Patents by Inventor Andrew BARNUM

Andrew BARNUM has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Attachment device for personal electronic device
    Patent number: 11583059
    Abstract: An attachment device for a personal electronic device is provided in a pair of cooperating plates with a first plate, hereinafter referred to as an outer plate, of the pair of cooperating plates being affixed to the personal electronic device and a second plate, hereinafter referred to as an inner plate, of the pair of cooperating plates configured for removable adhering to the outer plate via a magnetic coupling. Accordingly, the outer plate and the inner plate are sided to enable the cooperative features of the device.
    Type: Grant
    Filed: April 1, 2020
    Date of Patent: February 21, 2023
    Inventor: Andrew Barnum
  • Method and system for generating reciprocal space map
    Patent number: 11430632
    Abstract: Reciprocal space map of specific sample locations is generated based on the sample images acquired by irradiating the sample with a charged particle beam at multiple incident angles. The incident angles are obtained by tilting the charged particle beam and/or the sample around two perpendicular axes within the sample plane. The reciprocal space map of a selected sample location is generated based on intensity of pixels corresponding to the location in the sample images.
    Type: Grant
    Filed: December 9, 2020
    Date of Patent: August 30, 2022
    Assignee: FEI Company
    Inventors: Andrew Barnum, Mark J. Williamson
  • METHOD AND SYSTEM FOR GENERATING RECIPROCAL SPACE MAP
    Publication number: 20220181117
    Abstract: Reciprocal space map of specific sample locations is generated based on the sample images acquired by irradiating the sample with a charged particle beam at multiple incident angles. The incident angles are obtained by tilting the charged particle beam and/or the sample around two perpendicular axes within the sample plane. The reciprocal space map of a selected sample location is generated based on intensity of pixels corresponding to the location in the sample images.
    Type: Application
    Filed: December 9, 2020
    Publication date: June 9, 2022
    Applicant: FEI Company
    Inventors: Andrew Barnum, Mark J. Williamson
  • ATTACHMENT DEVICE FOR PERSONAL ELECTRONIC DEVICE
    Publication number: 20200315331
    Abstract: An attachment device for a personal electronic device is provided in a pair of cooperating plates with a first plate, hereinafter referred to as an outer plate, of the pair of cooperating plates being affixed to the personal electronic device and a second plate, hereinafter referred to as an inner plate, of the pair of cooperating plates configured for removable adhering to the outer plate via a magnetic coupling. Accordingly, the outer plate and the inner plate are sided to enable the cooperative features of the device.
    Type: Application
    Filed: April 1, 2020
    Publication date: October 8, 2020
    Inventor: Andrew Barnum
  • Confocal imaging technique in a charged particle microscope
    Patent number: 10699875
    Abstract: Methods and systems for charged particle microscope confocal imaging are disclosed herein. An example method includes obtaining a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample, applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images, and forming a three-dimensional reconstruction of the sample based on the plurality of confocal images.
    Type: Grant
    Filed: November 13, 2018
    Date of Patent: June 30, 2020
    Assignee: FEI Company
    Inventors: Mark Williamson, Andrew Barnum, Dong Tang
  • CONFOCAL IMAGING TECHNIQUE IN A CHARGED PARTICLE MICROSCOP
    Publication number: 20200152420
    Abstract: Methods and systems for charged particle microscope confocal imaging are disclosed herein. An example method includes obtaining a plurality of probe images of a portion of a sample, each probe image of the plurality of probe images obtained at a different focal depth within the sample, applying a virtual aperture to each probe image of the plurality of probe images to form a respective plurality of confocal images, and forming a three-dimensional reconstruction of the sample based on the plurality of confocal images.
    Type: Application
    Filed: November 13, 2018
    Publication date: May 14, 2020
    Inventors: Mark WILLIAMSON, Andrew BARNUM, Dong TANG