Patents by Inventor Andrey V. Liyu
Andrey V. Liyu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10431419Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: GrantFiled: July 7, 2017Date of Patent: October 1, 2019Assignee: Battelle Memorial InstituteInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10256072Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.Type: GrantFiled: August 1, 2017Date of Patent: April 9, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10224175Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: March 5, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
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Publication number: 20190043690Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyses thereof.Type: ApplicationFiled: August 1, 2017Publication date: February 7, 2019Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10134572Abstract: A system includes a mass spectrometer and associated sample interfacing equipment. The sample interfacing equipment includes a platform structured to support a sample thereon, a fluid source, a high voltage source, a dispensing probe electrically coupled to the high voltage source and defining a fluid dispensing passage therethrough, a collection probe defining a collection passage therethrough, a sensing arrangement coupled to the dispensing probe, and control logic responsive to the sensing arrangement to control distance between the dispensing probe and the sample. The dispensing probe facilitates formation of one or more ionized sample analytes when dispensing the fluid through the dispensing passage proximate to the sample on the platform. The collecting probe receives at least some of the one or more ionized sample analytes to pass through the collection passage into the mass spectrometer for analysis.Type: GrantFiled: August 1, 2016Date of Patent: November 20, 2018Assignee: Battelle Memorial InstituteInventors: Julia Laskin, Son N. Nguyen, Andrey V. Liyu
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Patent number: 10109453Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: October 23, 2018Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu
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Publication number: 20180033597Abstract: A system includes a mass spectrometer and associated sample interfacing equipment. The sample interfacing equipment includes a platform structured to support a sample thereon, a fluid source, a high voltage source, a dispensing probe electrically coupled to the high voltage source and defining a fluid dispensing passage therethrough, a collection probe defining a collection passage therethrough, a sensing arrangement coupled to the dispensing probe, and control logic responsive to the sensing arrangement to control distance between the dispensing probe and the sample. The dispensing probe facilitates formation of one or more ionized sample analytes when dispensing the fluid through the dispensing passage proximate to the sample on the platform. The collecting probe receives at least some of the one or more ionized sample analytes to pass through the collection passage into the mass spectrometer for analysis.Type: ApplicationFiled: August 1, 2016Publication date: February 1, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Julia Laskin, Son N. Nguyen, Andrey V. Liyu
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Publication number: 20180025887Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: ApplicationFiled: July 7, 2017Publication date: January 25, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
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Publication number: 20160276050Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: March 18, 2016Publication date: September 22, 2016Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu
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Publication number: 20160276129Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: March 18, 2016Publication date: September 22, 2016Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
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Publication number: 20150284851Abstract: Systems and methods as well as components and techniques can exhibit stable and accurate control of a deposition process by monitoring background-corrected deposition rates of an atomic species via atomic absorption (AA) spectroscopy. The systems and methods have high sensitivity and resolution in addition to extremely effective background correction and baseline drift removal, achieved in part by basing the background correction and baseline drift removal on analysis of resonant and non-resonant AA lines. The systems and methods can result in surprisingly short warm-up times and can drastically reduce the noise coming from the instruments and the surrounding environment.Type: ApplicationFiled: April 7, 2014Publication date: October 8, 2015Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Yingge Du, Scott A. Chambers, Timothy C. Droubay, Andrey V. Liyu