Patents by Inventor Ankit Vashi

Ankit Vashi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scan optimization from stacking multiple reliability specifications
    Patent number: 10892024
    Abstract: A variety of applications can include systems and/or methods of optimizing results from scanning a memory device, where the memory device has stacked multiple reliability specifications. Information about a block of multiple blocks of a memory device can be logged, where the information is associated with a combination of reliability specifications. A refresh of the block can be triggered based on exceeding a threshold condition for the combination of reliability specifications.
    Type: Grant
    Filed: December 26, 2018
    Date of Patent: January 12, 2021
    Assignee: Micron Technology, Inc.
    Inventors: Ankit Vashi, Harish Reddy Singidi, Kishore Kumar Muchherla
  • SCAN OPTIMIZATION FROM STACKING MULTIPLE RELIABILITY SPECIFICATIONS
    Publication number: 20200211664
    Abstract: A variety of applications can include systems and/or methods of optimizing results from scanning a memory device, where the memory device has stacked multiple reliability specifications. Information about a block of multiple blocks of a memory device can be logged, where the information is associated with a combination of reliability specifications. A refresh of the block can be triggered based on exceeding a threshold condition for the combination of reliability specifications. Additional apparatus, systems, and methods are disclosed.
    Type: Application
    Filed: December 26, 2018
    Publication date: July 2, 2020
    Inventors: Ankit Vashi, Harish Reddy Singidi, Kishore Kumar Muchherla
  • Temperature sensitive NAND programming
    Patent number: 10446237
    Abstract: Devices and techniques temperature sensitive NAND programming are disclosed herein. A device controller can receive a command to write data to a component of the device. A temperature can be obtained in response to the command, and the temperature can be combined with a temperature compensation value to calculate a verification level. The command can then be executed in accordance with the verification level.
    Type: Grant
    Filed: June 29, 2018
    Date of Patent: October 15, 2019
    Assignee: Micron Technology, Inc.
    Inventors: Xiangang Luo, Jianmin Huang, Jung Sheng Hoei, Harish Reddy Singidi, Ting Luo, Ankit Vashi