Abstract: The invention comprises a method and apparatus for explaining credit scores, for example in connection with a credit score explanation service, in which consumers can identify the sources of information used to establish their credit score, supply their credit report and credit score information in connection with their application for credit-related products and services, such as loans, and determine the effect on their credit score and cost for credit-related products and services based upon various hypothetical changes in their credit behavior.

Abstract: A system and method of implementing a security policy, comprising the steps of providing a plurality of access policies, defining a process and connecting the access policies and the process to form a security policy.

Abstract: A multichip module (10) having one or more IC die (12-18) supports JTAG testing with a plurality of registers (20-26) within each IC die. JTAG testing requires a one cycle delay bypass mode where registers within an IC not under test are bypassed. To support bypass mode when JTAG testing the multichip module on a printed circuit board, a bypass circuit around the multichip module provides the one cycle delay. The bypass circuit monitors the test data signals to the multichip module and enters bypass mode upon detecting a predetermined sequence of logic states during the instruction sequence. Otherwise, the test data signal passes through a plurality of registers within each IC die. The detection may be performed by counting logic states or otherwise monitoring in the instruction sequence.