Abstract: A system (IPS) and related method for image processing, in particular dark-field or phase contrast imaging to reduce motion artifacts. The system comprises an input interface (IN) for receiving a series of projection images (?) acquired by an X-ray imaging apparatus (XI) of an object (OB) for a given projection direction, the imaging apparatus (XI) configured for phase-contrast and/or dark-field imaging A phase-contrast and/or dark-field image generator (IGEN) applies an image generation algorithm to compute a first image based on the series the projection images (?). A motion artifact detector (MD) detects a motion artifact in the first image. A combiner (?) combines, if a motion artifact is so detected, a part of the first image with a part of at least one auxiliary image to obtain a combined image. The auxiliary image was previously computed by a gated application of the image generation algorithm in respect of a subset of the series of the projection images (?).

Abstract: The invention relates to a system and a method for active grating position tracking in X-ray differential phase contrast imaging and dark-field imaging. The alignment of at least one grating positioned in an X-ray imaging device is measured by illuminating a reflection area located on the grating with a light beam, and detecting a reflection pattern of the light beam reflected by the reflection area. The reflection pattern is compared with a reference pattern corresponding to an alignment optimized for X-ray differential phase contrast imaging, and the X-ray imaging device is controlled upon the comparison of the reflection pattern and the reference pattern.

Abstract: In order to improve the mechanical stability of an X-ray grating with top bridges for X-ray dark field imaging and/or X-ray phase contrast imaging, it is proposed to reduce or prevent the undesired high stress on the top bridges by a change in the manufacturing process. Specifically, it is proposed to electroplate the top bridges after the bending. In other words, the electroplating of the top bridges is performed on the bent geometry.

Abstract: Bone Trabeculae Index for X-Ray Dark-Field Radiography A method (200) and system (20) for expressing signals in a dark field X-ray image of bone (34; 44) in units of a trabecular quantity are disclosed, in which an X-ray dark field image of a bone having a trabecular network is acquired (204) at an image resolution that is not capable of resolving the trabecular network (41) of the bone. Information about the positioning of the scan bone relative to the X-ray dark field imaging apparatus used for acquisition is determined. Signals in the X-ray dark field image of the bone are converted (206) into a corresponding trabecular quantity, wherein the conversion accounts for the determined information about the positioning of the bone and depends on a plurality of generated X-ray dark field image signal normalization values, generated for a sample bone.

Abstract: The invention relates to a system and a method for active grating position tracking in X-ray differential phase contrast imaging and dark-field imaging. The alignment of at least one grating positioned in an X-ray imaging device is measured by illuminating a reflection area located on the grating with a light beam, and detecting a reflection pattern of the light beam reflected by the reflection area. The reflection pattern is compared with a reference pattern corresponding to an alignment optimized for X-ray differential phase contrast imaging, and the X-ray imaging device is controlled upon the comparison of the reflection pattern and the reference pattern.

Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface.

Abstract: Disclosed is an apparatus for X-ray dark-field and/or X-ray phase-contrast imaging The apparatus has an imaging system, which includes a first and a second X-ray optical grating and an X-ray sensitive image detector having an ordered array of X-ray sensitive pixels. When no object is present, the first grating generates a fringe pattern in an entrance plane of the second grating. The second grating is configured to generate a Moiré pattern from the fringe pattern so that the Moiré pattern has a pitch which is less than 20 times a pixel pitch of the pixels of the X-ray sensitive image detector. The imaging system further comprises a controller, which is configured to control a relative movement between the second grating and the fringe pattern to acquire a Moiré-image at each of a plurality of different relative image acquisition positions when the object is present.

Abstract: The present invention relates to an apparatus (10) for presentation of dark field information. It is described to provide (210) an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (220). A plurality of sub-regions of the region of interest are defined (230) based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived (240) for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned (250) to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region.

Abstract: The present invention relates to a system (10) for X-ray dark field, phase contrast and attenuation tomosynthesis image acquisition. The system comprises an X-ray source (20), an interferometer arrangement (30), an X-ray detector (40), a control unit (50), and an output unit. A first axis is defined extending from a centre of the X-ray source to a centre of the X-ray detector. An examination region is located between the X-ray source and the X-ray. The first axis extends through the examination region, and the examination region is configured to enable location of an objection to be examined. The interferometer arrangement is located between the X-ray source and the X-ray detector. The interferometer arrangement comprises a first grating (32) and a second grating (34). A second axis is defined that is perpendicular to a plane that is defined with respect to a centre of the first grating and/or a centre of the second grating.

Abstract: The invention relates to a control module for controlling an x-ray system (140) during the acquisition of step images for phase imaging. The control module comprises a step image quantity providing unit (111) for providing a step image quantity, a detector dose providing unit (112) for providing a target detector dose, an applied detector dose determination unit (113) for determining an applied detector dose absorbed by a part of the detector (144) during the acquisition of a step image, and a step image acquisition control unit (114) for controlling the x-ray imaging system (140) during the acquisition of each step image based on the applied detector dose, the target detector dose and the step image quantity. The control module allows to control the x-ray imaging system such that the target detector dose is not exceeded while at the same time ensuring a sufficient quality of the step images.

