thaer, Willi Hagner, Horst Frimmel, Horst Riegel
  • Patent number: 4353618
    Abstract: An optical system for the reflecting microscopic examination of objects. An illuminating beam path and an observation beam path are provided along with an optical lens such that the beam paths pass through the optical lens and make an angle with each other. The lens is made up of two portions interfacing in a plane which bisects the angle of the beam paths and is perpendicular to a plane containing the beam paths. The interface between the lens portions is at least partially opaque and serves to absorb or reflect light reflected from the lens/object interface and thereby prevents such light from obscuring light reflected from surfaces interior to the object. The optical system is particularly advantageous for the examination of biological tissue such as the endothelium layer of the cornea of the eye.
    Type: Grant
    Filed: November 6, 1979
    Date of Patent: October 12, 1982
    Assignee: Ernst Leitz Wetzlar GmbH
    Inventors: Willi Hagner, Andreas Thaer, Francis Bigar