Abstract: Magnetic resonance apparatus, e.g. for magnetic resonance imaging, is described that includes a cooler unit and one or more radio-frequency (RF) coil assemblies. A separable thermal connection is provided between the cooler unit and the one or more RF coil assemblies. This separable thermal connection allows the one or more RF coil assemblies to be detached from the cooler unit after the one or more coil assemblies have been cooled to the required operating temperature. Each RF coil assembly can then be used for magnetic resonance imaging or the like. A plurality of different RF coil assemblies may thus be cooled by a single cooler unit.

Abstract: A sample positioning stage for positioning a sample to be inspected relative to an optical inspection device, including a first generally planar body on which a sample can be carried and a second body directly coupled to the first body via at least one rigid bearing and at least one resiliently compliant bearing provided between the first and second bodies. The first and second bodies are preloaded against each other in a dimension substantially parallel to the plane of the first generally planar body via the bearings. The stage also includes a motorized drive system operable to drive the first and second bodies relative to each other in the first plane toward a demanded relative position received from a position input device, and a position sensing device on at least one of the first and second bodies, for providing a measure of the relative position of the first and second bodies.

Abstract: An optical slit comprises two blades 40,42 which define a slit between them, each blade being independently movable. This enables both the slit position and the slit width to be adjusted. The slit may be aligned with the center of a light beam by aiming the light beam at a detector, traversing at least one edge of the slit across the beam path, measuring the intensity of transmitted light at the detector for each position of the slit, and feeding back a signal which adjusts the slit position for maximum light throughput. The width on the optical slit may be selected by placing the slit in the path of the light beam and measuring the light transmitted at the detector, calculating the percentage of light transmitted for that slit width and feeding back a signal which adjusts slit width to obtain the desired amount of light throughput.

Abstract: An electron microscope 10 is adapted to enable spectroscopic analysis of a sample 16. A parabolic mirror 18 has a central aperture 20 through which the electron beam can pass. The mirror 18 focuses laser illumination from a transverse optical path 24 onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system 30. The mirror 18 is retractable (within the vacuum of the electron microscope) by a sliding arm assembly 22.

Abstract: An electron microscope 10 is adapted to enable spectroscopic analysis of a sample 16. A parabolic mirror 18 has a central aperture 20 through which the electron beam can pass. The mirror 18 focuses laser illumination from a transverse optical path 24 onto the sample, and collects Raman and/or other scattered light, passing it back to an optical system 30. The mirror 18 is retractable (within the vacuum of the electron microscope) by a sliding arm assembly 22.