Abstract: A method for controlling a number of phases that are active in a multiphase direct-current-to-direct-current (DC-to-DC) converter includes (a) filtering a current signal representing a magnitude of current processed by the multiphase DC-to-DC converter to generate a filtered signal, (b) comparing the filtered signal to a first threshold value, (c) deactivating one or more phases of the multiphase DC-to-DC converter in response to the filtered signal falling below the first threshold value, (d) comparing the current signal to a second threshold value, the second threshold value being greater than the first threshold value, and (e) activating one or more phases of the multiphase DC-to-DC converter in response to the current signal rising above the second threshold value.

Abstract: A regulated, power supply system is described using multiphase DC-DC converters with dynamic fast-turnon, slow-turnoff phase shedding, early phase turn-on, and both load-voltage and drive-transistor feedback to pulsewidth modulators to provide fast response to load transients. In an embodiment, a system master can automatically determine whether all, or only some, slave phase units are fully populated. The programmable system includes fault detection with current and voltage sensing, telemetry capability, and automatic shutdown capability. In an embodiment, these are buck-type converters with or without coupled inductors, however some of the embodiments illustrated include boost configurations.

Abstract: A coupled inductor array has length, width, and height. The coupled inductor array includes a monolithic magnetic core formed of a magnetic material having a distributed gap, and a plurality of windings embedded in the monolithic magnetic core. Each winding forms a respective winding loop of one or more turns around a respective winding axis, and each winding axis extends in the height direction. Areas of the monolithic magnetic core enclosed by the winding loops are greater than areas of the monolithic magnetic core outside of the winding loops, as seen when the coupled inductor array is viewed cross-sectionally in the height direction. One possible application of the coupled inductor array is in a multi-phase switching power converter.

Abstract: A regulated, power supply system is described using multiphase DC-DC converters with dynamic fast-turnon, slow-turnoff phase shedding, early phase turn-on, and both load-voltage and drive-transistor feedback to pulsewidth modulators to provide fast response to load transients. In an embodiment, a system master can automatically determine whether all, or only some, slave phase units are fully populated. The programmable system includes fault detection with current and voltage sensing, telemetry capability, and automatic shutdown capability. In an embodiment, these are buck-type converters with or without coupled inductors, however some of the embodiments illustrated include boost configurations.

Abstract: An interface device for a memory module comprising a plurality of DRAMs includes a memory configured to store DRAM test program instructions, and a programmable processing device coupled to the memory, wherein the programmable processing device is configured to receive input data and input memory addresses from an external processor, wherein the programmable processing device is configured to provide data and memory addresses to the plurality of DRAMs, and wherein the programmable processing device is programmed to perform operations specified by the DRAM test program instructions.

Abstract: A method for manufacturing a dynamic random access memory device is provided. The method includes fabricating a dynamic random access memory device having a plurality of memory cells. Each of the memory cells has a refresh characteristic that meets or exceeds a refresh specification provided for a DDR3 SDRAM device or a DDR4 SDRAM device. The method includes testing the dynamic random access memory device. The testing includes determining the refresh characteristic for each of the memory cells, classifying each of the memory cells as a good memory cell or a bad memory cell based upon the refresh characteristic, identifying each of the bad memory cells, and storing an address location for each of the bad memory cells. The method then includes transferring the address location for each of the bad memory cells into an address match table.

Abstract: A regulated, power supply system is described using multiphase DC-DC converters with dynamic fast-turnon, slow-turnoff phase shedding, early phase turn-on, and both load-voltage and drive-transistor feedback to pulsewidth modulators to provide fast response to load transients. In an embodiment, a system master can automatically determine whether all, or only some, slave phase units are fully populated. The programmable system includes fault detection with current and voltage sensing, telemetry capability, and automatic shutdown capability. In an embodiment, these are buck-type converters with or without coupled inductors, however some of the embodiments illustrated include boost configurations.

Abstract: An integrated circuit memory interface device coupled to a dynamic random access memory device is provided. The device includes an address match table. The address match table includes a plurality of first addresses. Each of the first addresses is associated with a memory cell having a refresh characteristic outside of a specification for a DRAM device. The device has a plurality of second addresses. Each of the second addresses is associated with a refresh characteristic within a specification of the DRAM device and outside of a predetermined refresh characteristic range characterized to eliminate accesses to memory cells not meeting the predetermined refresh characteristic range.

