Patents by Inventor Andrew Choon Kait Tek

Andrew Choon Kait Tek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Contactless testing of electronic circuits
    Patent number: 11137417
    Abstract: A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.
    Type: Grant
    Filed: August 28, 2019
    Date of Patent: October 5, 2021
    Assignee: Keysight Technologies, Inc.
    Inventors: Tie Qiu, Andrew Choon Kait Tek, Huang Shaoying
  • CONTACTLESS TESTING OF ELECTRONIC CIRCUITS
    Publication number: 20200348340
    Abstract: A sensor device is provided for testing electrical connections in a DUT using contactless fault detection. The sensor device includes main traces for conducting an RF signal supplied by a signal source; at least one inductor connected to at least one of the main traces; and a slit formed between opposing conductor portions at a tip of the sensor device for sensing open circuits and/or short circuits in portions of the DUT located in a sensing region below the slit, the tip being at an end of the sensor device opposite ends of the main traces connected to the signal source. An electric field, generated by the sensor device in response to the RF signal, substantially concentrates in the slit, enhancing the sensing of the open and/or the short circuits during the contactless fault detection.
    Type: Application
    Filed: August 28, 2019
    Publication date: November 5, 2020
    Inventors: Tie Qiu, Andrew Choon Kait Tek, Huang Shaoying