Patents by Inventor Andrii SUKHARIEV

Andrii SUKHARIEV has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11846500
    Abstract: A three-dimensional depth measuring method using a structured light camera comprising a first projector, a second projector, and an optical sensor, according to the present disclosure, comprises: a step in which a first light pattern is projected by the first projector; a step in which a second light pattern is projected by the second projector; a step of filtering, by a color filter, a third light pattern in which the first light pattern and the second light pattern reflected from an object overlap, so as to separate the third light pattern into a first filtered pattern and a second filtered pattern; a step of localizing the first filtered pattern and classifying first feature points of the first filtered pattern; a step of localizing the second filtered pattern and classifying second feature points of the second filtered pattern; and a step of obtaining position information of the object on the basis of the first feature points and the second feature points.
    Type: Grant
    Filed: October 28, 2019
    Date of Patent: December 19, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kostiantyn Morozov, Oleksandr Klimenkov, Dmytro Vavdiiuk, Ivan Safonov, Andrii But, Andrii Sukhariev, Ruslan Iermolenko, Serhii Iliukhin, Yaroslav Lavrenyuk
  • Publication number: 20230254568
    Abstract: An electronic apparatus is provided. The electronic apparatus includes a camera, a memory in which a plurality of captured images obtained through the camera and a parameter value of the camera are stored, and a processor electrically connected to the camera and the memory. The processor is configured to identify a scene type corresponding to each captured image of the plurality of captured images; extract a feature point of each captured image of the plurality of captured images based on a feature point extraction method corresponding to the identified scene type of each captured image; obtain a calibration parameter value corresponding to a feature type of each extracted feature point; obtain an integrated calibration parameter value based on one or more obtained calibration parameter values; and update the parameter value stored in the memory based on the integrated calibration parameter value.
    Type: Application
    Filed: April 14, 2023
    Publication date: August 10, 2023
    Applicant: SAMSUNG ELECTRONICS CO., LTD.
    Inventors: Ruslan IERMOLENKO, Andrii SUKHARIEV, Kostiantyn MOROZOV, Iegor VDOVYCHENKO, Volodymyr SAVIN, Dmytro VAVDIIUK, Oleksandr KLIMENKOV, Oleksandr SAPOZHNIK
  • Patent number: 11610323
    Abstract: A synchronization method of a first depth sensing apparatus includes: transmitting a first optical signal to measure a distance to an object; receiving the first optical signal reflected by the object; when recognition of the received first optical signal fails, stopping transmission of the first optical signal and generating first synchronization information for synchronization with at least one second depth sensing apparatus; receiving a third optical signal for synchronization with the first depth sensing apparatus, which is transmitted by the at least one second depth sensing apparatus, and decoding the received third optical signal to extract at least one piece of second synchronization information; determining a time point at which and a cycle in which to re-transmit the first optical signal, based on the first synchronization information and the at least one piece of second synchronization information; and re-transmitting the first optical signal at the determined time point and cycle.
    Type: Grant
    Filed: July 1, 2019
    Date of Patent: March 21, 2023
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Kostiantyn Morozov, Dmytro Korba, Ruslan Iermolenko, Andrii Sukhariev, Serhii Iliukhin, Andrii But, Ivan Safonov, Yaroslav Lavrenyuk, Oleksandr Klimenkov, Dmytro Vavdiiuk
  • Publication number: 20220011096
    Abstract: A three-dimensional depth measuring method using a structured light camera comprising a first projector, a second projector, and an optical sensor, according to the present disclosure, comprises: a step in which a first light pattern is projected by the first projector; a step in which a second light pattern is projected by the second projector; a step of filtering, by a color filter, a third light pattern in which the first light pattern and the second light pattern reflected from an object overlap, so as to separate the third light pattern into a first filtered pattern and a second filtered pattern; a step of localizing the first filtered pattern and classifying first feature points of the first filtered pattern; a step of localizing the second filtered pattern and classifying second feature points of the second filtered pattern; and a step of obtaining position information of the object on the basis of the first feature points and the second feature points.
