Patents by Inventor Anindya Saha
Anindya Saha has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Patent number: 8812569Abstract: A method for implementing a digital filter is provided. The method includes (a) determining a bit-width of an incoming data sample of an incoming signal by measuring a distance between a leading zero or one of the incoming data sample and a trailing zero of the incoming data sample. The incoming data sample is obtained by sampling the incoming signal at a pre-defined time interval, (b) obtaining bit-width multipliers with variable bit-widths based on a first probability distribution function (PDF) of bit-widths of incoming data samples, (c) allocating the incoming data sample and a filter coefficient based on the bit-width of the incoming data sample and a bit-width of the filter coefficient to one bit-width multiplier of the bit-width multipliers, and (d) performing a multiply operation of a Multiply and Accumulate (MAC) operation on the one bit-width multiplier to generate an output of the digital filter.Type: GrantFiled: May 2, 2012Date of Patent: August 19, 2014Assignee: Saankhya Labs Private LimitedInventors: Parag Naik, Anindya Saha, Gururaj Padaki, Subrahmanya Kondageri Shankaraiah, Saurabh Mishra
-
Patent number: 8788549Abstract: A system for computing a block floating point scaling factor by detecting a dynamic range of an input signal in a central processing unit without additional overhead cycles is provided. The system includes a dynamic range monitoring unit that detects the dynamic range of the input signal by snooping outgoing write data and incoming memory read data of the input signal. The dynamic range monitoring unit includes a running maximum count unit that stores a least value of a count of leading zeros and leading ones, and a running minimum count that stores a least value of the count of trailing zeros. The dynamic range is detected based on the least value of the count of leading zeros and leading ones and the count of trailing zeros. The system further includes a scaling factor computation module that computes the block floating point (BFP) scaling factor based on the dynamic range.Type: GrantFiled: May 2, 2012Date of Patent: July 22, 2014Assignee: Saankhya Labs Private LimitedInventors: Gururaj Padaki, Anindya Saha, Parag Naik, Vishwakumara Kayargadde, Sunil Hr
-
Patent number: 8571119Abstract: A Software Defined Radio (SDR) subsystem capable of supporting a multiple communication standards and platforms for modulation, demodulation and trans-modulation of an input signal is provided. The SDR subsystem includes a Signal Conditioning Cluster (SCC) unit that includes a signal conditioning CPU adapted for sample based signal processing, a Signal Processing Cluster (SPC) unit that includes a signal processing CPU adapted for block based signal processing, and a Channel Codec Cluster (CCC) unit that performs a channel encoding or a channel decoding operation.Type: GrantFiled: March 30, 2012Date of Patent: October 29, 2013Assignee: Saankhya Labs Pvt. LtdInventors: Parag Naik, Anindya Saha, Hemant Mallapur, Sunil Hr, Gururaj Padaki
-
Patent number: 8447961Abstract: A system to implement a zero overhead software pipelined (SFP) loop includes a Very Long Instruction Word (VLIW) processor having an N number of execution slots. The VLIW processor executes a plurality of instructions in parallel without any limitation of an instruction buffer size. A program memory receives a Program Memory address to fetch an instruction packet. The program memory is closely coupled with the instruction buffer size to implement the zero overhead software pipelined (SFP) loop. The size of the zero overhead software pipelined (SFP) loop can exceed the instruction buffer size. A CPU control register includes a block count and an iteration count. The block count is loaded into a block counter and counts the plurality of instructions executed in the SFP loop, and the iteration count is loaded into an iteration counter and counts a number of iterations of the SFP loop based on the block count.Type: GrantFiled: February 18, 2010Date of Patent: May 21, 2013Assignee: Saankhya Labs Pvt LtdInventors: Anindya Saha, Manish Kumar, Hemant Mallapur, Santhosh Billava, Viji Rajangam
-
