Patents by Inventor Andrew Bleloch
Andrew Bleloch has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8921787Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.Type: GrantFiled: April 21, 2014Date of Patent: December 30, 2014Assignee: Mochii, Inc.Inventors: Christopher Su-Yan Own, Andrew Bleloch, William Andregg
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Publication number: 20140284475Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be adapted to generate two or more images that are substantially incoherently related to one another, store the images, and combine amplitude signals at corresponding pixels of the respective images to improve a signal-to-noise ratio. Alternatively or in addition, the transmission electron microscope may be adapted to operate the specimen holder to move the specimen in relation to the beam optics during exposure or between exposures to operate the transmission electron microscope in an incoherent mode.Type: ApplicationFiled: April 21, 2014Publication date: September 25, 2014Applicant: Mochii, Inc. (d/b/a Voxa)Inventors: Christopher Su-Yan Own, Andrew Bleloch, William Andregg
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Patent number: 8748818Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.Type: GrantFiled: February 4, 2013Date of Patent: June 10, 2014Assignee: Mochii, Inc.Inventors: Christopher Su-Yan Own, Andrew Bleloch, William Andregg
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Patent number: 8569694Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector comprising either a foil or a set of concentric elements corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may be configured to operate in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.Type: GrantFiled: October 22, 2012Date of Patent: October 29, 2013Assignee: Mochii, Inc.Inventors: Christopher Su-Yan Own, Andrew Bleloch, Paul John Dabrowski
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Patent number: 8389937Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.Type: GrantFiled: June 7, 2011Date of Patent: March 5, 2013Assignee: Mochii, Inc.Inventors: Christopher Su-Yan Own, Andrew Bleloch, William Andregg
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Patent number: 8324574Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope operates in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.Type: GrantFiled: February 10, 2011Date of Patent: December 4, 2012Assignee: Mochii, Inc.Inventors: Christopher Su-Yan Own, Andrew Bleloch, Paul John Dabrowski
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Publication number: 20110233403Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope may operate in an incoherent mode and may be used to locate a sequence of objects on a molecule.Type: ApplicationFiled: June 7, 2011Publication date: September 29, 2011Applicant: Halcyon Molecular, Inc.Inventors: Christopher Su-Yan Own, Andrew Bleloch, William Andregg
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Publication number: 20110192976Abstract: A transmission electron microscope includes an electron beam source to generate an electron beam. Beam optics are provided to converge the electron beam. An aberration corrector corrects the electron beam for at least a spherical aberration. A specimen holder is provided to hold a specimen in the path of the electron beam. A detector is used to detect the electron beam transmitted through the specimen. The transmission electron microscope operates in a dark-field mode in which a zero beam of the electron beam is not detected. The microscope may also be capable of operating in an incoherent illumination mode.Type: ApplicationFiled: February 10, 2011Publication date: August 11, 2011Applicant: Halcyon Molecular, Inc.Inventors: Christopher Su-Yan OWN, Andrew Bleloch, Paul John Dabrowski
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Patent number: 7537280Abstract: The invention concerns a bicycle saddle (1) having a seat portion (2) and a nose portion with the nose portion (9) longitudinally flexible and laterally rigid relative to the seat portion (2) wherein the degree of flexibility is adjustable.Type: GrantFiled: November 30, 2004Date of Patent: May 26, 2009Inventor: John Andrew Bleloch