Patents by Inventor Ankit Chadha

Ankit Chadha has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
    Patent number: 9641420
    Abstract: In some embodiments, an apparatus includes a layer-2 device operably coupled to a source device and a destination device and disposed within a data path (1) between the source device and the destination device, and (2) includes at least one layer-3 device. The layer-2 device receives a first test data unit from the source device, and defines a quality datum associated with processing the first test data unit. The layer-2 device defines a second test data unit based on the first test data unit that includes the quality datum associated with processing the first test data unit. The layer-2 device sends the second test data unit to the layer-3 device. The layer-3 device defines a quality datum associated with processing the second test data unit at the layer-3 device and defines a third test data unit based on the second test data unit.
    Type: Grant
    Filed: August 28, 2015
    Date of Patent: May 2, 2017
    Assignee: Juniper Networks, Inc.
    Inventor: Ankit Chadha
  • Methods and apparatus for assessing the quality of a data path including both layer-2 and layer-3 devices
    Patent number: 9124529
    Abstract: In some embodiments, an apparatus includes a layer-2 device operably coupled to a source device and a destination device and disposed within a data path (1) between the source device and the destination device, and (2) includes at least one layer-3 device. The layer-2 device receives a first test data unit from the source device, and defines a quality datum associated with processing the first test data unit. The layer-2 device defines a second test data unit based on the first test data unit that includes the quality datum associated with processing the first test data unit. The layer-2 device sends the second test data unit to the layer-3 device. The layer-3 device defines a quality datum associated with processing the second test data unit at the layer-3 device and defines a third test data unit based on the second test data unit.
    Type: Grant
    Filed: December 20, 2012
    Date of Patent: September 1, 2015
    Assignee: Juniper Networks, Inc.
    Inventor: Ankit Chadha