Patents by Inventor Andrew Patten

Andrew Patten has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20070262814
    Abstract: A flow meter filter system (200) according to an embodiment of the invention includes a noise pass filter (203) configured to receive a first version of a flow meter signal and filter out the flow meter data from the flow meter signal to leave a noise signal, a noise quantifier (204) configured to receive the noise signal from the noise pass filter (203) and measure noise characteristics of the noise signal, a damping adjuster (205) configured to receive the noise characteristics from the noise quantifier (204) and generate a damping value based on the noise characteristics, and a filter element (206) configured to receive a second version of the flow meter signal and receive the damping value from the damping adjuster (205), with the filter element (206) being further configured to damp the second version of the flow meter signal based on the damping value in order to produce a filtered flow meter signal.
    Type: Application
    Filed: June 25, 2007
    Publication date: November 15, 2007
    Inventors: Andrew Patten, Denis Henrot, Craig McAnally, Paul Hays, Wayne Brinkman
  • Publication number: 20070186682
    Abstract: A meter electronics (20) and method for detecting a residual material in a flow meter assembly (10) are provided according to the invention. The meter electronics (20) includes a processing system (22) adapted to direct the flow meter (5) to vibrate the flow meter assembly (10) and receive a vibrational response (31) from the flow meter assembly (10). The meter electronics (20) further includes a storage system (24) configured to store flow meter parameters and data. The meter electronics (20) is further characterized by the processing system (22) being configured to compare the vibrational response (31) to a predetermined residual material threshold (30) to detect the residual material.
    Type: Application
    Filed: June 22, 2004
    Publication date: August 16, 2007
    Applicant: Micro Motion, Inc.
    Inventors: Graeme Duffill, Andrew Patten, Mark Bell
  • Publication number: 20070028663
    Abstract: A method and apparatus for validating the flow calibration factor of a Coriolis flowmeter. In accordance with a first embodiment, an improved material density is obtained by measuring material density when the temperature of the material is equal to a predetermined reference temperature. In accordance with a second embodiment, a preprogrammed data base stores density/temperature relationships. Improved density information is obtained by measuring the density and temperature of the material, applying the measured density/temperature information from the data base, and obtaining density information compensated for a predetermined reference temperature. The improved density information obtained for both embodiments is unaffected by temperature changes and is used to validate the flow calibration factor. The flow calibration factor compensation for pressure changes and changes in material composition is obtained in a similar manner.
    Type: Application
    Filed: September 29, 2003
    Publication date: February 8, 2007
    Inventors: Andrew Patten, Graeme Ollila
  • Publication number: 20060265148
    Abstract: A system for calculating a flow rate of a flow meter using multiple modes is provided according to an embodiment of the invention. The system for calculating a flow rate of a flow meter using multiple modes comprises a means for calibrating the flow meter for a number of desired modes. The system for calculating a flow rate of a flow meter using multiple modes includes a means for determining a density of a material flowing through the flow meter associated with each mode. The system for calculating a flow rate of a flow meter using multiple modes further includes a means for determining the flow rate effect on density for each desired mode. The system for calculating a flow rate of a flow meter using multiple modes a means for calculating a flow rate based on the density and flow rate effect on density values for each desired mode.
    Type: Application
    Filed: September 29, 2003
    Publication date: November 23, 2006
    Inventors: Charles Stack, Andrew Patten, Marc Buttler, Graeme Duffill
  • Publication number: 20060265168
    Abstract: A flow meter filter system (200) according to an embodiment of the invention includes a noise pass filter (203) configured to receive a first version of a flow meter signal and filter out the flow meter data from the flow meter signal to leave a noise signal, a noise quantifier (204) configured to receive the noise signal from the noise pass filter (203) and measure noise characteristics of the noise signal, a damping adjuster (205) configured to receive the noise characteristics from the noise quantifier (204) and generate a damping value based on the noise characteristics, and a filter element (206) configured to receive a second version of the flow meter signal and receive the damping value from the damping adjuster (205), with the filter element (206) being further configured to damp the second version of the flow meter signal based on the damping value in order to produce a filtered flow meter signal.
    Type: Application
    Filed: September 5, 2003
    Publication date: November 23, 2006
    Inventors: Andrew Patten, Denis Henrot, Craig McAnally, Paul Hays, Wayne Brinkman
  • Patent number: 7073896
    Abstract: A continuous inkjet device emits a stream of fluid from nozzles. Droplet break-off is stimulated by the application of external perturbing stimulus to the stream in a manner that controls the formation of satellite drops. Satellite behavior is controlled by the use of a composite perturbing signal, composed of at least two frequencies that are not harmonically related, but are related by the ratio of small integers. In one embodiment, the use of two perturbing signals with frequencies fL and fH having a ratio of M/N, where M and N are integers, and M is not a multiple of N, and N is not a multiple of M, produces a repeating drop pattern of either M or N drops at the beat frequency of the combined signal, the constituent drops in said repeating pattern have different satellite formation characteristics.
    Type: Grant
    Filed: February 25, 2004
    Date of Patent: July 11, 2006
    Assignee: Eastman Kodak Company
    Inventors: Thomas W. Steiner, Scott Andrew Patten
  • Patent number: 6832552
    Abstract: Methods and apparatus for determining the optimal adjustment of imaging systems used to prepare lithographic printing surfaces for a printing press are described. A series of test patterns are imaged while varying a particular imaging parameter. This is followed, if necessary, by processing the plate in processing line. The plate is then returned to the digital imaging system where the reflectivity of the imaged test patterns is measured using a radiation source and detector, to determine the optimal setting for the parameter.
    Type: Grant
    Filed: June 26, 2001
    Date of Patent: December 21, 2004
    Assignee: Creo Inc.
    Inventors: Scott Andrew Patten, Thomas W. Steiner, Michel Laberge
  • Publication number: 20020196473
    Abstract: Methods and apparatus for determining the optimal adjustment of imaging systems used to prepare lithographic printing surfaces for a printing press are described. A series of test patterns are imaged while varying a particular imaging parameter. This is followed, if necessary, by processing the plate in processing line. The plate is then returned to the digital imaging system where the reflectivity of the imaged test patterns is measured using a radiation source and detector, to determine the optimal setting for the parameter.
    Type: Application
    Filed: June 26, 2001
    Publication date: December 26, 2002
    Inventors: Scott Andrew Patten, Thomas W. Steiner, Michael Laberge