Patents by Inventor Angelika Hoffmann

Angelika Hoffmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7947502
    Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
    Type: Grant
    Filed: March 23, 2010
    Date of Patent: May 24, 2011
    Assignees: Sigma-Aldrich GmbH, BAM Bundesanstalt für Materialforschung und-prüefung
    Inventors: Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schönenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack
  • Publication number: 20100219333
    Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
    Type: Application
    Filed: March 23, 2010
    Publication date: September 2, 2010
    Applicants: BAM Bundesanstalf Fur Materialforschung und-prufung, Fluka GmbH
    Inventors: Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schönenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack
  • Patent number: 7713741
    Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
    Type: Grant
    Filed: September 9, 2005
    Date of Patent: May 11, 2010
    Assignees: BAM Bundesanstalf fur Materialforschung und - prufung, Fluka GmbH
    Inventors: Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schönenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack
  • Publication number: 20060214112
    Abstract: The invention is directed to a method and a kit for calibrating a photoluminescence measurement system, in particular a fluorescence measurement system. The kit includes a number of fluorescence standards i and their corrected and certified fluorescence spectra Ii(?), whereby the fluorescence standards i are selected, so that their spectrally corrected fluorescence spectra Ii(?) cover a broad spectral range with high intensity. The standards are characterized by large half-widths FWHMi of their bands of at least 1400 cm?1. According to the method of the invention, partial correction functions Fi(?) are generated by forming the quotient of the measured fluorescence spectra Ji(?) and the corresponding corrected fluorescence spectra Ii(?), which are then combined to form a total correction function F(?) for a broad spectral range.
    Type: Application
    Filed: September 9, 2005
    Publication date: September 28, 2006
    Applicants: BAM Bundesanstalt Fuer Materialforschung und - pruefung, Fluka GmbH
    Inventors: Ute Resch-Genger, Dietmar Pfeifer, Christian Monte, Angelika Hoffmann, Pierre Nording, Bernhard Schoenenberger, Katrin Hoffmann, Monika Spieles, Knut Rurack