Abstract: A system, method, and apparatus are provided for processing packets received over Controller Area Network (CAN) interface where a CAN protocol controller computes a CRC value from header and payload values in a received CAN data frame to verify frame integrity of the received CAN data frame across a physical media layer, and then stores the header and payload values and the CRC value in a memory buffer of the CAN protocol controller so that a host core can compute a reconstructed CRC value from the header and payload values retrieved from the memory buffer, and then compare the reconstructed CRC value to the CRC value retrieved from the memory buffer to verify frame integrity of the received CAN data frame at a transaction layer.

Abstract: A system, method, and apparatus are provided for processing packets received over Controller Area Network (CAN) interface where a CAN protocol controller computes a CRC value from header and payload values in a received CAN data frame to verify frame integrity of the received CAN data frame across a physical media layer, and then stores the header and payload values and the CRC value in a memory buffer of the CAN protocol controller so that a host core can compute a reconstructed CRC value from the header and payload values retrieved from the memory buffer, and then compare the reconstructed CRC value to the CRC value retrieved from the memory buffer to verify frame integrity of the received CAN data frame at a transaction layer.

Abstract: An error recovery system, method, and apparatus are provided for a microcontroller unit (100) having a plurality of components (101-109) by assigning error recovery actions to at least a first MCU component to specify a component-specific operation for returning the first MCU component to a known state to restart operation of the first MCU component from the known state, and then storing the assigned error recovery actions in a recovery lookup table (122) so that a fault collection and control unit can use a hardware state machine (121) to evaluate an error signal received from an MCU component for determining an error type and location for the MCU component which are applied to the recovery lookup table to retrieve and apply the error recovery actions to return the first MCU component to the known state without restarting all other components on the MCU.

Abstract: A method of detecting overcurrent events within at least one electronic device, and an overcurrent detection module therefor. The method comprises receiving at least one current requirement indication from at least one electronic device, determining at least one overcurrent value based at least partly on the received at least one current requirement indication, receiving at least one indication of at least one input current flow for the at least one electronic device, and determining that an overcurrent event is occurring if the indicated at least one input current flow for the at least one electronic device exceeds the determined at least one overcurrent value.

Abstract: The present invention provides a monitor, especially a wake up monitor, for monitoring an integrated circuit, the monitor comprising a first monitoring unit configured to monitor at least one input of the integrated circuit, a second monitoring unit configured to monitor at least one output of the integrated circuit, a measurement unit configured to measure the time elapsed between an event on the at least one input and a reaction to the event on the at least one output and configured to output an alert signal if the elapsed time exceeds a predetermined first time limit. The present invention furthermore discloses an integrated circuit and a method for monitoring an integrated circuit.

Abstract: An error response method for a mixed criticality system includes assigning a safety level to an application executed by a processor. Executing the application includes a transaction between the processor and a resource. The safety level is stored at the resource. The safety level and a fault indication are transmitted from the resource to a fault collection and control unit (FCCU). The fault indication is responsive to a fault from the resource. The FCCU responds to the fault indication with an action determined by the safety level.

Abstract: An error response method for a mixed criticality system includes assigning a safety level to an application executed by a processor. Executing the application includes a transaction between the processor and a resource. The safety level is stored at the resource. The safety level and a fault indication are transmitted from the resource to a fault collection and control unit (FCCU). The fault indication is responsive to a fault from the resource. The FCCU responds to the fault indication with an action determined by the safety level.

Abstract: The present invention provides a monitor, especially a wake up monitor, for monitoring an integrated circuit, the monitor comprising a first monitoring unit configured to monitor at least one input of the integrated circuit, a second monitoring unit configured to monitor at least one output of the integrated circuit, a measurement unit configured to measure the time elapsed between an event on the at least one input and a reaction to the event on the at least one output and configured to output an alert signal if the elapsed time exceeds a predetermined first time limit. The present invention furthermore discloses an integrated circuit and a method for monitoring an integrated circuit.

Abstract: A method of detecting overcurrent events within at least one electronic device, and an overcurrent detection module therefor. The method comprises receiving at least one current requirement indication from at least one electronic device, determining at least one overcurrent value based at least partly on the received at least one current requirement indication, receiving at least one indication of at least one input current flow for the at least one electronic device, and determining that an overcurrent event is occurring if the indicated at least one input current flow for the at least one electronic device exceeds the determined at least one overcurrent value.