Patents by Inventor Ankai Wang

Ankai Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10823676
    Abstract: The present disclosure relates to a non-contact type security inspection and method, the system including: a laser source for emitting probe light beams which penetrate through a container or a packaging and are irradiated onto an inspected object contained in the container or the packaging; an optical collection device for collecting an exciting light excited by the probe light beams on the inspected object; a spectrum analyzer for analyzing spectral characteristics of the exciting light collected by the optical collection device so as to determine characteristics of the inspected object; and a shielding apparatus for preventing at least part of the exciting light excited by the probe light beams on the container or the packaging from entering an induction area of the optical collection device.
    Type: Grant
    Filed: November 7, 2017
    Date of Patent: November 3, 2020
    Assignee: NUCTECH COMPANY LIMITED
    Inventors: Ankai Wang, Hongqiu Wang, Yumin Yi, Haihui Liu, Jianhong Zhang
  • Patent number: 10663393
    Abstract: An embodiment of the present disclosure provides a spectrum inspecting apparatus. The apparatus includes a laser source; a focusing cylindrical lens configured to converge a light beam onto a sample; a light beam collecting device configured to collect a light beam signal, which is excited by the light beam, from the sample, so as to form a strip-shaped light spot; a slit configured to receive the collected light beam and couple it to downstream of a light path; a collimating device; a dispersing device configured to disperse the collected light beam so as to form a plurality of sub-beams having different wavelengths; an imaging device configured to image the sub-beams on the photon detector array respectively, wherein the light beam emitted from the laser source has a rectangular cross-section, the strip-shaped light spot impinges on the slit and its length is smaller than a length of the slit.
    Type: Grant
    Filed: December 29, 2017
    Date of Patent: May 26, 2020
    Assignee: Nuctech Company Limited
    Inventors: Haihui Liu, Hongqiu Wang, Yumin Yi, Jianhong Zhang, Ankai Wang
  • Patent number: 10641709
    Abstract: A Raman spectrum inspection apparatus and a security monitoring method for a Raman spectrum inspection apparatus are provided. The Raman spectrum inspection apparatus includes: a laser device configured to emit an exciting light; an optical device configured to guide the exciting light to an object to be detected and collect a light signal from the object; a spectrometer configured to split the collected light signal to generate a Raman spectrum of the object; and a security detector configured to detect an infrared light emitted from the object.
    Type: Grant
    Filed: December 22, 2017
    Date of Patent: May 5, 2020
    Assignee: Nuctech Company Limited
    Inventors: Jianhong Zhang, Ankai Wang, Hongqiu Wang, Rui Fan, Huacheng Feng
  • Publication number: 20190391080
    Abstract: The present disclosure relates to a non-contact type security inspection and method, the system including: a laser source for emitting probe light beams which penetrate through a container or a packaging and are irradiated onto an inspected object contained in the container or the packaging; an optical collection device for collecting an exciting light excited by the probe light beams on the inspected object; a spectrum analyzer for analyzing spectral characteristics of the exciting light collected by the optical collection device so as to determine characteristics of the inspected object; and a shielding apparatus for preventing at least part of the exciting light excited by the probe light beams on the container or the packaging from entering an induction
    Type: Application
    Filed: November 7, 2017
    Publication date: December 26, 2019
    Applicant: NUCTECH COMPANY LIMITED
    Inventors: Ankai WANG, Hongqiu WANG, Yumin YI, Haihui LIU, Jianhong ZHANG
  • Publication number: 20190360921
    Abstract: A multi-resolution spectrometer, includes: an incident slit (10) configured to receive an incident light beam; a collimating device (20) configured to collimate the light beam from the incident slit; a dispersing device (30) configured to disperse the light beam collimated by the collimating device (20) so as to form a plurality of sub-beams (61, 62) having different wavelengths; an imaging device (40) and a photon detector array (50), the imaging device (40) being configured to image the plurality of sub-beams (61, 62) on the photon detector array (50) respectively, the photon detector array (50) being configured to convert light signals of the plurality of sub-beams (61, 62) imaged thereon into electrical signals for forming a spectrogram, wherein the incident slit (10) has a first slit portion (11) and a second slit portion (12), and the second slit portion (12) has a greater width than the first slit portion (11).
    Type: Application
    Filed: December 29, 2017
    Publication date: November 28, 2019
    Inventors: Haihui LIU, Hongqiu WANG, Yumin Yl, Jianhong ZHANG, Ankai WANG
  • Publication number: 20180188158
    Abstract: An embodiment of the present disclosure provides a spectrum inspecting apparatus. The apparatus includes a laser source; a focusing cylindrical lens configured to converge a light beam onto a sample; a light beam collecting device configured to collect a light beam signal, which is excited by the light beam, from the sample, so as to form a strip-shaped light spot; a slit configured to receive the collected light beam and couple it to downstream of a light path; a collimating device; a dispersing device configured to disperse the collected light beam so as to form a plurality of sub-beams having different wavelengths; an imaging device configured to image the sub-beams on the photon detector array respectively, wherein the light beam emitted from the laser source has a rectangular cross-section, the strip-shaped light spot impinges on the slit and its length is smaller than a length of the slit.
    Type: Application
    Filed: December 29, 2017
    Publication date: July 5, 2018
    Inventors: Haihui Liu, Hongqiu Wang, Yumin Yi, Jianhong Zhang, Ankai Wang
  • Publication number: 20180180551
    Abstract: A Raman spectrum inspection apparatus and a security monitoring method for a Raman spectrum inspection apparatus are provided. The Raman spectrum inspection apparatus includes: a laser device configured to emit an exciting light; an optical device configured to guide the exciting light to an object to be detected and collect a light signal from the object; a spectrometer configured to split the collected light signal to generate a Raman spectrum of the object; and a security detector configured to detect an infrared light emitted from the object.
    Type: Application
    Filed: December 22, 2017
    Publication date: June 28, 2018
    Inventors: Jianhong Zhang, Ankai Wang, Hongqiu Wang, Rui Fan, Huacheng Feng