Abstract: The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10??) with less scanning motions.

Abstract: A component (XS) for an X-ray detector device (XD), comprising a layer (SL) tessellated in a plurality of different regions (Rj), the regions having respective periodic structures at a respective phase, wherein two neighboring regions have periodic structures at different phases.

Abstract: The present invention relates to an apparatus (10) for generating X-ray imaging data. It is described to position (210) a first grating between an X-ray source and a second grating. The second grating is positioned (220) between the first grating and a third grating. A third grating is positioned (230) between the second grating and an X-ray detector. An object is positioned (240) between the first grating and the third grating. At least one of the three gratings has a pitch attribute of having a constant grating pitch. At least one of the three gratings has a pitch attribute of having a varying grating pitch. Both gratings of an adjacent pair of gratings are bent such that a distance between the two adjacent gratings is constant as a function of fan angle. Both gratings of the adjacent pair of gratings that are bent have the same pitch attribute. An X-ray detector detects (250) at least some of the X-rays transmitted by the three gratings and the object.

Abstract: The invention relates to beam hardening correction in X-ray Dark-Field imaging of a subject including a first material and a second material, the first and second material having different beam hardening properties. As the X-ray imaging data includes information on the internal structure of the imaged subject, such information may be used, together with appropriate calibration data to identify the beam hardening contributions occurring in the imaged area of the subject, so to allow for a correction of artifacts due to beam hardening in X-ray Dark-Field imaging.

Abstract: The present invention relates to grating based Dark-Field and/or phase-contrast X-ray imaging. In order to improve the quality of an image, a radiography system (10) for grating based Dark-Field and/or phase-contrast X-ray imaging for imaging a patient by irradiating the patient is provided. The system comprises a source unit (12), a detection unit (14) and a patient support unit (16) with a patient abutting surface (18). The source unit (12) and the detection unit (14) are arranged along an optical axis (13) and the patient support unit (16) is arranged in between. Further, an abutting distance (dA) between the source unit (12) and the patient abutting surface (18) along the optical axis (13) is adaptable. The abutting distance (dA) and an actual sensitivity, based on the abutting distance (dA), are taken into account for imaging, such that a trade-off between sensitivity and field of view in a patient specific manner is achievable, e.g. the best trade-off.

Abstract: An image processing system and related method. The system comprises an input interface (IN) for receiving dark-field image data obtained from imaging of an object (OB) with an X-ray imaging apparatus (XI). A corrector module (CM) of the system (IPS) is configured to perform a correction operation to correct said dark-field image data for Compton scatter to obtain Compton-Scatter corrected image data. The so Compton scatter corrected image data is output by an output interface (OUT) of the system.

Abstract: A component (XS) for an X-ray detector device (XD), comprising a layer (SL) tessellated in a plurality of different regions (Rj), the regions having respective periodic structures at a respective phase, wherein two neighboring regions have periodic structures at different phases.

Abstract: The present invention relates to an apparatus (10) for presentation of dark field information. It is described to provide (210) an X-ray attenuation image of a region of interest of an object. A dark field X-ray image of the region of interest of the object is also provided (220). A plurality of sub-regions of the region of interest are defined (230) based on the X-ray attenuation image of the region of interest or based on the dark field X-ray image of the region of interest. At least one quantitative value is derived (240) for each of the plurality of sub-regions, wherein the at least one quantitative value for a sub-region comprises data derived from the X-ray attenuation image of the sub-region and data derived from the dark field X-ray image of the sub-region. A plurality of figures of merit are assigned (250) to the plurality of sub-regions, wherein a figure of merit for a sub-region is based on the at least one quantitative value for the sub-region.

Abstract: The present invention relates to a device for anodized oxidation of an anode element for a curved X-ray grating, the device (10) comprising: an anode element (12); a cathode element (14); an electrolytic medium (16); a conductor element (18); and a carrier element (20); wherein the anode element (12) comprises a first side (11) and a second side (13), wherein the second side (13) faces opposite to the first side (11); wherein the carrier element (20) comprises a curved surface section (21) that extends along a curvature around a center of curvature (30); wherein the carrier element (20) is configured to receive the second side (13) of the anode element (12) for attaching the conductor element (18) to the first side (11) of the anode element (12); wherein the curved surface section (21) is configured to receive the conductor element (18) after detaching the second side (13) of the anode element (12) from the carrier element (20); wherein the electrolytic medium (16) is configured to connect the anode element (

Abstract: The present invention relates to a method, and a corresponding device, for testing a radius of curvature and/or for detecting inhomogeneities of a curved X-ray grating for a grating-based X-ray imaging device. The method comprises generating a beam of light diverging from a source point, propagating along a main optical axis and having a line-shaped beam profile. The method comprises reflecting the beam off a concave reflective surface of the grating. A principal axis of the concave reflective surface coincides with the main optical axis and the source point is at a predetermined distance from a point where the main optical axis intersects the concave reflective surface.