Publication number: 20120284464Abstract: A system for computing a block floating point scaling factor by detecting a dynamic range of an input signal in a central processing unit without additional overhead cycles is provided. The system includes a dynamic range monitoring unit that detects the dynamic range of the input signal by snooping outgoing write data and incoming memory read data of the input signal. The dynamic range monitoring unit includes a running maximum count unit that stores a least value of a count of leading zeros and leading ones, and a running minimum count that stores a least value of the count of trailing zeros. The dynamic range is detected based on the least value of the count of leading zeros and leading ones and the count of trailing zeros. The system further includes a scaling factor computation module that computes the block floating point (BFP) scaling factor based on the dynamic range.Type: ApplicationFiled: May 2, 2012Publication date: November 8, 2012Applicant: SAANKHYA LABS PRIVATE LIMITEDInventors: Gururaj PADAKI, Anindya SAHA, Parag NAIK, Vishwakumara KAYARGADDE, Sunil Hosur Ramesh
-
Publication number: 20120284318Abstract: A method for implementing a digital filter is provided. The method includes (a) determining a bit-width of an incoming data sample of an incoming signal by measuring a distance between a leading zero or one of the incoming data sample and a trailing zero of the incoming data sample. The incoming data sample is obtained by sampling the incoming signal at a pre-defined time interval, (b) obtaining bit-width multipliers with variable bit-widths based on a first probability distribution function (PDF) of bit-widths of incoming data samples, (c) allocating the incoming data sample and a filter coefficient based on the bit-width of the incoming data sample and a bit-width of the filter coefficient to one bit-width multiplier of the bit-width multipliers, and (d) performing a multiply operation of a Multiply and Accumulate (MAC) operation on the one bit-width multiplier to generate an output of the digital filter.Type: ApplicationFiled: May 2, 2012Publication date: November 8, 2012Applicant: SAANKHYA LABS PRIVATE LIMITEDInventors: Parag NAIK, Anindya SAHA, Gururaj PADAKI, Subrahmanya Kondageri SHANKARAIAH, Saurabh MISHRA
-
Publication number: 20120284487Abstract: A vector slot processor that is capable of supporting multiple signal processing operations for multiple demodulation standards is provided. The vector slot processor includes a plurality of micro execution slot (MES) that performs the multiple signal processing operations on the high speed streaming inputs. Each of the MES includes one or more n-way signal registers that receive the high speed streaming inputs, one or more n-way coefficient registers that store filter coefficients for the multiple signal processing, and one or more n-way Multiply and Accumulate (MAC) units that receive the high speed streaming inputs from the one or more n-way signal registers and filter coefficients from one or more n-way coefficient registers. The one or more n-way MAC units perform a vertical MAC operation and a horizontal multiply and add operation on the high speed streaming inputs.Type: ApplicationFiled: May 2, 2012Publication date: November 8, 2012Applicant: Saankhya Labs Private LimitedInventors: Anindya SAHA, Gururaj PADAKI, Santosh BILLAVA, Rakesh A. JOSHI
-
Publication number: 20120249888Abstract: A Software Defined Radio (SDR) subsystem capable of supporting a multiple communication standards and platforms for modulation, demodulation and trans-modulation of an input signal is provided. The SDR subsystem includes a Signal Conditioning Cluster (SCC) unit that includes a signal conditioning CPU adapted for sample based signal processing, a Signal Processing Cluster (SPC) unit that includes a signal processing CPU adapted for block based signal processing, and a Channel Codec Cluster (CCC) unit that performs a channel encoding or a channel decoding operation.Type: ApplicationFiled: March 30, 2012Publication date: October 4, 2012Applicant: SAANKHYA LABS PRIVATE LIMITEDInventors: Parag NAIK, Anindya SAHA, Hemant MALLAPUR, Sunil HR, Gururaj PADAKI
-
