Abstract: A method of diagnosing a conducting structure includes providing the conducting structure in a magnetic field, immersing the conducting structure in a detection medium, or placing a detection medium in the vicinity of the conducting structure, exciting nuclear or electronic spins within the detection medium using a broad-band excitation pulse, receiving an NMR or ESR spectrum from the detection medium, obtaining a frequency distribution of the detection medium, and indirectly measuring internal characteristics of the conducting structure by characterizing frequency changes in the frequency distribution. Conducting structures are analyzed on the basis of changes in magnetic susceptibilities and internal electric current distributions, which may change over the course of a charging/discharging cycle, and a result of degradation and failure of the conducting structure. The conducting structure may be, for example, a battery, a capacitor, a supercapacitor, a fuel cell, or a catalyst material.

Abstract: A method of probing the layers above, at, and below the surface of a conducting region includes exciting nuclear or electronic spins within the conducting region using a first frequency, receiving a second frequency from the conducting region, determining the length scales by the conductivity of the conducting region, the first frequency, and the second frequency, obtaining a depth profile of the conducting region, and indirectly measuring the presence of the surface by characterizing signal distortions above the surface.

Abstract: A method of diagnosing a conducting structure includes providing the conducting structure in a magnetic field, immersing the conducting structure in a detection medium, or placing a detection medium in the vicinity of the conducting structure, exciting nuclear or electronic spins within the detection medium using a broad-band excitation pulse, receiving an NMR or ESR spectrum from the detection medium, obtaining a frequency distribution of the detection medium, and indirectly measuring internal characteristics of the conducting structure by characterizing frequency changes in the frequency distribution. Conducting structures are analyzed on the basis of changes in magnetic susceptibilities and internal electric current distributions, which may change over the course of a charging/discharging cycle, and a result of degradation and failure of the conducting structure. The conducting structure may be, for example, a battery, a capacitor, a supercapacitor, a fuel cell, or a catalyst material.

Abstract: A method of probing the layers above, at, and below the surface of a conducting region includes exciting nuclear or electronic spins within the conducting region using a first frequency, receiving a second frequency from the conducting region, determining the length scales by the conductivity of the conducting region, the first frequency, and the second frequency, obtaining a depth profile of the conducting region, and indirectly measuring the presence of the surface by characterizing signal distortions above the surface.