Patents by Inventor Andrei Tkachuk

Andrei Tkachuk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8068579
    Abstract: A process to determine the porosity and/or mineral content of mineral samples with an x-ray CT system is described. Based on the direct-projection techniques that use a spatially-resolved x-ray detector to record the x-ray radiation passing through the sample, 1 micrometer or better resolution is achievable. Furthermore, by using an x-ray objective lens to magnify the x-ray image in a microscope configuration, a higher resolution of up to 50 nanometers or more is achieved with state-of-the-art technology. These x-ray CT techniques directly obtain the 3D structure of the sample with no modifications to the sample being necessary. Furthermore, fluid or gas flow experiments can often be conducted during data acquisition so that one may perform live monitoring of the physical process in 3D.
    Type: Grant
    Filed: April 9, 2009
    Date of Patent: November 29, 2011
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, Michael Feser, Andrei Tkachuk, Thomas A. Case, Frederick W. Duewer, Hauyee Chang
  • Patent number: 7813475
    Abstract: An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.
    Type: Grant
    Filed: March 11, 2009
    Date of Patent: October 12, 2010
    Assignee: Xradia, Inc.
    Inventors: Ziyu Wu, Wenbing Yun, Peiping Zhu, Yuxin Wang, Qingxi Yuan, Andrei Tkachuk, Wanxia Huang, Michael Feser
  • Patent number: 7796725
    Abstract: An x-ray imaging system uses a synchrotron radiation beam to acquire x-ray images and at least one integrated x-ray source. The system has an imaging system including sample stage controlled by linear translation stages, objective x-ray lens, and x-ray sensitive detector system, placed on a fixed optical table and a mechanical translation stage system to switch x-ray sources when synchrotron radiation beam is not available.
    Type: Grant
    Filed: March 11, 2009
    Date of Patent: September 14, 2010
    Assignee: Xradia, Inc.
    Inventors: Ziyu Wu, Wenbing Yun, Peiping Zhu, Yuxin Wang, Qingxi Yuan, Andrei Tkachuk, Wanxia Huang, Michael Feser
  • Patent number: 7443953
    Abstract: An x-ray source comprises a structured anode that has a thin top layer made of the desired target material and a thick bottom layer made of low atomic number and low density materials with good thermal properties. In one example, the anode comprises a layer of copper with an optimal thickness deposited on a layer of beryllium or diamond substrate. This structured target design allows for the use of efficient high energy electrons for generation of characteristic x-rays per unit energy deposited in the top layer and the use of the bottom layer as a thermal sink. This anode design can be applied to substantially increase the brightness of stationary, rotating anode or other electron bombardment-based sources where brightness is defined as number of x-rays per unit area and unit solid angle emitted by a source and is a key figure of merit parameter for a source.
    Type: Grant
    Filed: December 11, 2006
    Date of Patent: October 28, 2008
    Assignee: Xradia, Inc.
    Inventors: Wenbing Yun, Frederick W. Duewer, Michael Feser, Andrei Tkachuk, Srivatsan Seshadri