Abstract: Test and measurement instrumentation collects time information independently in each clock domain using a device that monotonically changes state with the passage of time according to a local clock domain. The device under test therefore has a unique state for each synchronous time period. The instrumentation periodically samples the devices under test, collects the state of each device, and records the state of the devices in conjunction with any data collected in clock domains that are synchronous with the devices. The periodic samples are transformed into numeric values using an isomorphic or linear model. These values are then fitted to an assumed frequency model that relates the state of devices in otherwise unrelated clock domains.

Abstract: In one general aspect, a data collection system for a circuit under test implemented as an integrated circuit or using a programmable logic device is disclosed. It comprises a configurable selection network connected to debug nodes of the circuit. The selection network can be reconfigured after implementation of the circuit to route data from selectable debug nodes in the circuit under test to a controller to allow analysis of the circuit. The data collection system can further comprise a configurable data packer. A method of use of the system associates data from the debug nodes with individual debug nodes of the circuit based on a configuration of the configurable selection network or that of the configurable data packer or both. The method and system of the invention allows for efficient data collection from different sets of debug nodes without having to re-implement the circuit.

Abstract: Test and measurement instrumentation collects time information independently in each clock domain using a device that monotonically changes state with the passage of time according to a local clock domain. The device under test therefore has a unique state for each synchronous time period. The instrumentation periodically samples the devices under test, collects the state of each device, and records the state of the devices in conjunction with any data collected in clock domains that are synchronous with the devices. The periodic samples are transformed into numeric values using an isomorphic or linear model. These values are then fitted to an assumed frequency model that relates the state of devices in otherwise unrelated clock domains.

Abstract: In one general aspect, a data collection system for a circuit under test implemented as an integrated circuit or using a programmable logic device is disclosed. It comprises a configurable selection network connected to debug nodes of the circuit. The selection network can be reconfigured after implementation of the circuit to route data from selectable debug nodes in the circuit under test to a controller to allow analysis of the circuit. The data collection system can further comprise a configurable data packer. A method of use of the system associates data from the debug nodes with individual debug nodes of the circuit based on a configuration of the configurable selection network or that of the configurable data packer or both. The method and system of the invention allows for efficient data collection from different sets of debug nodes without having to re-implement the circuit.