Patents by Inventor Anke Dutschke

Anke Dutschke has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • GUIDANCE FOR GEOMETRICAL AND OPTICAL MAGNIFICATION IN X-RAY MICROSCOPE
    Publication number: 20260211544
    Abstract: A user interface rendered on a display of a microscopy system provides a workflow for acquiring a survey of 2D projection images at two different angles and then uses a region of interest (ROI) tool that can move around the images to locate the center of the rotational axis in all 3 dimensions (X, Y, Z).
    Type: Application
    Filed: February 27, 2024
    Publication date: July 23, 2026
    Inventors: Susan CANDELL, Naomi KOTWAL, Hauyee CHANG, Erich KUHLMAN, Stephen KELLY, Anke DUTSCHKE
  • Method and system for guided parameter selection in x-ray microscope
    Publication number: 20260210879
    Abstract: An X-ray microscopy system provides guided acquisition parameter selection. Specifically, a computer projections from the detector subsystem and generates a user interface for guiding a user to select acquisition parameters for the projections.
    Type: Application
    Filed: February 26, 2024
    Publication date: July 23, 2026
    Inventors: Hauyee Chang, Naomi Kotwal, Justin Hanlon, Meow Tan, Robin White, Brian Smyth, Gerhard Krampert, Anke Dutschke