Abstract: An antibacterial and deodorizing leather includes a leather body and an antibacterial and deodorizing layer. The antibacterial and deodorizing layer includes a water-based foaming material and an antibacterial deodorant. The water-based foaming material and the antibacterial deodorant are mixed and arranged on the leather body and then bonded with the leather body by hot pressing. By uniformly mixing the antibacterial deodorant and a bactericide through the water-based foaming material to become gelatinous, the antibacterial and deodorizing layer is arranged on the leather body according to the size of the leather body. Then, the antibacterial and deodorizing layer is tightly bonded with the leather body by hot pressing, achieving the effects of saving costs, simplifying the manufacturing process, and environmental protection.

Abstract: An antibacterial and deodorizing leather includes a leather body and an antibacterial and deodorizing layer. The antibacterial and deodorizing layer includes a water-based foaming material and an antibacterial deodorant. The water-based foaming material and the antibacterial deodorant are mixed and arranged on the leather body and then bonded with the leather body by hot pressing. By uniformly mixing the antibacterial deodorant and a bactericide through the water-based foaming material to become gelatinous, the antibacterial and deodorizing layer is arranged on the leather body according to the size of the leather body. Then, the antibacterial and deodorizing layer is tightly bonded with the leather body by hot pressing, achieving the effects of saving costs, simplifying the manufacturing process, and environmental protection.

Abstract: Described herein are an apparatus, system, and method for providing a vertical optical coupler (VOC) for planar photonics circuits such as photonics circuits fabricated on silicon-on-insulator (SOI) wafers. In one embodiment, the VOC comprises a waveguide made from a material having refractive index in a range of 1.45 to 3.45, the waveguide comprising: a first end configured to reflect light nearly vertical by total internal reflection between the waveguide and another medium, a second end to receive the light for reflection, and a third end to output the reflected light. The VOC couples with a Si waveguide having a first region including: a first end to receive light; and an inverted tapered end in the direction of light propagation to output the received light, wherein the inverted tapered end of the Si waveguide is positioned inside the waveguide.

Abstract: Described herein are an apparatus, system, and method for providing a vertical optical coupler (VOC) for planar photonics circuits such as photonics circuits fabricated on silicon-on-insulator (SOI) wafers. In one embodiment, the VOC comprises a waveguide made from a material having refractive index in a range of 1.45 to 3.45, the waveguide comprising: a first end configured to reflect light nearly vertical by total internal reflection between the waveguide and another medium, a second end to receive the light for reflection, and a third end to output the reflected light. The VOC couples with a Si waveguide having a first region including: a first end to receive light; and an inverted tapered end in the direction of light propagation to output the received light, wherein the inverted tapered end of the Si waveguide is positioned inside the waveguide.

Abstract: Instead of monitoring the optical power coming out of a waveguide, a direct method of monitoring the optical power inside the waveguide without affecting device or system performance is provided. A waveguide comprises a p-i-n structure which induces a TPA-generated current and may be enhanced with reverse biasing the diode. The TPA current may be measured directly by probing metal contacts provided on the top surface of the waveguide, and may enable wafer-level testing. The p-i-n structures may be implemented at desired points throughout an integrated network, and thus allows probing of different devices for in-situ power monitor and failure analysis.

Abstract: Instead of monitoring the optical power coming out of a waveguide, a direct method of monitoring the optical power inside the waveguide without affecting device or system performance is provided. A waveguide comprises a p-i-n structure which induces a TPA-generated current and may be enhanced with reverse biasing the diode. The TPA current may be measured directly by probing metal contacts provided on the top surface of the waveguide, and may enable wafer-level testing. The p-i-n structures may be implemented at desired points throughout an integrated network, and thus allows probing of different devices for in-situ power monitor and failure analysis.