Abstract: A memory system and method for storing data in one or more storage chips includes: one or more memory cards each having a plurality of storage chips, and each chip having a plurality of dies having a plurality of memory cells; a memory controller comprising a translation module, the translation module further comprising: a logical to virtual translation table (LVT) having a plurality of entries, each entry in the LVT configured to map a logical address to a virtual block address (VBA), where the VBA corresponds to a group of the memory cells on the one or more memory cards, wherein each entry in the LVT further includes a write wear level count to track the number of writing operations to the VBA, and a read wear level count to track the number of read operations for the VBA mapped to that LVT entry.

Abstract: A method and system for collecting diagnostic data from a storage class memory chip is disclosed. The method includes performing a scrub process on at least a portion of the storage class memory by: removing the portion of the storage class memory from use, wherein the portion comprises a plurality of memory locations, executing a first write operation to write a first pattern on each of the plurality of memory locations, executing a first read operation to obtain a first set of data written on each of the plurality of memory locations, analyzing the first set of data written on each of the plurality of memory locations to determine the number of stuck-at faults in the portion, and updating one or more counters in an error rate table (ERT) to indicate the number of stuck-at faults.

Abstract: A memory system and method for storing data in one or more storage chips includes: one or more memory cards each having a plurality of storage chips, and each chip having a plurality of dies having a plurality of memory cells; a memory controller comprising a translation module, the translation module further comprising: a logical to virtual translation table (LVT) having a plurality of entries, each entry in the LVT configured to map a logical address to a virtual block address (VBA), where the VBA corresponds to a group of the memory cells on the one or more memory cards, wherein each entry in the LVT further includes a write wear level count to track the number of writing operations to the VBA, and a read wear level count to track the number of read operations for the VBA mapped to that LVT entry.

Abstract: A memory system and method for storing data in one or more storage chips is disclosed. The memory system includes one or more storage dies included in each storage chip and a controller. Each of the plurality of storage dies further comprises one or more media replacement unit (MRU) groups. The controller includes a translation module, the translation module further comprising: a chip select table (CST) configured to identify one or more valid storage chips during translation for performing a read/write operation, and a media repair table (MRT) corresponding to each of storage chips, each MRT configured to identify one or more storage dies during translation for performing a read/write operation.

Abstract: A memory system and method for storing data in one or more storage chips includes: one or more memory cards each having a plurality of storage chips, and each chip having a plurality of dies having a plurality of memory cells; a memory controller comprising a translation module, the translation module further comprising: a logical to virtual translation table (LVT) having a plurality of entries, each entry in the LVT configured to map a logical address to a virtual block address (VBA), where the VBA corresponds to a group of the memory cells on the one or more memory cards, wherein each entry in the LVT further includes a write wear level count to track the number of writing operations to the VBA, and a read wear level count to track the number of read operations for the VBA mapped to that LVT entry.

Abstract: A memory system and method for storing data in one or more storage chips is disclosed. The memory system includes one or more storage dies included in each storage chip and a controller. Each of the plurality of storage dies further comprises one or more media replacement unit (MRU) groups. The controller includes a translation module, the translation module further comprising: a chip select table (CST) configured to identify one or more valid storage chips during translation for performing a read/write operation, and a media repair table (MRT) corresponding to each of storage chips, each MRT configured to identify one or more storage dies during translation for performing a read/write operation.

Abstract: A method and system for collecting diagnostic data from a storage class memory chip is disclosed. The method includes performing a scrub process on at least a portion of the storage class memory by: removing the portion of the storage class memory from use, wherein the portion comprises a plurality of memory locations, executing a first write operation to write a first pattern on each of the plurality of memory locations, executing a first read operation to obtain a first set of data written on each of the plurality of memory locations, analyzing the first set of data written on each of the plurality of memory locations to determine the number of stuck-at faults in the portion, and updating one or more counters in an error rate table (ERT) to indicate the number of stuck-at faults.

Abstract: A method, system, and computer usable program product for local synchronization in a memory hierarchy in a multi-core data processing system are provided in the illustrative embodiments. A request to acquire a reservation for a reservation granule is received at a first core. The reservation is acquired in a first local cache associated with the first core in response to a cache line including the reservation granule being present and writable in the first local cache. A conditional store request to store at the reservation granule is received at the first core. A determination is made whether the reservation remains held at the first local cache. The store operation is performed at the first local cache responsive to reservation remaining held at the first local cache.

Abstract: A method and system for scanning data from a specific latch in a matrix array of latches. The matrix array is made up of vertical selector lines and horizontal data lines. Each latch is coupled at an intersection of a selector line and a data line by a transistor. By turning on the transistor, the contents of the latch can be selectively read or written to.

Abstract: A method and system for scanning data from a specific latch in a matrix array of latches. The matrix array is made up of vertical selector lines and horizontal data lines. Each latch is coupled at an intersection of a selector line and a data line by a transistor. By turning on the transistor, the contents of the latch can be selectively read or written to.

Abstract: A method and system for scanning data from a specific latch in a matrix array of latches. The matrix array is made up of vertical selector lines and horizontal data lines. Each latch is coupled at an intersection of a selector line and a data line by a transistor. By turning on the transistor, the contents of the latch can be selectively read or written to.

Abstract: A method and ring oscillator circuit for measuring circuit delays over a wide operating range permits improved analysis of dynamic circuits. A pulse generator circuit provides a pulse to an input of a dynamic circuit under test, which may be a pre-charge or evaluation pulse that is triggered by a transition of an output of the dynamic circuit that occurs during the state opposite that of the state commanded by the pulse. The action of the circuit provides for measuring any amount of delay to the next transition in the opposite state irrespective of the pulse width. By providing a wide-range of operation, characteristics such as leakage, charge sharing, data dependent node capacitance, previous value dependence as well as other dynamic circuit behaviors may be determined. The ring oscillator circuit includes an enable start circuit that causes a first pulse to be generated by the one-shot when the ring oscillator circuit is enabled.