Abstract: A crosspoint switch including a switch matrix modules and programming features. A switch matrix modules include input lines tied to inputs of the switch through precompensation networks. The programming features include user initialization states and reduced and grouping command configuration operations.

Abstract: A crosspoint switch including a switch matrix modules and programming features. A switch matrix modules include input lines tied to inputs of the switch through precompensation networks. The programming features include user initialization states and reduced and grouping command configuration operations.

Abstract: A crosspoint switch including a switch matrix modules and programming features. A switch matrix modules include input lines tied to inputs of the switch through precompensation networks. The programming features include user initialization states and reduced and grouping command configuration operations.

Abstract: A microprocessor controlled data recovery unit with an adjustable sampling and signal comparison level. The data recovery unit includes a data channel and a monitor channel. The monitor channel samples an incoming data stream in a varying manner. The results of the sampling in the monitor channel are used to adjust the sampling and comparing of the signal in the data channel. The data recovery unit includes a PLL based clock recovery unit in one embodiment, and in another embodiment the clock signal is derived by the microprocessor.

Abstract: An incandescent bulb having a looped filament within an evacuated bulb containing a gas mixture including a halogen employs magnetic means external to the bulb to provide inductive heating of the filament so that there are no connections passing through the bulb envelope. Alternative embodiments include a toroidal bulb wherein a second arm of a magnetic circuit passes normally through the center of the bulb toroid, alternating voltage excitation being supplied to a first arm of the magnetic circuit; and an elliptical bulb that is disposed between oppositely facing ends of a two-part second magnetic arm that is similarly excited. In a further embodiment, an additional arm of the magnetic circuit serves to form a non-uniform field in the vicinity of the filament, thereby to provide a lift force against the force of gravity so as to minimize filament sagging.

Abstract: A wafer probe comprises a support member having an end region which is shaped to permit the end region to be brought into close proximity with a component under test. An amplifier is mounted on the support member at its end region. A conductive probe element is attached to the amplifier and is electrically connected to the amplifier's input terminal. A transmission line is connected to the amplifier's output terminal for transmitting signals from the amplifier to a measurement instrument.