    Type: Application
    Filed: October 28, 2019
    Publication date: January 13, 2022
    Inventors: Kostiantyn MOROZOV, Oleksandr KLIMENKOV, Dmytro VAVDIIUK, Ivan SAFONOV, Andrii BUT, Andrii SUKHARIEV, Ruslan IERMOLENKO, Serhii ILIUKHIN, Yaroslav LAVRENYUK
  • Patent number: 11195290
    Abstract: An apparatus and method are provided and include an interface unit configured to receive an electrical signal based on light received from a camera; and at least one processor configured to obtain depth information of a scene based on the electrical signal received from the interface unit, wherein the at least one processor is configured to identify a recognition pattern corresponding to the light received by the camera based on the electrical signal, to obtain a total distance value between properties of a partial source pattern corresponding to a target fragment in the source pattern and properties of a partial recognition pattern corresponding to the target fragment in the recognition pattern, and to estimate depth information of the target fragment based on the obtained total distance value.
    Type: Grant
    Filed: January 15, 2020
    Date of Patent: December 7, 2021
    Inventors: Kostiantyn Morozov, Dmytro Vavdiiuk, Oleksandr Klimenkov, Andrii Sukhariev, Ivan Safonov
  • Publication number: 20210327079
    Abstract: A synchronization method of a first depth sensing apparatus includes: transmitting a first optical signal to measure a distance to an object; receiving the first optical signal reflected by the object; when recognition of the received first optical signal fails, stopping transmission of the first optical signal and generating first synchronization information for synchronization with at least one second depth sensing apparatus; receiving a third optical signal for synchronization with the first depth sensing apparatus, which is transmitted by the at least one second depth sensing apparatus, and decoding the received third optical signal to extract at least one piece of second synchronization information; determining a time point at which and a cycle in which to re-transmit the first optical signal, based on the first synchronization information and the at least one piece of second synchronization information; and re-transmitting the first optical signal at the determined time point and cycle.
    Type: Application
    Filed: July 1, 2019
    Publication date: October 21, 2021
    Inventors: Kostiantyn MOROZOV, Dmytro KORBA, Ruslan LERMOLENKO, Andrii SUKHARIEV, Serhii ILIUKHIN, Andrii BUT, Ivan SAFONOV, Yaroslav LAVRENYUK, Oleksandr KLIMENKOV, Dmytro VAVDIIUK
  • Patent number: 11094073
    Abstract: A method of calculating depth information for a three-dimensional (3D) image includes generating a pattern based on the value of at least one cell included in a two-dimensional (2D) image, projecting the pattern, capturing a reflected image of the pattern, and calculating depth information based on the reflected image of the pattern.
    Type: Grant
    Filed: October 30, 2018
    Date of Patent: August 17, 2021
    Assignee: Samsung Electronics Co., Ltd.
    Inventors: Andrii Volochniuk, Yong-Chan Keh, Jung-Kee Lee, Sung-Soon Kim, Sun-Kyung Kim, Andrii But, Andrii Sukhariev, Dmytro Vavdiyuk, Konstantin Morozov
  • Publication number: 20200234458
    Abstract: An apparatus and method for measuring a depth in a structured depth camera system including a projector and a camera for receiving light radiated by a source pattern from the projector and reflected from one or more objects in a scene is provided.
    Type: Application
    Filed: January 15, 2020
    Publication date: July 23, 2020
    Inventors: Kostiantyn MOROZOV, Dmytro VAVDIIUK, Oleksandr KLIMENKOV, Andrii SUKHARIEV, Ivan SAFONOV
  • Publication number: 20190130590
    Abstract: A method of calculating depth information for a three-dimensional (3D) image includes generating a pattern based on the value of at least one cell included in a two-dimensional (2D) image, projecting the pattern, capturing a reflected image of the pattern, and calculating depth information based on the reflected image of the pattern.
    Type: Application
    Filed: October 30, 2018
    Publication date: May 2, 2019
    Inventors: Andrii VOLOCHNIUK, Yong-Chan KEH, Jung-Kee LEE, Sung-Soon KIM, Sun-Kyung KIM, Andrii BUT, Andrii SUKHARIEV, Dmytro VAVDIYUK, Konstantin MOROZOV