Patents by Inventor ANN CHIARAMONTI DEBAY

ANN CHIARAMONTI DEBAY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Imaging spectrometer
    Patent number: 10153144
    Abstract: A extreme ultraviolet (EUV) imaging spectrometer includes: a radiation source to: produce EUV radiation; subject a sample to the EUV radiation; photoionize a plurality of atoms of the sample; and form photoions from the atoms subject to photoionization by the EUV radiation, the photoions being field evaporated from the sample in response to the sample being subjected to the EUV radiation; and an ion detector to detect the photoions: as a function of a time-of-arrival of the photoions at the ion detector after the sample is subjected to the EUV radiation; or as a function of a position of the photoions at the ion detector.
    Type: Grant
    Filed: June 26, 2017
    Date of Patent: December 11, 2018
    Assignee: THE UNITED STATES OF AMERICA, AS REPRESENED BY THE SECRETARY OF COMMERCE
    Inventors: Norman A. Sanford, Ann Chiaramonti Debay
  • Hybrid extreme ultraviolet imaging spectrometer
    Patent number: 9899197
    Abstract: A hybrid extreme ultraviolet (EUV) imaging spectrometer includes: a radiation source to: produce EUV radiation; subject a sample to the EUV radiation; photoionize a plurality of atoms of the sample; and form photoions from the atoms subject to photoionization by the EUV radiation, the photoions being desorbed from the sample in response to the sample being subjected to the EUV radiation; an ion detector to detect the photoions: as a function of a time-of-arrival of the photoions at the ion detector after the sample is subjected to the EUV radiation; or as a function of a position of the photoions at the ion detector; an electron source to: produce a plurality of primary electrons; subject the sample to the primary electrons; and form scattered electrons from the sample in response to the sample being subjected to the primary electrons; and an electron detector to detect the scattered electrons: as a function of a time-of-arrival of the scattered electrons at the electron detector after the sample is subjected
    Type: Grant
    Filed: August 2, 2016
    Date of Patent: February 20, 2018
    Assignees: THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY OF COMMERCE, COLORADO SCHOOL OF MINES
    Inventors: Norman A. Sanford, Ann Chiaramonti Debay, Brian P. Gorman, David R. Diercks
  • IMAGING SPECTROMETER
    Publication number: 20170301526
    Abstract: A extreme ultraviolet (EUV) imaging spectrometer includes: a radiation source to: produce EUV radiation; subject a sample to the EUV radiation; photoionize a plurality of atoms of the sample; and form photoions from the atoms subject to photoionization by the EUV radiation, the photoions being field evaporated from the sample in response to the sample being subjected to the EUV radiation; and an ion detector to detect the photoions: as a function of a time-of-arrival of the photoions at the ion detector after the sample is subjected to the EUV radiation; or as a function of a position of the photoions at the ion detector.
    Type: Application
    Filed: June 26, 2017
    Publication date: October 19, 2017
    Inventors: NORMAN A. SANFORD, ANN CHIARAMONTI DEBAY
  • HYBRID EXTREME ULTRAVIOLET IMAGING SPECTROMETER
    Publication number: 20170062198
    Abstract: A hybrid extreme ultraviolet (EUV) imaging spectrometer includes: a radiation source to: produce EUV radiation; subject a sample to the EUV radiation; photoionize a plurality of atoms of the sample; and form photoions from the atoms subject to photoionization by the EUV radiation, the photoions being desorbed from the sample in response to the sample being subjected to the EUV radiation; an ion detector to detect the photoions: as a function of a time-of-arrival of the photoions at the ion detector after the sample is subjected to the EUV radiation; or as a function of a position of the photoions at the ion detector; an electron source to: produce a plurality of primary electrons; subject the sample to the primary electrons; and form scattered electrons from the sample in response to the sample being subjected to the primary electrons; and an electron detector to detect the scattered electrons: as a function of a time-of-arrival of the scattered electrons at the electron detector after the sample is subjected
    Type: Application
    Filed: August 2, 2016
    Publication date: March 2, 2017
    Inventors: NORMAN A. SANFORD, ANN CHIARAMONTI DEBAY, BRIAN P. GORMAN, DAVID R. DIERCKS