Abstract: A method and apparatus for determining spatial locations of defects in a material are described. The method includes providing a plurality of electrodes in contact with a material, applying a sinusoidal voltage to a select number of the electrodes at a predetermined frequency, determining gain and phase angle measurements at other of the electrodes in response to applying the sinusoidal voltage to the select number of electrodes, determining impedance values from the gain and phase angle measurements, computing an impedance spectrum for an area of the material from the determined impedance values, and comparing the computed impedance spectrum with a known impedance spectrum to identify spatial locations of defects in the material.

Abstract: This invention relates to the purification of biological preparations such as proteins and nucleic acids, especially for example proteins that have been produced by recombinant DNA techniques in bacteria. In a particular embodiment, the invention concerns improved methods for reducing the content of contaminants in biological preparations, e.g. recombinant proteins produced in host bacteria.