Abstract: A system may comprise a cathode, a target, one or more switches, and a conductive element. The cathode may be configured and arranged to generate an electron beam, and the target may be configured and arranged to emit radiation when electrons in the electron beam impact the target after being accelerated by an energy source. The one or more switches may be configured and arranged to apply either a first voltage or a second voltage from a power supply between the cathode and the target. The conductive element may be disposed between the cathode and the target so as to inhibit the electron beam generated by the cathode from reaching the target when a signal is applied to the conductive element.

Abstract: An apparatus may comprise a frame supporting at least first and second skewed radiation sources and at least first and second radiation detectors. The first and second radiation detectors may be substantially non-contiguous such that a substantial gap exists between the first and second radiation detectors that is free of any radiation detectors. Each of the first and second radiation detectors may also configured and arranged to detect radiation emitted by each of the first and second skewed radiation sources.

Abstract: A method for operating an inspection system is disclosed in which an item under inspection may be moved in a first direction relative to and at least partially between at least one radiation source and at least some radiation detectors illuminated by the at least one radiation source. The radiation source and detectors may be operated such that ray paths extending linearly between the at least one radiation source and at least some of the radiation detectors form acute angles with respect to a plane having a normal direction coinciding with the first direction that are substantially in excess of three degrees. Data accumulated by the radiation detectors may be processed to form a three-dimensional tomographic data image of at least a portion of the item under inspection.

Abstract: An imaging system that can form an image of an item under inspection using scattered radiation. A pencil beam of radiation is steered over the item under inspection and scattered radiation is detected. Regions of the item under inspection form which radiation is scattered are resolved in three dimensions using two-dimensional coordinates to which the pencil beam is steered. The third dimension is resolved using time of flight from the source. Because the inspection system can be located on one side of an item under inspection, an item may be imaged from a long distance and the imaging system may be mounted on a moving vehicle, making the imaging system well suited for use in many security inspection systems to detect explosives and other contraband items.