Abstract: Methods and systems for measuring capacitance difference are disclosed. In one aspect, first and second capacitive elements are connected between voltage receiving nodes for receiving first and second DC voltages and nodes connectable to a third DC voltage via a first, resp. second switch. Further, in a first phase, a voltage difference is applied to charge the capacitive elements and the switches are alternately closed. First resulting currents are measured. Further, in a second phase, the first and second DC voltages are applied alternatingly and the switches are alternately closed. Second resulting currents are measured. The capacitance difference can be determined from the first and second resulting currents.

Abstract: Methods and systems for measuring capacitance difference are disclosed. In one aspect, first and second capacitive elements are connected between voltage receiving nodes for receiving first and second DC voltages and nodes connectable to a third DC voltage via a first, resp. second switch. Further, in a first phase, a voltage difference is applied to charge the capacitive elements and the switches are alternately closed. First resulting currents are measured. Further, in a second phase, the first and second DC voltages are applied alternatingly and the switches are alternately closed. Second resulting currents are measured. The capacitance difference can be determined from the first and second resulting currents.

Abstract: A method for determining an estimate of statistical properties of an electronic system comprising individual components subject to manufacturing process variability is disclosed. In one aspect, the method comprises obtaining statistical properties of the performance of individual components of the electronic system, obtaining information about execution of an application on the system, simulating execution of the application based on the obtained information about execution of the application on the system for a simulated electronic system realization constructed by selecting individual components with the obtained statistical properties determining the delay and energy of the electronic system, and determining the statistical properties of the delay and energy of the electronic system.

Abstract: A method is disclosed for analyzing a performance metric of an array type electronic circuit under process variability effects. The electronic circuit has an array with a plurality of array elements and an access path being a model of the array type electronic circuit. The model includes building blocks having all hardware to access one array element in the array. Each building block has at least one basic element. In one aspect, the method includes deriving statistics of the access path due to variations in the building blocks under process variability of the basic elements, and deriving statistics of the full array type electronic circuit by combining the results of the statistics of the access path under awareness of the array architecture.

Abstract: A method for determining an estimate of statistical properties of an electronic system comprising individual components subject to manufacturing process variability is disclosed. In one aspect, the method comprises obtaining statistical properties of the performance of individual components of the electronic system, obtaining information about execution of an application on the system, simulating execution of the application based on the obtained information about execution of the application on the system for a simulated electronic system realization constructed by selecting individual components with the obtained statistical properties determining the delay and energy of the electronic system, and determining the statistical properties of the delay and energy of the electronic system.