Abstract: Systems and methods are described for verifying functionality of a computing device. A plurality of I/O control codes usable to configure specified actions for a device under test is received. The I/O control codes that were completed without generating an error are determined. The I/O control codes that completed without generating an error and associated binding information are recorded. The I/O control codes that completed without generating an error and associated binding information are stored in a format usable for subsequent replay of the stored I/O control codes.

Abstract: Systems and methods are described for verifying functionality of a computing device. A plurality of I/O control codes usable to configure specified actions for a device under test is received. The I/O control codes that were completed without generating an error are determined. The I/O control codes that completed without generating an error and associated binding information are recorded. The I/O control codes that completed without generating an error and associated binding information are stored in a format usable for subsequent replay of the stored I/O control codes.

Abstract: Systems and methods to conduct data-driven, system wide tests are disclosed. Instructions for testing an operating system are associated with one or more modules associated with the computing system. When a failed test is identified, a second set of instructions that accounts for the failed test is generated and executed, in order to efficiently identify and target specific issues. Results from these fully configurable testing methods can be communicated and utilized in further applications.

Abstract: Enhanced techniques for detecting programming errors in device drivers are provided. The techniques disclosed herein enable a system to measure a number of aspects of IRPs including, but not limited to, data identifying processed IRPs, data indicating concurrent IRPs, data identifying a stack location associated with a status of an IRP, and individual status values, which may indicate whether IRPs have failed, succeeded or pended. The disclosed techniques enable a system to determine when and where IRPs were sent or not sent to a stack of device objects and/or to individual device objects. The disclosed techniques enable the system to measure the processing of concurrent IRPs. By the use of filters that are positioned in predetermined locations within a stack, disclosed techniques can test and monitor drivers without imposing unduly burdensome loads on the system.

Abstract: Enhanced techniques for detecting programming errors in device drivers are provided. The techniques disclosed herein enable a system to measure a number of aspects of IRPs including, but not limited to, data identifying processed IRPs, data indicating concurrent IRPs, data identifying a stack location associated with a status of an IRP, and individual status values, which may indicate whether IRPs have failed, succeeded or pended. The disclosed techniques enable a system to determine when and where IRPs were sent or not sent to a stack of device objects and/or to individual device objects. The disclosed techniques enable the system to measure the processing of concurrent IRPs. By the use of filters that are positioned in predetermined locations within a stack, disclosed techniques can test and monitor drivers without imposing unduly burdensome loads on the system.

Abstract: Systems and methods to conduct data-driven, system wide tests are disclosed. Instructions for testing an operating system are associated with one or more modules associated with the computing system. When a failed test is identified, a second set of instructions that accounts for the failed test is generated and executed, in order to efficiently identify and target specific issues. Results from these fully configurable testing methods can be communicated and utilized in further applications.