Patent number: 8255780Abstract: An application specific processor to implement a Viterbi decode algorithm for channel decoding functions of received symbols. The Viterbi decode algorithm is at least one of a Bit Serial decode algorithm, and block based decode algorithm. The application specific processor includes a Load-Store, Logical and De-puncturing (LLD) slot that performs a Load-Store function, a Logical function, a De-puncturing function, and a Trace-back Address generation function, a Branch Metric Compute (BMU) slot that performs Radix-2 branch metric computations, Radix-4 branch metric computations, and Squared Euclidean Branch Metric computations, and an Add-Compare-Select (ACS) slot that performs Radix-2 Path metric computations, Radix-4 Path metric computations, best state computations, and a decision bit generation. The LLD slot, the BMU slot and the ACS slot perform in a software pipelined manner to enable high speed Viterbi decoding functions.Type: GrantFiled: February 18, 2010Date of Patent: August 28, 2012Assignee: Saankhya Labs Pvt Ltd.Inventors: Anindya Saha, Hemant Mallapur, Santhosh Billava, Smitha Banavikal Math Veerabhadresh
-
Publication number: 20100211858Abstract: An application specific processor to implement a Viterbi decode algorithm for channel decoding functions of received symbols. The Viterbi decode algorithm is at least one of a Bit Serial decode algorithm, and block based decode algorithm. The application specific processor includes a Load-Store, Logical and De-puncturing (LLD) slot that performs a Load-Store function, a Logical function, a De-puncturing function, and a Trace-back Address generation function, a Branch Metric Compute (BMU) slot that performs a Radix-2 branch metric computations, a Radix-4 branch metric computations, and Squared Euclidean Branch Metric computations, and an Add-Compare-Select (ACS) slot that performs a Radix-2 Path metric computations, a Radix-4 Path metric computations, a best state computations, and a decision bit generation. The LLD slot, the BMU slot and the ACS slot perform in a software pipelined manner to enable high speed Viterbi decoding functions.Type: ApplicationFiled: February 18, 2010Publication date: August 19, 2010Applicant: SAANKHYA LABS PVT LTDInventors: Anindya Saha, Hemant Mallapur, Santhosh Billava, Smitha Bmv
-
Publication number: 20100211762Abstract: A system to implement a zero overhead software pipelined (SFP) loop includes a Very Long Instruction Word (VLIW) processor having an N number of execution slots. The VLIW processor executes a plurality of instructions in parallel without any limitation of an instruction buffer size. A program memory receives a Program Memory address to fetch an instruction packet. The program memory is closely coupled with the instruction buffer size to implement the zero overhead software pipelined (SFP) loop. The size of the zero overhead software pipelined (SFP) loop can exceed the instruction buffer size. A CPU control register includes a block count and an iteration count. The block count is loaded into a block counter and counts the plurality of instructions executed in the SFP loop, and the iteration count is loaded into an iteration counter and counts a number of iterations of the SFP loop based on the block count.Type: ApplicationFiled: February 18, 2010Publication date: August 19, 2010Applicant: SAANKHYA LABS PVT LTDInventors: Anindya Saha, Manish Kumar, Hemant Mallapur, Santhosh Billava, Viji Rajangam
-
Patent number: 7423475Abstract: A characteristic is measured on multiple portions of an integrated circuit, and the supply voltage adjusted based on the measurements. In an embodiment, the characteristic corresponds to propagation delay which indicates whether the integrated circuit is implemented with a strong, weak or nominal process corner. In general, the supply voltage can be increased in the case of a weak process corner and decreased in the case of a strong process corner.Type: GrantFiled: August 9, 2004Date of Patent: September 9, 2008Assignee: Texas Instruments IncorporatedInventors: Anindya Saha, Vivek Gorakhnath Pawar, Sudheer Prasad, Anmol Sharma, Suresh R. Puthucode
-
Patent number: 7213184Abstract: Testing of modules (such as Intellectual property (IP) cores) in integrated circuits (such as system on a chip units (SOCs)) in situations when different modules operate with different characteristics of a control signal. In an embodiment, another module (“subsystem module”) may be implemented to be tested with any of a multiple characteristics of a control signal, and a register which is programmable to generate a derived control signal of a desired characteristic from an original control signal, is provided. The derived control signal is provided to test the subsystem module. According to an aspect of the invention the desired characteristic may be determined, for example, to test a path between the two modules at the same speed as at which the path would be operated in a functional mode.Type: GrantFiled: July 12, 2004Date of Patent: May 1, 2007Assignee: Texas Instruments IncorporatedInventors: Nikila Krishnamoorthy, Anindya Saha, Rubin Ajit Parekhji
