Patents by Inventor Andrew RITTENBACH

Andrew RITTENBACH has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ML-enabled assured microelectronics manufacturing: a technique to mitigate hardware trojan detection
    Patent number: 12198325
    Abstract: A method for assuring that integrated circuits are free of malicious circuit insertions and/or IC design modifications through mask swapping/addition is provided. The method includes a step of comparing 3D tomographic images constructed from design GDS to the 3D tomographic images constructed from in-line fab metrology data.
    Type: Grant
    Filed: April 29, 2021
    Date of Patent: January 14, 2025
    Assignee: University of Southern California
    Inventors: Ajey Poovannummoottil Jacob, John Damoulakis, Akhilesh Jaiswal, Devanand Krishna Shenoy, Andrew Rittenbach
  • OFF-AXIS LASER DETECTION
    Publication number: 20230332946
    Abstract: Systems and methods for off-axis detection of a laser source. The system may include an optical sensor configured to detect light, a focusing lens adjacent to an input of the optical sensor and configured to focus the light and an optical filter adj acent to an input of the focusing lens and configured to filter a wavelength of the light. A processor may be connected to the optical sensor and may implement disclosed methods to analyze data from the optical sensor to detect atmospheric scattering of laser light from the laser source.
    Type: Application
    Filed: December 15, 2022
    Publication date: October 19, 2023
    Inventors: Jonathan Habif, Andrew Rittenbach
  • ML-ENABLED ASSURED MICROELECTRONICS MANUFACTURING: A TECHNIQUE TO MITIGATE HARDWARE TROJAN DETECTION
    Publication number: 20210342991
    Abstract: A method for assuring that integrated circuits are free of malicious circuit insertions and/or IC design modifications through mask swapping/addition is provided. The method includes a step of comparing 3D tomographic images constructed from design GDS to the 3D tomographic images constructed from in-line fab metrology data.
    Type: Application
    Filed: April 29, 2021
    Publication date: November 4, 2021
    Inventors: Ajey Poovannummoottil JACOB, John DAMOULAKIS, Akhilesh JAISWAL, Devanand Krishna SHENOY, Andrew RITTENBACH