Andrew Hwang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
Abstract: Aspects of the invention for managing power in a single chip device may comprise, an internal finite state machine that, while in a communicating state, determines from within the single chip device whether a power management status is set and/or whether a first power management event is received. If the power management status is set, the finite state machine may transition from the communicating state to a power management event sent state. If the first power management event is received, the finite state machine may transition from the communicating state to a non-communicating state. The first power management event may be a turn off power management event. Furthermore, in instances where the power management status is set, it may be cleared, thereby causing the finite state machine to transition back to the communicating state. One or more power management control registers may be utilized for indicating power management status.
Abstract: Certain aspects of a system for controlling power for a network interface controller device may comprise a precision voltage comparator that may instantaneously detect ramp up of a main voltage corresponding to a main voltage source in order to control the network interface controller device. A power monitor may detect when a threshold voltage of the main voltage is reached during the ramp up. A main voltage source switch and an auxiliary voltage source switch may switch an output from an auxiliary voltage to the main voltage source without the switches being simultaneously on. The power monitor may determine whether the main voltage is ramping up in excess of a determined rate and if so, may decrease a rate at which the main voltage ramps up. A current limiter and/or the power monitor may monitor and limit an inrush current caused during main voltage ramp up.
July 8, 2004
March 17, 2005
Andrew Hwang, Augustine Kuo, Michael Hurt
Abstract: Aspects of the invention may be found in a method and system for testing an integrated circuit and may comprise an address selector, data selector and staging register coupled to a signal generator. The address selector may comprise a direct access memory test (DAMT) mode address control input and one or more output address pins coupled to an embedded memory device under test (DUT). The data selector may be coupled to at least one data pin and control pin of the signal generator and may comprise a DAMT mode data control input and at least one data output coupled to embedded memory DUT. A staging register comprising a first output clock rate which is one-quarter (¼) its input clock rate and matches a DUT burst write frequency may be coupled to an input of the data selector. A DAMT mode control may configure the memory DUT for DAMT operation.
September 13, 2004
March 17, 2005
Jonathan Lee, Xiaogang Zhu, Andrew Hwang