Patents by Inventor Anil Sama

Anil Sama has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and apparatus for improving data failure rate testing for memory arrays
    Patent number: 5416782
    Abstract: A circuit for testing the data failure rate of a flash memory array comprising apparatus for writing a test pattern to a memory array; and apparatus positioned in a data path prior to the interface between the memory array and circuitry external to the memory array for detecting differences in data read from the memory array and the test pattern written to the memory array, the last mentioned apparatus including apparatus for reading data from the memory array, apparatus for comparing the value of data read from the memory array with the value of data written to the array in the test pattern, and apparatus for storing a indication that a comparison has produced a result indicating a failure to compare.
    Type: Grant
    Filed: October 30, 1992
    Date of Patent: May 16, 1995
    Assignee: Intel Corporation
    Inventors: Steven E. Wells, Anil Sama