Patents by Inventor Andreu Vinets Alonso

Andreu Vinets Alonso has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11052691
    Abstract: Examples of the present disclosure relate to a calibration method for a printing system. The method comprises printing a diagnostic pattern representative of decap time. The diagnostic pattern comprises the firing of nozzles after an exposure to ambient air during a first predetermined time period to produce a first pattern element and the firing of nozzles after an exposure to ambient air during a second predetermined time period to produce a second pattern element. The method includes scanning the resulting diagnostic pattern with a sensor to collect decap data in a digital form, digitally analyzing the decap data, the digital analysis comprising identifying a quantitative difference between the first and second pattern elements, and modifying a servicing process of the printing system if the quantitative difference passes a predetermined threshold.
    Type: Grant
    Filed: January 8, 2018
    Date of Patent: July 6, 2021
    Assignee: Hewlett-Packard Development Company, L.P.
    Inventors: Antonio Gracia Verdugo, Aleix Fort Filgueira, Andreu Vinets Alonso
  • Publication number: 20210070078
    Abstract: Examples of the present disclosure relate to a calibration method for a printing system. The method comprises printing a diagnostic pattern representative of decap time. The diagnostic pattern comprises the firing of nozzles after an exposure to ambient air during a first predetermined time period to produce a first pattern element and the firing of nozzles after an exposure to ambient air during a second predetermined time period to produce a second pattern element. The method includes scanning the resulting diagnostic pattern with a sensor to collect decap data in a digital form, digitally analyzing the decap data, the digital analysis comprising identifying a quantitative difference between the first and second pattern elements, and modifying a servicing process of the printing system if the quantitative difference passes a predetermined threshold.
    Type: Application
    Filed: January 8, 2018
    Publication date: March 11, 2021
    Inventors: Antonio Gracia Verdugo, Aleix Fort Filgueira, Andreu Vinets Alonso