Abstract: Method for determining the geometry of multiple defects in a magnetizable object using a reference data record of the object, comprising determining an initial defect geometry as starting defect geometry, determining a first MFL prediction data record as starting prediction data record on the basis of the starting defect geometry, and iteratively adapting the starting defect geometry to the geometry of the real defect(s) by means of the EDP unit and by means of multiple expert routines (11) running in competition and preferably in parallel with one another.

Abstract: Method for determining the geometry of multiple defects in a magnetizable object using a reference data record of the object, comprising determining an initial defect geometry as starting defect geometry, determining a first MFL prediction data record as starting prediction data record on the basis of the starting defect geometry, and iteratively adapting the starting defect geometry to the geometry of the real defect(s) by means of the EDP unit and by means of multiple expert routines (11) running in competition and preferably in parallel with one another.

Abstract: Method for determining the geometry of one or more real, examined defects of a metallic, in particular magnetizable object, in particular a pipe or a tank, by means of at least two reference data sets of the object generated on the basis of different, non-destructive measurement methods, wherein the object is at least partially represented on or by an at least two-dimensional, preferably three-dimensional, object grid, in an EDP unit, wherein an output defect geometry, in particular on the object grid or an at least two-dimensional defect grid, is generated by inversion of at least parts of the reference data sets, in particular by at least one neural network (NN) trained for this object, a respective prediction data set for the non-destructive measurement methods used in the generation of the reference data sets is calculated on the basis of the output defect geometry by a simulation routine, a comparison of at least parts of the prediction data sets with at least parts of the reference data sets is carried

Abstract: An inspection device for examining pipelines is provided, and comprisesa sensor carrier which in operation is rollable through the pipeline. The sensor carrier has an at least essentially circular circumference in a cross section that runs transverse to an axis of rotation. The sensor carrier also has at least one sensor unit. The sensor carrier further comprises at least one stabilizing means, preferably a multitude disposed along the circumference.

Abstract: A method for determining the geometry of a metallic object, with in particular one or more real, examined defects, with a reference data set of the object generated on the basis of at least one measurement by at least one non-destructive measuring method, preferably comprising an at least partial representation of the object on or by an at least three-dimensional object grid by means of a computer unit, wherein a classification of anomaly-free areas and anomaly-affected areas of the object is performed on the basis of at least parts of the at least one reference data set, wherein an initial object grid is created, a prediction data set of the at least one non-destructive measurement method is calculated by a simulation routine using the initial object grid, at least parts of the prediction data set are compared with at least parts of the at least one reference data set, excluding the anomaly-afflicted regions, and the initial object grid is used as an object grid describing the geometry of the object as a f

Abstract: A method is provided for determining the geometry of one or more real, examined defects of a metallic and in particular magnetizable object, in particular a pipe or a tank, by means of at least two reference data sets of the object generated on the basis of different, non-destructive measuring methods.

Abstract: Method for determining the geometry of multiple defects in a magnetizable object using a reference data record of the object, comprising determining an initial defect geometry as starting defect geometry, determining a first MFL prediction data record as starting prediction data record on the basis of the starting defect geometry, and iteratively matching the starting defect geometry to the geometry of the real defect(s) by means of the EDP unit and by means of multiple expert routines (11) running in competition and preferably in parallel with one another.

Abstract: A pig, in particular an inspection or cleaning pig, for passing through an elongate pipe having a pipe wall, preferably a gas pipeline, said pig comprising at least one functional unit for cleaning the pipe and/or for gathering pipe information and comprising a plurality of magnets, and said pig having an eddy current-braking unit formed by the magnets.

Abstract: A pig, in particular an inspection or cleaning pig, for passing through an elongate pipe having a pipe wall, preferably a gas pipeline, said pig comprising at least one functional unit for cleaning the pipe and/or for gathering pipe information and comprising a plurality of magnets, and said pig having an eddy current-braking unit formed by the magnets.

Abstract: A mobile device comprising a display for displaying a plurality of icons, wherein the icons include at least one event icon that defines a specific event and at least one function icon that defines a function of the mobile device; means for manipulating the icons to allow a sequence of icons to be generated to form a block diagram that includes at least one event icon and at least one function icon, wherein the at least one event icon defines the event that causes the function associated with the at least one function icon to be performed; and means for converting the sequence of icons into a form that is executable by the mobile device.

Abstract: The present invention relates to an optical arrangement and in particular to an optical arrangement for use in electron microscopy applications. This is used for sample characterization with simultaneous measurement with the electron microscopy of the sample and measurements with an optical setup and/or using a manipulator for probing of a light source or a scanning probe device.

Abstract: A force sensor (200) and nanoidenation system (300) using such force sensor (200), wherein the force sensor (200) comprise a movable membrane (207) attached to a fixed bulk structure (210) with springs (201, 202, 203, 204) formed between the membrane (207) and bulk structure (210); the springs (201, 202, 203, 204) may be provided two on each side of a rectangular membrane(207) and each in the form of a U-shape with displacing elements (801) formed perpendicular to each open end of each U-shaped spring (800). The force sensor further comprises electrodes (206) for detecting capacitive changes between the movable membrane (207) and the electrodes (206) in order to measure a movement in relation to an applied force. The membrane (207) further comprises a probe holding structure (214) for providing a solution for interchangeable probes (211).

Abstract: In recent years there has been a growing market for more universal analysis instruments. Analysis tools such as AFM1, TEM2 and nanoindentation work in similar environments. It is therefore possible, within limits, to use the same equipment to do all of these analyses. Conducting nanoindentation experiments in a TEM has also the advantage of increased accuracy compared to the tests done today. 1 Atomic Force Microscopy 2 Transmission Electron Microscope This project is focused on design and fabrication of a capacitive force sensor for AFM and/or nanoindentation measurements in a TEM. Nanofactory Instruments, the initiator of this, project, has developed a specimen holder for TEM that can be used for nanoindentation experiments. The measurement system used today has its limitations of being to large to be mounted in a TEM and thus an improved model was desired.

Abstract: This invention relates to a measurement device for use in an electron microscope. The device comprises a sample holder, for holding a sample to be studied, and an indentation tip, being arranged in proximity of the sample holder, whereby an interaction between the sample and the tip is arranged to be measured. The measurement device comprises a force sensor being positioned in proximity with an interaction area of the sample and the tip and is arranged to directly measure a force resulting from interaction between the sample and the tip.

Abstract: This invention relates to a device for reducing the impact of undesired distortions when studying a sample in an electron microscope, wherein said sample is arranged to be mounted on a micro-positioning device, characterised in that said micro-positioning device is connected with a control device, being arranged to control said micro-positioning device so as to compensate for measurement errors due to undesired distortions.

Abstract: This invention relates to a measurement device for use in an electron microscope. The device comprises a sample holder, for holding a sample to be studied, and an indentation tip, being arranged in proximity of the sample holder, whereby an interaction between the sample and the tip is arranged to be measured. The measurement device comprises a force sensor being positioned in proximity with an interaction area of the sample and the tip and is arranged to directly measure a force resulting from interaction between the sample and the tip.

Abstract: This invention relates to a device for reducing the impact of undesired distortions when studying a sample in an electron microscope, wherein said sample is arranged to be mounted on a micro-positioning device, characterised in that said micro-positioning device is connected with a control device, being arranged to control said micro-positioning device so as to compensate for measurement errors due to undesired distortions.