-
Patent number: 7200690Abstract: Enhancing the throughput rate of a memory access system by using store and forward buffers (SFB) in combination with a DMA engine. According to an aspect of the present invention, the worst case throughput rate (without use of SFBs) is computed, and maximization factor equaling a desired throughput rate divided by the worst case throughput rate is computed. A number of SFBs is determined as equaling one less than the maximization factor. By placing the SFBs at appropriate locations in the data transfer path, the desired throughput rate may be attained when transferring large volumes of data.Type: GrantFiled: April 22, 2004Date of Patent: April 3, 2007Assignee: Texas Instruments IncorporatedInventors: Rakshit Singhal, Anindya Saha
-
Patent number: 7134061Abstract: A scan test circuitry design imbedded on an SoC having the scan architecture of a VLCT platform is disclosed herein. This BIST circuitry design that is not limited in the number of scan test ports supported includes at least one scan chain group having a corresponding clock domain that couples to receive test stimulus data. Each scan chain group has a corresponding test mode signal to shift the test stimulus data at a shift clock rate derived from its corresponding clock domain. A controlling demultiplexer connects to each multiplexer unit within each scan chain group to provide control signals for shifting in the test stimulus. A clock control mechanism provides a control signal for each scan chain to shift test stimulus and capture resultant data. Furthermore, when a simultaneous test mode signal is enabled, the clock control mechanism couples to each scan chain to enable simultaneous capture of each scan chain group.Type: GrantFiled: December 9, 2003Date of Patent: November 7, 2006Assignee: Texas Instruments IncorporatedInventors: Anupama Aniruddha Agashe, Nikila Krishnamoorthy, Anindya Saha, Rubin A. Parekhji
-
Publication number: 20050091562Abstract: Testing of modules (such as Intellectual property (IP) cores) in integrated circuits (such as system on a chip units (SOCs)) in situations when different modules operate with different characteristics of a control signal. In an embodiment, another module (“subsystem module”) may be implemented to be tested with any of a multiple characteristics of a control signal, and a register which is programmable to generate a derived control signal of a desired characteristic from an original control signal, is provided. The derived control signal is provided to test the subsystem module. According to an aspect of the invention the desired characteristic may be determined, for example, to test a path between the two modules at the same speed as at which the path would be operated in a functional mode.Type: ApplicationFiled: July 12, 2004Publication date: April 28, 2005Applicant: TEXAS INSTRUMENTS INCORPORATEDInventors: Nikila KRISHNAMOORTHY, Anindya SAHA, Rubin PAREKHJI
-
Publication number: 20050057230Abstract: A characteristic is measured on multiple portions of an integrated circuit, and the supply voltage adjusted based on the measurements. In an embodiment, the characteristic corresponds to propagation delay which indicates whether the integrated circuit is implemented with a strong, weak or nominal process corner. In general, the supply voltage can be increased in the case of a weak process corner and decreased in the case of a strong process corner.Type: ApplicationFiled: August 9, 2004Publication date: March 17, 2005Applicant: TEXAS INSTRUMENTS INCORPORATEDInventors: Anindya SAHA, Vivek PAWAR, Sudheer PRASAD, Anmol SHARMA, Suresh PUTHUCODE
-
Publication number: 20040213054Abstract: Enhancing the throughput rate of a memory access system by using store and forward buffers (SFB) in combination with a DMA engine. According to an aspect of the present invention, the worst case throughput rate (without use of SFBs) is computed, and maximization factor equaling a desired throughput rate divided by the worst case throughput rate is computed. A number of SFBs is determined as equaling one less than the maximization factor. By placing the SFBs at appropriate locations in the data transfer path, the desired throughput rate may be attained when transferring large volumes of data.Type: ApplicationFiled: April 22, 2004Publication date: October 28, 2004Applicant: TEXAS INSTRUMENTS INCORPORATEDInventors: Rakshit SINGHAL, Anindya SAHA