Abstract: A regulated, power supply system is described using multiphase DC-DC converters with dynamic fast-turnon, slow-turnoff phase shedding, early phase turn-on, and both load-voltage and drive-transistor feedback to pulsewidth modulators to provide fast response to load transients. In an embodiment, a system master can automatically determine whether all, or only some, slave phase units are fully populated. The programmable system includes fault detection with current and voltage sensing, telemetry capability, and automatic shutdown capability. In an embodiment, these are buck-type converters with or without coupled inductors, however some of the embodiments illustrated include boost configurations.

Abstract: A clock driver integrated circuit device and method is provided. The device can include a VTT regulator provided on a single integrated circuit (IC) chip. A first termination at an internal VDD/2 can be coupled to the VTT regulator. A VTT bus can be coupled to the first termination. A plurality of command control inputs can be coupled to the VTT bus. The plurality of command inputs can include A, BA, RAS, CAS, WE, CS, CKE, ODT, PARIN, and the like. A VDD termination can be coupled to a first end of the VTT bus and a ground can be coupled to a second end of the VTT bus. The method can include regulating or removing signal noise from a host controller via the clock driver IC device.

Abstract: A method of manufacturing a dynamic random access memory device is provided. The method includes testing a DRAM device using a testing process. The method includes identifying, under control by a computing device, a plurality of bad memory cells from the DRAM device and determining a list of addresses associated with the plurality of bad memory cells. The method includes sorting the list of addresses in either ascending or descending order and subjecting the information from the sorted list of address to a compression process, under control by the computing device, to provide a compressed format including a first content entry in the sorted list and a series of off-set values as provided by a recurrence relationship. The method also stores the compressed format into a non-volatile memory.

Abstract: A random access memory includes a plurality of memories configured to store and provide data, and a test module coupled to the plurality of memories, wherein the test module is configured to write a first write data pattern into at last a first portion of the plurality of memories in response to a data pattern value, wherein the test module is configured to read a read data pattern from the plurality of memories, wherein the test module is configured to compare the first write data pattern to the read data pattern, and wherein the test module is configured to report errors in response to a comparison of the write data pattern to the read data pattern.

Abstract: A regulated, power supply system is described using multiphase DC-DC converters with dynamic fast-turnon, slow-turnoff phase shedding, early phase turn-on, and both load-voltage and drive-transistor feedback to pulsewidth modulators to provide fast response to load transients. In an embodiment, a system master can automatically determine whether all, or only some, slave phase units are fully populated. The programmable system includes fault detection with current and voltage sensing, telemetry capability, and automatic shutdown capability. In an embodiment, these are buck-type converters with or without coupled inductors, however some of the embodiments illustrated include boost configurations.

Abstract: A method and apparatus for determining a setting specified from a plurality of the settings for a function provided in an integrated circuit, wherein the setting is specified by connecting an external measurement resistor to a measurement terminal of the integrated circuit, comprises applying a direct current to the measurement terminal of the integrated circuit, thereby producing a measurement voltage at the measurement terminal; applying the direct current to a reference terminal of the integrated circuit, wherein the reference terminal has an external reference resistor connected thereto, thereby producing a reference voltage at the reference terminal; quantizing a voltage level of a difference voltage representing a voltage difference between the reference voltage and the measurement voltage, thereby producing a quantized voltage; and providing control signals to a functional module within the integrated circuit, the control signals representing the one of the settings corresponding to the quantized volta

Abstract: A voltage regulator having an input terminal and an output terminal. A PMOS transistor connects the input terminal to an intermediate terminal. The PMOS transistor includes a first gate oxide layer. An LDMOS transistor connects the intermediate terminal to ground. The LDMOS transistor includes a second gate oxide layer. A controller drives the PMOS transistor and the LDMOS transistor to alternately couple the intermediate terminal between the input terminal and ground, to generate an intermediate voltage at the intermediate terminal having a rectangular waveform. A filter is disposed between the intermediate terminal and the output terminal to convert the rectangular waveform into a substantially DC voltage at the output terminal.